$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Process for producing semiconductor article 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/30
  • H01L-021/46
출원번호 US-0970356 (1997-11-14)
우선권정보 JP-0304541 (1996-11-15)
발명자 / 주소
  • Sakaguchi Kiyofumi,JPX
  • Yonehara Takao,JPX
출원인 / 주소
  • Canon Kabshiki Kaisha, JPX
대리인 / 주소
    Fitzpatrick, Cella, Harper & Scinto
인용정보 피인용 횟수 : 257  인용 특허 : 7

초록

A novel process for producing a semiconductor article is disclosed which comprises the steps of preparing a first substrate constituted of a silicon substrate, a nonporous semiconductor layer formed on the silicon substrate, and an ion implantation layer formed in at least one of the silicon substra

대표청구항

[ What is claimed is:] [1.] A process for producing a semiconductor article comprising steps of preparing a first substrate comprised of a silicon substrate, an epitaxial semiconductor layer formed on the silicon substrate, and an ion implantation layer formed in at least one of the silicon substrat

이 특허에 인용된 특허 (7)

  1. Inoue Shunsuke,JPX ; Miyawaki Mamoru,JPX ; Fukumoto Yoshihiko,JPX, Method for manufacturing semiconductor substrate.
  2. Bruel Michel (Veurey FRX), Method for placing semiconductive plates on a support.
  3. Ichikawa Takeshi (Zama JPX) Yonehara Takao (Atsugi JPX) Sakaguchi Kiyofumi (Atsugi JPX), Method for preparing semiconductor member.
  4. Sato Nobuhiko,JPX ; Yonehara Takao,JPX ; Sakaguchi Kiyofumi,JPX, Method for producing semiconductor substrate.
  5. Bozler Carl O. (Sudbury MA) Fan John C. C. (Chestnut Hill MA) McClelland Robert W. (Weymouth MA), Method of producing tandem solar cell devices from sheets of crystalline material.
  6. Bruel Michel (Veurey FRX), Process for the production of thin semiconductor material films.
  7. Yonehara Takao (Atsugi JPX), Semiconductor member and process for preparing semiconductor member.

이 특허를 인용한 특허 (257)

  1. Henley Francois J. ; Cheung Nathan W., Cleaved silicon thin film with rough surface.
  2. Francois J. Henley ; Michael A. Brayan ; William G. En, Cleaving process to fabricate multilayered substrates using low implantation doses.
  3. Henley,Francois J.; Bryan,Michael A.; En,William G., Cleaving process to fabricate multilayered substrates using low implantation doses.
  4. Yanagita, Kazutaka; Ohmi, Kazuaki; Sakaguchi, Kiyofumi, Composite member separating method, thin film manufacturing method, and composite member separating apparatus.
  5. Francois J. Henley ; Nathan Cheung, Controlled cleavage process and device for patterned films.
  6. Henley, Francois J.; Cheung, Nathan, Controlled cleavage process and device for patterned films.
  7. Francois J. Henley ; Nathan W. Cheung, Controlled cleavage process and resulting device using beta annealing.
  8. Henley Francois J. ; Cheung Nathan W., Controlled cleavage process and resulting device using beta annealing.
  9. Henley Francois J. ; Cheung Nathan W., Controlled cleavage process using patterning.
  10. Henley, Francois J.; Cheung, Nathan, Controlled cleavage process using pressurized fluid.
  11. Henley Francois J. ; Cheung Nathan, Controlled cleavage system using pressurized fluid.
  12. Henley Francois J. ; Cheung Nathan W., Controlled cleavage thin film separation process using a reusable substrate.
  13. Henley, Francois J.; Cheung, Nathan W., Controlled cleaving process.
  14. Henley,Francois J.; Cheung,Nathan W., Controlled cleaving process.
  15. Henley,Francois J.; Cheung,Nathan W., Controlled cleaving process.
  16. Henley, Francois J.; Cheung, Nathan, Controlled process and resulting device.
  17. Henley, Francois J.; Cheung, Nathan, Controlled process and resulting device.
  18. Henley, Francois J.; Cheung, Nathan W., Controlled process and resulting device.
  19. Henley, Francois J.; Cheung, Nathan W., Controlled process and resulting device.
  20. Henley, Francois J.; Cheung, Nathan W., Controlled process and resulting device.
  21. Henley,Francois J.; Cheung,Nathan W., Controlled process and resulting device.
  22. Hiliali, Mohamed M.; Herner, S. Brad, Creation and translation of low-relief texture for a photovoltaic cell.
  23. Li, Zhiyong; Tanner, David; Prabhu, Gopalakrishna; Hilali, Mohamed H., Creation of low-relief texture for a photovoltaic cell.
