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Method for growth of crystal surfaces and growth of heteroepitaxial single crystal films thereon 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/306
출원번호 US-0887804 (1997-07-03)
발명자 / 주소
  • Powell J. Anthony
  • Larkin David J.
  • Neudeck Philip G.
  • Matus Lawrence G.
출원인 / 주소
  • The United States of America as represented by the Administrator of National Aeronautics and Space Administration
대리인 / 주소
    Stone
인용정보 피인용 횟수 : 71  인용 특허 : 3

초록

A method of growing atomically-flat surfaces and high-quality low-defect crystal films of polytypic compounds heteroepitaxially on polytypic compound substrates that are different than the crystal film. The method is particularly suited for the growth of 3C-SiC, 2H-AlN, and 2H-GaN on 6H-SiC.

대표청구항

[ What we claim is:] [1.] A method of producing single-crystal atomically-flat surfaces on a single-crystal SiC substrate, said method comprising the steps of:(a) preparing a planar growth surface on said substrates that is parallel to within a predetermined angle relative to a selected crystal plan

이 특허에 인용된 특허 (3)

  1. Larkin David J. (North Olmsted OH) Neudeck Philip G. (Strongsville OH) Powell J. Anthony (North Olmsted OH) Matus Lawrence G. (Amherst OH), Compound semiconductor and controlled doping thereof.
  2. Larkin David J. (Fairview Park OH) Powell ; J. Anthony (North Olmsted OH), Process for the controlled growth of single-crystal films of silicon carbide polytypes on silicon carbide wafers.
  3. Powell J. Anthony (North Olmsted OH), Process for the homoepitaxial growth of single-crystal silicon carbide films on silicon carbide wafers.

이 특허를 인용한 특허 (71)

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  2. Nagasawa,Hiroyuki; Yagi,Kuniaki; Kawahara,Takamitsu, Compound crystal and method of manufacturing same.
  3. Nishiguchi, Taro; Harada, Shin; Fujiwara, Shinsuke, Dislocation in SiC semiconductor substrate.
  4. Nishiguchi, Taro; Harada, Shin; Fujiwara, Shinsuke, Dislocation in SiC semiconductor substrate.
  5. Nishiguchi, Taro; Harada, Shin; Fujiwara, Shinsuke, Dislocation in SiC semiconductor substrate.
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  7. Kordina,Olof Claes Erik, Dissociation of silicon clusters in a gas phase during chemical vapor deposition homo-epitaxial growth of silicon carbide.
  8. Zhang, Jie, Epitaxial growth on low degree off-axis SiC substrates and semiconductor devices made thereby.
  9. Zhang, Jie, Epitaxial growth on low degree off-axis silicon carbide substrates and semiconductor devices made thereby.
  10. Kasai, Hitoshi; Okahisa, Takuji; Fujita, Shunsuke; Matsumoto, Naoki; Ijiri, Hideyuki; Sato, Fumitaka; Motoki, Kensaku; Nakahata, Seiji; Uematsu, Koji; Hirota, Ryu, Fabrication method and fabrication apparatus of group III nitride crystal substance.
  11. Kasai, Hitoshi; Okahisa, Takuji; Fujita, Shunsuke; Matsumoto, Naoki; Ijiri, Hideyuki; Sato, Fumitaka; Motoki, Kensaku; Nakahata, Seiji; Uematsu, Koji; Hirota, Ryu, Fabrication method and fabrication apparatus of group III nitride crystal substance.
  12. Kasai, Hitoshi; Okahisa, Takuji; Fujita, Shunsuke; Matsumoto, Naoki; Ijiri, Hideyuki; Sato, Fumitaka; Motoki, Kensaku; Nakahata, Seiji; Uematsu, Koji; Hirota, Ryu, Fabrication method and fabrication apparatus of group III nitride crystal substance.
  13. Davis, Robert F.; Nam, Ok-Hyun, Gallium nitride semiconductor structure including laterally offset patterned layers.
  14. Linthicum, Kevin J.; Gehrke, Thomas; Davis, Robert F., Gallium nitride semiconductor structures fabricated by pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on weak posts.
  15. Davis, Robert F.; Nam, Ok-Hyun; Zheleva, Tsvetanka; Bremser, Michael D., Gallium nitride semiconductor structures including lateral gallium nitride layers.
  16. Hunter, Gary W.; Neudeck, Philip G., Gas sensors using SiC semiconductors and method of fabrication thereof.
  17. Uemura, Toshiya; Nagasaka, Naohisa, Group III nitride compound semiconductor light-emitting device and method for producing the same.
  18. Thomas Gehrke ; Kevin J. Linthicum ; Robert F. Davis ; Darren B. Thomson, High temperature pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on sapphire substrates.
  19. Ellison, Alexandre; Hallin, Christer; Magnusson, Björn; Bergman, Peder, Homoepitaxial growth of SiC on low off-axis SiC wafers.
  20. Ellison, Alexandre; Hallin, Christer; Magnusson, Björn; Bergman, Peder, Homoepitaxial growth of SiC on low off-axis SiC wafers.
  21. Neudeck, Philip G.; Powell, J. Anthony, Lateral movement of screw dislocations during homoepitaxial growth and devices yielded therefrom free of the detrimental effects of screw dislocations.
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  26. Powell, Adrian; Brady, Mark; Leonard, Robert Tyler, Low micropipe 100 mm silicon carbide wafer.
  27. Cuomo, Jerome J.; Williams, N. Mark; Hanser, Andrew David; Carlson, Eric Porter; Thomas, Darin Taze, MIIIN based materials and methods and apparatus for producing same.
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  30. Konstantinov Andrei,SEX, Method for fabricating a silicon carbide device.
  31. Ueno Katsunori,JPX, Method for forming thermal oxide film of silicon carbide semiconductor device.
  32. J. Anthony Powell ; Philip G. Neudeck, Method for growing low-defect single crystal heteroepitaxial films.
  33. Powell J. Anthony ; Larkin David J. ; Neudeck Philip G. ; Matus Lawrence G., Method for growth of crystal surfaces and growth of heteroepitaxial single crystal films thereon.
  34. Maruska, Herbert Paul; Gallagher, John Joseph; Chou, Mitch M. C.; Hill, David W., Method for making free-standing AlGaN wafer, wafer produced thereby, and associated methods and devices using the wafer.
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  37. Powell,J. Anthony; Neudeck,Philip G.; Trunek,Andrew J.; Spry,David J., Method for the growth of large low-defect single crystals.
  38. Abel, Phillip B.; Powell, J. Anthony; Neudeck, Philip G., Method for the production of nanometer scale step height reference specimens.
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  40. Sumakeris,Joseph John, Method to reduce stacking fault nucleation sites and reduce Vdrift in bipolar devices.
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  43. Linthicum, Kevin J.; Gehrke, Thomas; Davis, Robert F.; Thomson, Darren B.; Tracy, Kieran M., Methods of fabricating gallium nitride microelectronic layers on silicon layers.
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  45. Zheleva,Tsvetanka; Thomson,Darren B.; Smith,Scott A.; Linthicum,Kevin J.; Gehrke,Thomas; Davis,Robert F., Methods of fabricating gallium nitride semiconductor layers by lateral growth into trenches.
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