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Difunctional amino precursors for the deposition of films comprising metals 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C07F-009/00
  • C07F-007/00
  • C07F-011/00
출원번호 US-0915755 (1997-08-21)
발명자 / 주소
  • Vaartstra Brian A.
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Schwegman, Lundberg, Woessner & Kluth, P.A.
인용정보 피인용 횟수 : 76  인용 특허 : 30

초록

wherein L is an auxiliary ligand; x is 0-6; M is a metal of valence 1 to 5; n is the oxidation state of the metal; R.sup.1, R.sup.2, R.sup.3, R.sup.4 and R.sup.5 are hydrogen or (C.sub.1 -C.sub.12) alkyl groups; y is 1-5, z is 1-n.

대표청구항

[ What is claimed is:] [1.] A compound of formula (I) EQU (L).sub.x M.sup.n+ (N(R.sup.1)(C(R.sup.2 R.sup.3)).sub.y N(R.sup.4 R.sup.5)).sub.z (I) rein(a) L is an auxiliary ligand;(b) x is 0-6;(c) M is a low-valent metal;(d) n is the oxidation state of the metal;(e) each of R.sup.1, R.sup.2, R.sup.3,

이 특허에 인용된 특허 (30)

  1. Eichman Eric C. (Phoenix AZ) Sommer Bruce A. (Phoenix AZ) Churley Michael J. (Tempe AZ) Ramsey W. Chuck (Tempe AZ), Apparatus for elimination of low temperature ammonia salts in TiCl4 NH3 CVD reaction.
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  20. Endo Yoshihiro (Nara JPX) Yamashita Takuo (Tenri JPX) Ogawa Ikuo (Yamatokoriyama JPX), Method of manufacturing thin-film electroluminescent display panel.
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  30. Sandhu Gurtej S. (Boise ID), Tungsten silicide (WSix) deposition process for semiconductor manufacture.

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  5. Gealy, Dan; Weimer, Ronald A., Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers.
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  17. Gilbert Hausmann ; Vijay Parkhe ; Jagadish Kalyanam, Chemical vapor deposition of niobium barriers for copper metallization.
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  20. Jagadish Kalyanam, Deposition of CVD layers for copper metallization using novel metal organic chemical vapor deposition (MOCVD) precursors.
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  66. Vaartstra,Brian A.; Uhlenbrock,Stefan, Systems and methods for forming strontium-and/or barium-containing layers.
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