  24. Bai, Jie; Lochtefeld, Anthony J.; Park, Ji-Soo, Defect reduction using aspect ratio trapping.
  25. Bai, Jie; Lochtefeld, Anthony J.; Park, Ji-Soo, Defect reduction using aspect ratio trapping.
  26. Bai, Jie; Park, Ji-Soo; Lochtefeld, Anthony J., Defect reduction using aspect ratio trapping.
  27. Bai, Jie; Park, Ji-Soo; Lochtefeld, Anthony J., Defect reduction using aspect ratio trapping.
  28. Aspar, Bernard; Moriceau, Hubert; Zussy, Marc; Rayssac, Olivier, Detachable substrate or detachable structure and method for the production thereof.
  29. Henley Francois J. ; Cheung Nathan, Device for patterned films.
  30. Lochtefeld, Anthony J., Devices formed from a non-polar plane of a crystalline material and method of making the same.
  31. Lochtefeld, Anthony J., Devices formed from a non-polar plane of a crystalline material and method of making the same.
  32. Lochtefeld, Anthony J., Devices formed from a non-polar plane of a crystalline material and method of making the same.
  33. Lochtefeld, Anthony J., Diode-based devices and methods for making the same.
  34. Lochtefeld, Anthony J., Diode-based devices and methods for making the same.
  35. Lochtefeld, Anthony J., Diode-based devices and methods for making the same.
  36. Lochtefeld, Anthony J., Diode-based devices and methods for making the same.
  37. Lochtefeld, Anthony J., Diode-based devices and methods for making the same.
  38. Henley Francois J. ; Cheung Nathan W., Economical silicon-on-silicon hybrid wafer assembly.
  39. Maleville, Christophe, Edge removal of silicon-on-insulator transfer wafer.
  40. Park, Ji-Soo, Epitaxial growth of crystalline material.
  41. Park, Ji-Soo, Epitaxial growth of crystalline material.
  42. Park, Ji-Soo; Fiorenza, James G., Fabrication and structures of crystalline material.
  43. Murphy,Brian; Wahlich,Reinhold; Schmolke,R체diger; Von Ammon,Wilfried; Moreland,James, Film or layer made of semi-conductive material and method for producing said film or layer.
  44. Murphy,Brian; Wahlich,Reinhold; Schmolke,R��diger; Von Ammon,Wilfried; Moreland,James, Film or layer of semiconducting material, and process for producing the film or layer.
  45. Cheng, Zhiyuan; Fiorenza, James; Hydrick, Jennifer M.; Lochtefeld, Anthony J.; Park, Ji-Soo; Bai, Jie; Li, Jizhong, Formation of devices by epitaxial layer overgrowth.
  46. Hydrick, Jennifer M.; Li, Jizhong; Cheng, Zhinyuan; Fiorenza, James; Bai, Jie; Park, Ji-Soo; Lochtefeld, Anthony J., Formation of devices by epitaxial layer overgrowth.
  47. Nathan W. Cheung ; Francois J. Henley, Generic layer transfer methodology by controlled cleavage process.
  48. Henley, Francois J.; Cheung, Nathan W., Gettering technique for wafers made using a controlled cleaving process.
  49. Henley, Francois J.; Cheung, Nathan W., Gettering technique for wafers made using a controlled cleaving process.
  50. Ye, Peide; Cheng, Zhiyuan; Xuan, Yi; Wu, Yanqing; Adekore, Bunmi; Fiorenza, James, InP-based transistor fabrication.
  51. Ye, Peide; Cheng, Zhiyuan; Xuan, Yi; Wu, Yanqing; Adekore, Bunmi; Fiorenza, James, InP-based transistor fabrication.
  52. Joly, Jean-Pierre; Ulmer, Laurent; Parat, Guy, Integrated circuit on high performance chip.
  53. Sandhu, Gurtej S.; Parat, Krishna K., Integrated circuit structures, semiconductor structures, and semiconductor die.
