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Electron beam exposure apparatus and method, and device manufacturing method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01J-037/12
출원번호 US-0811602 (1997-03-04)
우선권정보 JP-0150990 (1996-06-12)
발명자 / 주소
  • Muraki Masato,JPX
  • Gotoh Susumu,JPX
출원인 / 주소
  • Canon Kabushiki Kaisha, JPX
대리인 / 주소
    Fitzpatrick, Cella, Harper & Scinto
인용정보 피인용 횟수 : 69  인용 특허 : 9

초록

An electron beam exposure apparatus which minimizes the influence of the space charge effect and aberrations of a reduction electron optical system, and simultaneously, increases the exposure area which can be exposed at once, thereby increasing the throughput. An electron beam exposure apparatus ha

대표청구항

[ What is claimed is:] [1.] An electron beam exposure apparatus having a source for emitting electron beams and a reduction electron optical system for reducing and projecting, on a target exposure surface, an image formed with the electron beam emitted from said source, comprising:a correction elec

이 특허에 인용된 특허 (9)

  1. Yasuda Hiroshi (Yokohama JPX) Kai Junichi (Tokyo JPX) Kataoka Toyotaka (Kawasaki JPX) Takahashi Yasushi (Kawasaki JPX) Miyaki Shinji (Tokushima JPX) Sakamoto Kiichi (Tokyo JPX), Charged particle beam exposure system using line beams.
  2. Matsuda ; Takashi, Electron beam exposure apparatus.
  3. Chen Hsing-Yao (Barrington IL) Babicz Eugene A. (Evanston IL) Gorski Richard M. (Arlington Heights IL), Electron gun system with dynamic convergence control.
  4. Lischke Burkhard (Munich DEX), Lithographic apparatus for the production of microstructures.
  5. Harte Kenneth J. (Carlisle MA), Method and means for dynamic correction of electrostatic deflector for electron beam tube.
  6. Hahn Eberhard (9 Pestalozzistrasse Jena ; District of Gera DDX), Method of and device for corpuscular projection.
  7. Newberry Sterling P. (Winchester MA) Burgess John R. (Dunstable MA), Micro lens array and micro deflector assembly for fly\s eye electron beam tubes using silicon components and techniques.
  8. Bono David C. (Melrose MA) Fishbein Marvin (Brookline MA) Harte Kenneth J. (Carlisle MA), Unipotential lens assembly for charged particle beam tubes and method for applying correction potentials thereto.
  9. Biechler Charles S. (Hayward CA) Carroll Allen M. (Berkeley CA) Graves Richard E. (Fremont CA) Lyons Steven A. (Oakland CA), Virtual addressing for E-beam lithography.

이 특허를 인용한 특허 (69)

