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Photoresist compositions

국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G03F-070/04
출원번호 US-0806590 (1997-02-26)
우선권정보 CH-0003835 (1994-12-20)
발명자 / 주소
  • Mertesdorf Carl-Lorenz,DEX
  • Schacht Hans-Thomas,DEX
  • Muenzel Norbert,DEX
  • Falcigno Pasquale Alfred,CHX
출원인 / 주소
  • Olin Microelectronic Chemicals, Inc.
대리인 / 주소
    Ohlandt, Greeley, Ruggiero & Perle
인용정보 피인용 횟수 : 24  인용 특허 : 5

초록

Polymers having an average molecular weight M.sub.w (weight average) of 5,000 to 1,000,000 (measured by gel permeation chromatography), comprising structural repeating units of the formulae I-IV: [ STR 1 ] in which R.sub.1, R.sub.2, R.sub.3 and R.sub.4 independently of one another are hydrogen, meth

대표청구항

[ What is claimed is:] [1.] A radiation-sensitive composition comprising, based on the overall quantity of components A) and B),A) from 80 to 99.9% by weight of a polymer having an average molecular weight M.sub.w (weight average) of 5,000 to 1,000,000 (measured by gel permeation chromatography), co

이 특허에 인용된 특허 (5)

  1. Ochiai Tameichi (Sagamihara JPX) Takahashi Noriaki (Yokohama JPX) Kameyama Yasuhiro (Machida JPX), Negative photosensitive composition and method for forming a resist pattern by means thereof.
  2. Crivello James V. (Clifton Park NY), Photoresist compositions containing t-substituted organomethyl vinylaryl ether materials.
  3. Sinta Roger (Woburn MA) Hemond Richard C. (Brighton MA) Medeiros David R. (Cambridge MA) Rajaratnam Martha M. (Dedham MA) Thackeray James W. (Braintree MA) Canistro Dianne (Lancaster MA), Radiation sensitive compositions comprising polymer having acid labile groups.
  4. Takeda Yoshihumi (Niigata JPX) Ishihara Toshinobu (Niigata JPX) Itoh Ken\ichi (Niigata JPX) Maruyama Kazumasa (Niigata JPX), Resist compositions.
  5. Hayase Rumiko (Kawasaki JPX) Onishi Yasunobu (Yokohama JPX) Niki Hirokazu (Yokohama JPX) Oyasato Naohiko (Kawaguchi JPX) Kobayashi Yoshihito (Kawasaki JPX) Hayase Shuzi (Kawasaki JPX), Resist for forming patterns comprising an acid generating compound and a polymer having acid decomposable groups.

이 특허를 인용한 특허 (24)

  1. Elian Klaus,DEX ; Leuschner Rainer,DEX ; Guenther Ewald,DEX, Chemically amplified resist.
  2. Shimada Junji,JPX ; Watanabe Osamu,JPX ; Watanabe Satoshi,JPX ; Nagura Shigehiro,JPX ; Ishihara Toshinobu,JPX, Partially hydrogenated polymers and chemically amplified positive resist compositions.
  3. Ichikawa, Koji; Hata, Mitsuhiro; Yasue, Takahiro, Photoresist composition.
  4. Jae Chang Jung KR; Keun Kyu Kong KR; Jin Soo Kim KR; Ki Ho Baik KR, Photoresist composition containing photo base generator with photo acid generator.
  5. Kawabe Yasumasa,JPX ; Sato Kenichiro,JPX ; Aoai Toshiaki,JPX, Positive photosensitive resin.
  6. Nakano Sigeki,JPX ; Awaji Akira,JPX ; Ogawa Teruaki,JPX ; Takahashi Kenta,JPX, Positive type photoresist composition.
  7. Okazaki Hiroshi,JPX ; Pawlowski Georg,JPX ; Funato Satoru,JPX ; Kinoshita Yoshiaki,JPX ; Yamaguchi Yuko,JPX, Process for preparing resists.
  8. Okazaki, Hiroshi; Pawlowski, Georg; Funato, Satoru; Kinoshita, Yoshiaki; Yamaguchi, Yuko, Process for preparing resists.
  9. Ichikawa, Koji; Hiraoka, Takashi; Ochiai, Mitsuyoshi, Resist composition and method for producing resist pattern.
  10. Ichikawa, Koji; Kamabuchi, Akira, Resist composition and method for producing resist pattern.
  11. Ichikawa, Koji; Masuyama, Tatsuro; Yamaguchi, Satoshi, Resist composition and method for producing resist pattern.
  12. Ichikawa, Koji; Mukai, Yuichi; Yamamoto, Satoshi, Resist composition and method for producing resist pattern.
  13. Ichikawa, Koji; Mukai, Yuichi; Yamamoto, Satoshi, Resist composition and method for producing resist pattern.
  14. Ichikawa, Koji; Sakamoto, Hiromu; Mukai, Yuichi, Resist composition and method for producing resist pattern.
  15. Ichikawa, Koji; Sakamoto, Hiromu; Mukai, Yuichi, Resist composition and method for producing resist pattern.
  16. Ichikawa, Koji; Yamaguchi, Satoshi, Resist composition and method for producing resist pattern.
  17. Ichikawa, Koji; Yamaguchi, Satoshi, Resist composition and method for producing resist pattern.
  18. Ichikawa, Koji; Yamaguchi, Satoshi; Suzuki, Yuki, Resist composition and method for producing resist pattern.
  19. Ichikawa, Koji; Yamaguchi, Satoshi; Suzuki, Yuki, Resist composition and method for producing resist pattern.
  20. Ichikawa, Koji; Yasue, Takahiro, Resist composition and method for producing resist pattern.
  21. Ichikawa, Koji; Yasue, Takahiro, Resist composition and method for producing resist pattern.
  22. Ichikawa, Koji; Yasue, Takahiro; Kamabuchi, Akira, Resist composition and method for producing resist pattern.
  23. Masuyama, Tatsuro; Yamamoto, Satoshi; Ichikawa, Koji, Resist composition and method for producing resist pattern.
  24. Blakeney, Andrew J.; Malik, Sanjay; Dilocker, Stephanie; Ferri, John; Eisele, Jeffery, Silicon-containing acetal protected polymers and photoresists compositions thereof.
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