  54. Lochtefeld, Anthony J., Lattice-mismatched semiconductor structures and related methods for device fabrication.
  55. Lochtefeld, Anthony J., Lattice-mismatched semiconductor structures and related methods for device fabrication.
  56. Lochtefeld, Anthony J., Lattice-mismatched semiconductor structures and related methods for device fabrication.
  57. Currie, Matthew T.; Lochtefeld, Anthony J.; Cheng, Zhiyuan; Langdo, Thomas A., Lattice-mismatched semiconductor structures on insulators.
  58. Li, Jizhong; Lochtefeld, Anthony J., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  59. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  60. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  61. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  62. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  63. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  64. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  65. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhiyuan; Fiorenza, James; Braithwaite, Glyn; Langdo, Thomas A., Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication.
  66. Henley, Francois J., Layer transfer of films utilizing controlled propagation.
  67. Henley, Francois J., Layer transfer of films utilizing controlled shear region.
  68. Li, Jizhong; Lochtefeld, Anthony J., Light-emitter-based devices with lattice-mismatched semiconductor structures.
  69. Sato, Nobuhiko, Method and apparatus for heat-treating an SOI substrate and method of preparing an SOI substrate by using the same.
  70. Masaaki Iwane JP; Takao Yonehara JP; Kazuaki Ohmi JP; Shoji Nishida JP; Kiyofumi Sakaguchi JP; Kazutaka Yanagita JP, Method and apparatus for producing photoelectric conversion device.
  71. Kazuaki Ohmi JP; Takao Yonehara JP; Kiyofumi Sakaguchi JP; Kazutaka Yanagita JP, Method and apparatus for separating composite member using fluid.
  72. Kazuaki Ohmi JP; Takao Yonehara JP; Kiyofumi Sakaguchi JP; Kazutaka Yanagita JP, Method and apparatus for separating composite member using fluid.
  73. Ohmi, Kazuaki; Yonehara, Takao; Sakaguchi, Kiyofumi; Yanagita, Kazutaka, Method and apparatus for separating composite member using fluid.
  74. Battaglia Anna,ITX ; Fallica Piergiorgio,ITX ; Ronsisvalle Cesare,ITX ; Coffa Salvatore,ITX ; Raineri Vito,ITX, Method and apparatus for the localized reduction of the lifetime of charge carriers, particularly in integrated electronic devices.
  75. Francois J. Henley ; Nathan W. Cheung, Method and device for controlled cleaving process.
  76. Henley Francois J. ; Cheung Nathan, Method and device for controlled cleaving process.
  77. Henley Francois J. ; Cheung Nathan W., Method and device for controlled cleaving process.
  78. Henley, Francois J.; Cheung, Nathan W., Method and device for controlled cleaving process.
  79. Henley,Francois J.; Cheung,Nathan, Method and device for controlled cleaving process.
  80. Henley, Francois J.; Ong, Philip James, Method and structure for fabricating solar cells using a layer transfer process.
  81. Henley, Francois J., Method and structure for fabricating solar cells using a thick layer transfer process.
  82. Maleville, Christophe, Method for fabricating a semiconductor on insulator type substrate.
  83. Kub Francis J. ; Hobart Karl D., Method for fabricating singe crystal materials over CMOS devices.
  84. Aga Hiroji,JPX ; Kobayashi Norihiro,JPX ; Mitani Kiyoshi,JPX, Method for heat treatment of SOI wafer and SOI wafer heat-treated by the method.
  85. Fournel, Franck; Moriceau, Hubert; Lagahe, Christelle, Method for making a stressed structure designed to be dissociated.
  86. Deguet, Chrystel; Clavelier, Laurent, Method for making a thin-film element.
  87. Kub, Francis J.; Hobart, Karl D., Method for making electro-optical devices using a hydrogenion splitting technique.
  88. Kub, Francis J.; Hobart, Karl D., Method for making piezoelectric resonator and surface acoustic wave device using hydrogen implant layer splitting.
  89. Kub, Francis J.; Hobart, Karl D., Method for making pyroelectric, electro-optical and decoupling capacitors using thin film transfer and hydrogen ion splitting techniques.
  90. Kub, Francis J.; Hobart, Karl D., Method for making shallow diffusion junctions in semiconductors using elemental doping.
  91. Aspar, Bernard; Lagahe, Christelle; Ghyselen, Bruno, Method for making thin layers containing microcomponents.
  92. Akiyama, Shoji; Kubota, Yoshihiro; Ito, Atsuo; Kawai, Makoto; Tobisaka, Yuuji; Tanaka, Koichi, Method for manufacturing SOI substrate.