  1. Muraki,Masato; Ohta,Hiroya, Aberration adjusting method, device fabrication method, and charged particle beam lithography machine.
  2. Muraki,Masato; Ohta,Hiroya, Aberration measuring apparatus for charged particle beam optical system, charged particle beam lithography machine having the aberration measuring apparatus, and device fabrication method using the apparatus.
  3. Kojima, Shinichi, Annular illumination method for charged particle projection optics.
  4. Do, Douglas D.; Johnson, Jeff C., Apparatus for measuring features of a semiconductor device.
  5. Wang, Shixin, Apparatus having a magnetic lens configured to diverge an electron beam.
  6. Hosoda,Masaki; Muraki,Masato; Kamimura,Osamu, Charged particle beam exposure apparatus, charged particle beam exposure method and device manufacturing method.
  7. Muraki,Masato; Ohta,Hiroya; Kamimura,Osamu, Charged particle beam exposure apparatus, charged particle beam exposure method, and device manufacturing method using the same apparatus.
  8. Muraki, Masato; Sohda, Yasunari; Hashimoto, Shinichi, Charged particle beam exposure apparatus, device manufacturing method, and charged particle beam applied apparatus.
  9. Muraki, Masato; Nakayama, Yoshinori; Ohta, Hiroya; Yoda, Haruo; Saitou, Norio, Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus.
  10. Muraki,Masato; Yoda,Haruo, Charged particle beam exposure method, charged particle beam exposure apparatus, and device manufacturing method.
  11. Touya, Takanao; Ogasawara, Munehiro, Charged particle beam writing apparatus.
  12. Zonnevylle, Aernout Christiaan; Kruit, Pieter, Charged particle multi-beam apparatus including a manipulator device for manipulation of one or more charged particle beams.
  13. Muraki, Masato, Charged-particle beam exposure apparatus and device manufacturing method.
  14. Yui, Yoshikiyo; Muraki, Masato, Charged-particle beam exposure apparatus and device manufacturing method using the same.
  15. Muraki, Masato; Yui, Yoshikiyo, Charged-particle beam exposure apparatus, charged-particle beam exposure method, control data determination method, and device manufacturing method using this method.
  16. Muraki, Masato; Yui, Yoshikiyo, Charged-particle beam exposure apparatus, exposure system, control method therefor, and device manufacturing method.
  17. Muraki, Masato; Kamimura, Osamu; Takakuwa, Masaki, Charged-particle-beam exposure apparatus and method of controlling same.
  18. Nakasuji Mamoru,JPX, Charged-particle-beam image-transfer apparatus exhibiting reduced space-charge effects and device fabrication methods using the same.
  19. Kojima, Shinichi, Charged-particle-beam microlithography apparatus and methods including correction of aberrations caused by space-charge effects.
  20. Simizu Hiroyasu,JPX, Charged-particle-beam projection method and apparatus.
  21. Suzuki Shohei,JPX, Charged-particle-beam projection-microlithography apparatus and transfer methods.
  22. Zhou, Otto Z.; Chang, Sha X., Compact microbeam radiation therapy systems and methods for cancer treatment and research.
  23. Zhou, Otto Z.; Chang, Sha X., Compact microbeam radiation therapy systems and methods for cancer treatment and research.
  24. Yoshikiyo Yui JP; Masato Muraki JP, Control system for a charged particle exposure apparatus.
  25. Muraki, Masato; Yui, Yoshikiyo, Correcting method for correcting exposure data used for a charged particle beam exposure system.
  26. Nakasuji Mamoru,JPX, Device fabrication methods using charged-particle-beam image-transfer apparatus exhibiting reduced space-charge effects.
  27. Zhou, Otto Z.; Lu, Jianping; Shan, Jing; Tucker, Andrew; Chtcheprov, Pavel; Platin, Enrique; Mol, André; Gaalaas, Laurence Rossman; Wu, Gongting, Digital tomosynthesis systems, methods, and computer readable media for intraoral dental tomosynthesis imaging.
  28. Groves Timothy R. ; Kendall Rodney A., Distributed direct write lithography system using multiple variable shaped electron beams.
  29. Morita, Tomoyuki, Drawing apparatus and method of manufacturing article by controlling drawing on shot region side of boundary of shot regions.
  30. Ohishi, Shinji, Drawing apparatus, method of manufacturing article, method of manufacturing deflecting apparatus, and method of manufacturing drawing apparatus.
  31. Muraki Masato,JPX, Electron beam exposure apparatus.
  32. Muraki Masato,JPX, Electron beam exposure apparatus.
  33. Uchida,Shinji, Electron beam exposure apparatus.
  34. Masato Muraki JP, Electron beam exposure apparatus and its control method.
  35. Masato Muraki JP, Electron beam exposure apparatus and its control method.
  36. Muraki Masato,JPX, Electron beam exposure apparatus and its control method.
  37. Yasuda, Hiroshi, Electron beam lithography device and lithographic method.
