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Atomic force microscope for biological specimens 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-005/28
출원번호 US-0547521 (1995-10-24)
발명자 / 주소
  • Xu Shaohua
  • Arnsdorf Morton F.
출원인 / 주소
  • Arch Development Corporation
대리인 / 주소
    Rechtin
인용정보 피인용 횟수 : 58  인용 특허 : 147

초록

An atomic force microscope for quantitative imaging and identification, at the molecular or submolecular level, biomolecules or subunits of biomolecules in a physiologic environment, through use of a cantilever tip incorporating a biomolecular identifier.

대표청구항

[ What is claimed in:] [1.] An atomic force microscope for probing a biological specimen, comprising:a cantilever arm having a cantilever tip attached thereto, said cantilever tip including means for identifying biomolecules on the surface of said biological specimen with said means comprising an am

이 특허에 인용된 특허 (147)

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  147. Hohn Fritz J. (Somers NY) McCord Mark A. (Mohegan Lake NY), X-ray mask containing a cantilevered tip for gap control and alignment.

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  6. Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C., Cantilevered probe detector with piezoelectric element.
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  13. Adams, Jesse D.; Rogers, Benjamin S., Chemical sensor with oscillating cantilevered probe and mechanical stop.
  14. Christian Fretigny FR; Denis Michel FR; Benjamin Brocart CA; Charlotte Basire FR, Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation.
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  25. Adams,Jesse D.; Rogers,Benjamin S.; Sulchek,Todd A., Liquid cell and passivated probe for atomic force microscopy and chemical sensing.
  26. Moore, Gregory J.; Fricke, Stanley T., Magnetic resonance force microscope for the study of biological systems.
  27. Struckmeier,Jens; Gotthard,Doug; Ohler,Ben, Manual control with force-feedback for probe microscopy-based force spectroscopy.
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  29. Hammiche Azzedine,GBX ; Montague-Pollock Hubert Murray,GBX ; Reading Michael,GBX, Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy.
  30. Henderson,Eric; Mosher,Curtis; Huff,Janice, Method and apparatus for molecular analysis in small sample volumes.
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  33. Müller, Torsten; Poole, Kathryn Anne; Knebel, Detlef; Jähnke, Torsten, Method and apparatus for the combined analysis of a sample with objects to be analyzed.
  34. Tseng, Fan Gang; Cheng, Hui Wen; Jheng, Wun Yuan, Method for attaching a particle to a scanning probe tip through eutectic bonding.
  35. Struckmeier,Jens; Gotthard,Doug; Ohler,Ben, Method of making a force curve measurement on a sample.
  36. Degertekin,Fahrettin L.; Onaran,Abidin G.; Balantekin,Mujdat, Methods of imaging in probe microscopy.
  37. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or produced thereby.
  38. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or produced thereby.
  39. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or produced thereby.
  40. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or products thereby.
  41. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products thereof or produced thereby.
  42. Altmann, Stephan Maximilian; H?rber, Johann Karl Heinrich, Multiple local probe measuring device and method.
  43. Altmann, Stephen Maximilian; Hörber, Johann Karl Heinrich, Multiple local probe measuring device and method.
  44. Altmann,Stephan Maxmilian; H철rber,Johann Karl Heinrich, Multiple local probe measuring device and method.
  45. Altmann,Stephan Maxmilian; H철rber,Johann Karl Heinrich, Multiple local probe measuring device and method.
  46. Mirkin, Chad A.; Schwartz, Peter V.; Storhoff, James J.; Park, So-Jung, Nanolithography methods and products therefor and produced thereby.
  47. Henderson,Eric; Mosher,Curtis, Nanoscale molecular arrayer.
  48. Beyder,Arthur; Sachs,Frederick, Oscillator and method of making for atomic force microscope and other applications.
  49. Beyder, Arthur; Sachs, Frederick, Oscillator for atomic force microscope and other applications.
  50. Suzuki, Shushi; Chun, Wang Jae; Asakura, Kiyotaka; Nomura, Masaharu, Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope.
  51. Spudich, James A.; Nock, Steffen; Wagner, Peter, Reversible immobilization of arginine-tagged moieties on a silicate surface.
  52. Adams, Jesse D., Self-sensing array of microcantilevers for chemical detection.
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  55. Yu, Min-Feng; Minary-Jolandan, Majid, Ultra-low damping imaging mode related to scanning probe microscopy in liquid.
  56. Farinas, Javier Anibal; Wada, H. Garrett, Use of Nernstein voltage sensitive dyes in measuring transmembrane voltage.
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