  93. Yamazaki, Shunpei, Method for manufacturing SOI substrate.
  94. Yamazaki, Shunpei; Nishida, Eriko, Method for manufacturing SOI substrate and method for manufacturing semiconductor device.
  95. Maurice,Thibaut; Nguyen,Phuong; Guiot,Eric, Method for manufacturing a compound material wafer.
  96. Yokokawa Isao,JPX ; Mitani Kiyoshi,JPX, Method for manufacturing bonded wafer and bonded wafer.
  97. Iwamoto, Takashi, Method for manufacturing piezoelectric device with a composite piezoelectric substrate.
  98. Kurata, Motomu; Sasagawa, Shinya; Muraoka, Taiga, Method for manufacturing semiconductor substrate.
  99. Tauzin, Aurélie; Dechamp, Jérôme; Mazen, Frédéric; Madeira, Florence, Method for preparing thin GaN layers by implantation and recycling of a starting substrate.
  100. Timothy Daryl Stanley ; Peter Stanley, Method for producing SOI wafers by delamination.
  101. Bernard Aspar FR; Michel Bruel FR; Claude Jaussaud FR; Chrystelle Lagahe FR, Method for producing a thin membrane and resulting structure with membrane.
  102. Xie,Ya Hong, Method for producing dislocation-free strained crystalline films.
  103. Xie,Ya Hong, Method for producing dislocation-free strained crystalline films.
  104. Fujikura,Hajime; Iizuka,Kazuyuki, Method for producing nitride semiconductor crystal, and nitride semiconductor wafer and nitride semiconductor device.
  105. Hayakawa, Norihiro; Iwamoto, Takashi; Kando, Hajime, Method for producing piezoelectric composite substrate.
  106. Kuwabara, Susumu; Mitani, Kiyoshi; Tate, Naoto; Nakano, Masatake; Barge, Thierry; Maleville, Christophe, Method for reclaiming delaminated wafer and reclaimed delaminated wafer.
  107. Nguyen, Nguyet-Phuong; Cayrefourcq, Ian; Lagahe-Blanchard, Christelle; Bourdelle, Konstantin; Tauzin, Aurélie; Fournel, Franck, Method for self-supported transfer of a fine layer by pulsation after implantation or co-implantation.
  108. Cheng, Zhiyuan; Fiorenza, James; Sheen, Calvin; Lochtefeld, Anthony J., Method for semiconductor sensor structures with reduced dislocation defect densities.
  109. Moriceau, Hubert; Bruel, Michel; Aspar, Bernard; Maleville, Christophe, Method for transferring a thin film comprising a step of generating inclusions.
  110. Nguyen, Nguyet-Phuong; Cayrefourcq, Ian; Lagahe-Blanchard, Christelle, Method of catastrophic transfer of a thin film after co-implantation.
  111. Cayrefourcq,Ian; Mohamed,Nadia Ben; Lagahe Blanchard,Christelle; Nguyen,Nguyet Phuong, Method of detaching a thin film at moderate temperature after co-implantation.
  112. Tauzin, Aurélie; Faure, Bruce; Garnier, Arnaud, Method of detaching a thin film by melting precipitates.
  113. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  114. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  115. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  116. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  117. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  118. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  119. Yamazaki,Shunpei; Ohtani,Hisashi, Method of fabricating a semiconductor device.
  120. Yamazaki,Shunpei; Ohtani,Hisashi, Method of fabricating a semiconductor device.
  121. Yamazaki,Shunpei; Ohtani,Hisashi, Method of fabricating a semiconductor device.
  122. Yokokawa Isao,JPX ; Tate Naoto,JPX ; Mitani Kiyoshi,JPX, Method of fabricating an SOI wafer and SOI wafer fabricated by the method.
  123. Faure, Bruce; Di Cioccio, Lea, Method of fabricating an epitaxially grown layer.
  124. Faure, Bruce; Di Cioccio, Lea, Method of fabricating an epitaxially grown layer.
  125. Faure, Bruce; Letertre, Fabrice, Method of fabricating an epitaxially grown layer.
  126. Faure, Bruce; Letertre, Fabrice, Method of fabricating an epitaxially grown layer.
  127. Park, Jea-Gun; Lee, Gon-Sub; Lee, Sang-Hee, Method of fabricating nano SOI wafer and nano SOI wafer fabricated by the same.