  38. Sohda,Yasunari; Ohta,Hiroya; Kamimura,Osamu; Gotoh,Susumu, Electron beam writing equipment and electron beam writing method.
  39. Yagi, Takayuki; Ono, Haruhito; Shimada, Yasuhiro, Electron optical system array, charged-particle beam exposure apparatus using the same, and device manufacturing method.
  40. Shimada, Yasuhiro; Yagi, Takayuki; Ono, Haruhito, Electron optical system array, method of fabricating the same, charged-particle beam exposure apparatus, and device manufacturing method.
  41. Shimada, Yasuhiro; Yagi, Takayuki; Ono, Haruhito; Maehara, Hiroshi, Electron optical system array, method of manufacturing the same, charged-particle beam exposure apparatus, and device manufacturing method.
  42. Ono, Haruhito; Yagi, Takayuki, Electron optical system, charged-particle beam exposure apparatus using the same, and device manufacturing method.
  43. Muraki, Masato, Electron source manufacturing method.
  44. Muraki Masato,JPX, Electron-beam exposure apparatus and method.
  45. Ono, Haruhito; Muraki, Masato, Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method.
  46. Ono,Haruhito; Muraki,Masato, Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method.
  47. Ono,Haruhito; Muraki,Masato, Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method.
  48. Hosoda, Masaki; Muraki, Masato; Ohta, Hiroya; Yoda, Haruo, Exposure apparatus.
  49. Muraki, Masato; Ohta, Hiroya; Hashimoto, Shin-ichi, Exposure apparatus, control method thereof, and device manufacturing method.
  50. Frosien, Juergen, High current density particle beam system.
  51. Nakano, Katsushi; Nakamura, Junji, Hollow-beam apertures for charged-particle-beam microlithography apparatus and methods for making and using same.
  52. Zhou, Otto Z.; Lu, Jianping; Shan, Jing; Tucker, Andrew; Chtcheprov, Pavel; Platin, Enrique; Mol, André; Gaalaas, Laurence Rossman; Wu, Gongting, Intraoral tomosynthesis systems, methods, and computer readable media for dental imaging.
  53. Tinnemans, Patricius Aloysius Jacobus; Baselmans, Johannes Jacobus Matheus, Lithographic apparatus and device manufacturing method utilizing data filtering.
  54. Wang, Shixin, Method and system of performing three-dimensional imaging using an electron microscope.
  55. Swinford, Richard; Maazouz, Mostafa; Tuggle, David William; Steinhardt, William M., Method for optimizing charged particle beams formed by shaped apertures.
  56. Groves Timothy R. ; Kendall Rodney A., Method for writing a pattern using multiple variable shaped electron beams.
  57. de Jager,Pieter Willem Herman; Kruit,Pieter; Bleeker,Arno Jan; van der Mast,Karel Diederick, Method of manufacturing a device by employing a lithographic apparatus including a sliding electron-optical element.
  58. Simizu, Hiroyasu, Methods for reducing blur and variation in blur in projected images produced by charged-particle-beam microlithography.
  59. Zhang, Jian; Lu, Jianping; Zhou, Otto Z.; Lalush, David, Methods, systems, and computer program products for binary multiplexing x-ray radiography.
  60. Zhou, Otto Z.; Lu, Jianping; Zhang, Jian; Yang, Guang; Lee, Yueh; Qiu, Qi; Cheng, Yuan, Methods, systems, and computer program products for multiplexing computed tomography.
  61. Hamaguchi, Shinichi; Haraguchi, Takeshi; Yasuda, Hiroshi, Multi-beam exposure apparatus using a multi-axis electron lens, fabrication method of a semiconductor device.
  62. Wieland, Marco Jan-Jaco; Urbanus, Willem Henk, Multi-electrode electron optics.
  63. Okunuki, Masahiko, Multi-lens type electrostatic lens, electron beam exposure apparatus and charged beam applied apparatus using the lens, and device manufacturing method using these apparatuses.
  64. Buschbeck,Herbert; Lammer,Gertraud; Chalupka,Alfred; Nowak,Robert; Platzgummer,Elmar; Stengl,Gerhard, Particle-optical projection system.
  65. Knippelmeyer, Rainer; Kienzle, Oliver; Kemen, Thomas; Mueller, Heiko; Uhlemann, Stephan; Haider, Maximilian; Casares, Antonio; Rogers, Steven, Particle-optical systems and arrangements and particle-optical components for such systems and arrangements.
  66. Knippelmeyer, Rainer; Kienzle, Oliver; Kemen, Thomas; Mueller, Heiko; Uhlemann, Stephan; Haider, Maximilian; Casares, Antonio; Rogers, Steven, Particle-optical systems and arrangements and particle-optical components for such systems and arrangements.
  67. Korenaga, Nobushige, Positioning apparatus, charged-particle-beam exposure apparatus, and device manufacturing method.
  68. Zhou, Otto Z.; Yang, Guang; Lu, Jianping; Lalush, David, Stationary x-ray digital breast tomosynthesis systems and related methods.
  69. Lu, Jianping; Zhou, Otto; Cao, Guohua; Zhang, Jian, Systems and methods for temporal multiplexing X-ray imaging.
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