  128. Park,Jea Gun; Lee,Gon Sub; Lee,Sang Hee, Method of fabricating nano SOI wafer and nano SOI wafer fabricated by the same.
  129. Torvik,John Targe, Method of making a hybrid substrate having a thin silicon carbide membrane layer.
  130. Torvik, John Tarje, Method of making a hybride substrate having a thin silicon carbide membrane layer.
  131. Ohnuma, Hideto; Yamazaki, Shunpei, Method of making an SOI substrate by using a separation layer with regions of non-uniform concentration.
  132. Kud, Francis; Hobart, Karl; Spencer, Mike, Method of making mosaic array of thin semiconductor material of large substrates.
  133. Yamazaki, Shunpei; Takayama, Toru; Sato, Mizuho; Uto, Noriaki, Method of manufacturing SOI substrate.
  134. Shunpei Yamazaki JP, Method of manufacturing a semiconductor device.
  135. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  136. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  137. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  138. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  139. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  140. Yamazaki,Shunpei, Method of manufacturing a semiconductor device.
  141. Yamazaki, Shunpei, Method of manufacturing a semiconductor device having a gate electrode formed over a silicon oxide insulating layer.
  142. Yamazaki, Shunpei, Method of manufacturing a semiconductor device including thermal oxidation to form an insulating film.
  143. Yamashita, Akio; Fukumoto, Yumiko; Goto, Yuugo, Method of manufacturing display device.
  144. Yamashita, Akio; Fukumoto, Yumiko; Goto, Yuugo, Method of manufacturing display device.
  145. Yamashita, Akio; Fukumoto, Yumiko; Goto, Yuugo, Method of manufacturing display device.
  146. Yamashita, Akio; Fukumoto, Yumiko; Goto, Yuugo, Method of manufacturing display device.
  147. Yamashita, Akio; Fukumoto, Yumiko; Goto, Yuugo, Method of manufacturing display device.
  148. Yamashita, Akio; Fukumoto, Yumiko; Goto, Yuugo, Method of manufacturing optical film.
  149. Yamashita, Akio; Ohno, Yumiko; Goto, Yuugo, Method of manufacturing optical film.
  150. Yamazaki, Shunpei, Method of manufacturing semiconductor device having island-like single crystal semiconductor layer.
  151. Takao Yonehara JP; Kunio Watanabe JP; Tetsuya Shimada JP; Kazuaki Ohmi JP; Kiyofumi Sakaguchi JP, Method of producing semiconductor member.
  152. Nakagawa Katsumi,JPX ; Yonehara Takao,JPX ; Nishida Shoji,JPX ; Sakaguchi Kiyofumi,JPX, Method of producing semiconductor member and method of producing solar cell.
  153. Nakagawa, Katsumi; Yonehara, Takao; Nishida, Shoji; Sakaguchi, Kiyofumi, Method of producing semiconductor member and method of producing solar cell.
  154. Deguet, Chrystel; Clavelier, Laurent; Dechamp, Jerome, Method of transferring a thin film onto a support.
  155. Fournel, Franck, Method of transferring a thin layer onto a target substrate having a coefficient of thermal expansion different from that of the thin layer.
  156. Sivaram, Srinivasan; Agarwal, Aditya; Herner, S. Brad; Petti, Christopher J., Method to form a photovoltaic cell comprising a thin lamina.
  157. Sivaram, Srinivasan; Agarwal, Aditya; Herner, S. Brad; Petti, Christopher J., Method to form a photovoltaic cell comprising a thin lamina.
  158. Sivaram, Srinivasan; Agarwal, Aditya; Herner, S. Brad; Petti, Christopher J., Method to form a photovoltaic cell comprising a thin lamina.
  159. Cheng, Zhiyuan; Fiorenza, James; Sheen, Calvin; Lochtefeld, Anthony J., Methods for semiconductor sensor structures with reduced dislocation defect densities.
  160. Sandhu, Gurtej S.; Parat, Krishna K., Methods of forming integrated circuits using donor and acceptor substrates.
  161. Letertre, Fabrice; Faure, Bruce; Krames, Michael R.; Gardner, Nathan F., Methods of forming relaxed layers of semiconductor materials, semiconductor structures, devices and engineered substrates including same.
  162. Gonzalez,Fernando, Methods of forming semiconductor circuitry.
  163. Gonzalez,Fernando, Methods of forming semiconductor circuitry.
  164. Fiorenza, James; Lochtefeld, Anthony J., Multi-junction solar cells.
  165. Fiorenza, James; Lochtefeld, Anthony J., Multi-junction solar cells.
  166. Li, Jizhong, Nitride-based multi-junction solar cell modules and methods for making the same.
  167. Li, Jizhong, Nitride-based multi-junction solar cell modules and methods for making the same.
  168. Malik, Igor J.; Kang, Sien G.; Fuerfanger, Martin; Kirk, Harry; Flat, Ariel; Current, Michael Ira; Ong, Philip James, Non-contact etch annealing of strained layers.
  169. Yamazaki, Shunpei; Ohtani, Hisashi; Koyama, Jun; Fukunaga, Takeshi, Nonvolatile memory and electronic apparatus.
  170. Bryan Michael A. ; Kai James K., Nozzle for cleaving substrates.
  171. Bryan, Michael A.; Kai, James K., Nozzle for cleaving substrates.
  172. Bryan, Michael A., Particle distribution method and resulting structure for a layer transfer process.
  173. Hilali, Mohamed M.; Petti, Christopher J., Photovoltaic cell comprising a thin lamina having low base resistivity and method of making.
  174. Li, Jizhong; Lochtefeld, Anthony J.; Sheen, Calvin; Cheng, Zhiyuan, Photovoltaics on silicon.
  175. Hydrick, Jennifer M.; Fiorenza, James, Polishing of small composite semiconductor materials.
  176. Hydrick, Jennifer M.; Fiorenza, James, Polishing of small composite semiconductor materials.
  177. Hydrick, Jennifer M.; Fiorenza, James G., Polishing of small composite semiconductor materials.
  178. Henley Francois J. ; Cheung Nathan W., Pre-semiconductor process implant and post-process film separation.
  179. Henley Francois J. ; Cheung Nathan W., Pressurized microbubble thin film separation process using a reusable substrate.
  180. Norbert Galster CH; Stefan Linder CH, Process for fabricating a semiconductor component.
  181. Neyret, Eric, Process for fabricating a substrate of the silicon-on-insulator type with thin surface layer.
  182. Sakaguchi, Kiyofumi; Yonehara, Takao; Sato, Nobuhiko, Process for manufacturing a semiconductor substrate as well as a semiconductor thin film, and multilayer structure.
  183. Nishida Shoji,JPX ; Yonehara Takao,JPX ; Sakaguchi Kiyofumi,JPX ; Iwane Masaaki,JPX, Process for producing solar cell, process for producing thin-film semiconductor, process for separating thin-film semiconductor, and process for forming semiconductor.
  184. Fukunaga, Takeshi, Process for production of SOI substrate and process for production of semiconductor device.
  185. Fukunaga, Takeshi, Process for production of SOI substrate and process for production of semiconductor device including the selective forming of porous layer.
  186. Moriceau, Hubert; Bruel, Michel; Aspar, Bernard; Maleville, Christophe, Process for the transfer of a thin film.
  187. Moriceau,Hubert; Bruel,Michel; Aspar,Bernard; Maleville,Christophe, Process for the transfer of a thin film.
  188. Moriceau, Hubert; Bruel, Michel; Aspar, Bernard; Maleville, Christophe, Process for the transfer of a thin film comprising an inclusion creation step.
  189. Cheng, Zhiyuan; Sheen, Calvin, Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures.
  190. Cheng, Zhiyuan; Sheen, Calvin, Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures.
  191. Cheng, Zhiyuan; Sheen, Calvin, Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures.
  192. Cheng, Zhiyuan; Sheen, Calvin, Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures.
  193. Cheng, Zhiyuan; Sheen, Calvin, Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures.
  194. Cheng, Zhiyuan; Sheen, Calvin, Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures.
  195. Henley, Francois J.; Brailove, Adam, Race track configuration and method for wafering silicon solar substrates.
  196. Ghyselen,Bruno; Aulnette,C챕cile; Osternaud,B챕n챕dite; Vaillant,Yves Mathieu; Akatsu,Takeshi, Recycling a wafer comprising a buffer layer, after having separated a thin layer therefrom.
  197. Ghyselen,Bruno; Aulnette,C��cile; Osternaud,B��n��dite; Le Vaillant,Yves Mathieu; Akatsu,Takeshi, Recycling a wafer comprising a buffer layer, after having separated a thin layer therefrom.
  198. Ghyselen,Bruno; Aulnette,C챕cile; Osternaud,B챕n챕dite; Vaillant,Yves Mathieu; Akatsu,Takeshi, Recycling of a wafer comprising a buffer layer after having separated a thin layer therefrom by mechanical means.
  199. Cheng, Zhiyuan, Reduction of edge effects from aspect ratio trapping.
  200. Cheng, Zhiyuan, Reduction of edge effects from aspect ratio trapping.
  201. Cheng, Zhiyuan, Reduction of edge effects from aspect ratio trapping.
  202. Cheng, Zhiyuan, Reduction of edge effects from aspect ratio trapping.
  203. Cheng, Zhiyuan, Reduction of edge effects from aspect ratio trapping.
  204. Hirabayashi Yukiya,JPX, SOI substrate, method for making the same, semiconductive device and liquid crystal panel using the same.
  205. Akiyama, Shoji, SOS substrate with reduced stress.
  206. Kazutaka Yanagita JP; Takao Yonehara JP; Kazuaki Omi JP; Kiyofumi Sakaguchi JP, Sample separating apparatus and method, and substrate manufacturing method.
  207. Yanagita, Kazutaka; Yonehara, Takao; Omi, Kazuaki; Sakaguchi, Kiyofumi, Sample separating apparatus and method, and substrate manufacturing method.
  208. Yanagita, Kazutaka; Yonehara, Takao; Omi, Kazuaki; Sakaguchi, Kiyofumi, Sample separating apparatus and method, and substrate manufacturing method.
  209. Okagawa,Hiroaki; Tadatomo,Kazuyuki; Ouchi,Yoichiro; Tsunekawa,Takashi, Semiconductor base material and method of manufacturing the material.
  210. Gonzalez,Fernando, Semiconductor circuit constructions.
  211. Gonzalez,Fernando, Semiconductor circuitry constructions.
  212. Yamazaki, Shunpei, Semiconductor device.
  213. Yamazaki, Shunpei; Ohtani, Hisashi; Koyama, Jun; Fukunaga, Takeshi, Semiconductor device having buried oxide film.
  214. Lochtefeld, Anthony J., Semiconductor diodes fabricated by aspect ratio trapping with coalesced films.
  215. Lochtefeld, Anthony J., Semiconductor diodes fabricated by aspect ratio trapping with coalesced films.
  216. Gadkaree,Kishor Purushottam, Semiconductor on glass insulator made using improved ion implantation process.
  217. Cheng, Zhiyuan; Fiorenza, James G.; Sheen, Calvin; Lochtefeld, Anthony, Semiconductor sensor structures with reduced dislocation defect densities.
  218. Cheng, Zhiyuan; Fiorenza, James; Sheen, Calvin; Lochtefeld, Anthony J., Semiconductor sensor structures with reduced dislocation defect densities.
  219. Cherekdjian, Sarko, Semiconductor structure made using improved multiple ion implantation process.
  220. Cherekdjian, Sarko, Semiconductor structure made using improved multiple ion implantation process.
  221. Cherekdjian, Sarko, Semiconductor structure made using improved pseudo-simultaneous multiple ion implantation process.
  222. Cherekdjian, Sarko, Semiconductor structure made using improved simultaneous multiple ion implantation process.
  223. Arena, Chantal, Semiconductor structures, devices and engineered substrates including layers of semiconductor material having reduced lattice strain.
  224. Arena, Chantal, Semiconductor structures, devices and engineered substrates including layers of semiconductor material having reduced lattice strain.
  225. Yamada Naoki,JPX, Semiconductor substrate processing method.
  226. Ghyselen, Bruno; Letertre, Fabrice, Semiconductor substrates having useful and transfer layers.
  227. Ghyselen, Bruno; Letertre, Fabrice, Semiconductor substrates having useful and transfer layers.
  228. Ghyselen, Bruno; Letertre, Fabrice, Semiconductor substrates having useful and transfer layers.
  229. Yamazaki, Shunpei; Koyama, Jun; Miyanaga, Akiharu; Fukunaga, Takeshi, Semiconductor thin film and method of manufacturing the same and semiconductor device and method of manufacturing the same.
  230. Henley, Francois J.; Cheung, Nathan W., Silicon-on-silicon hybrid wafer assembly.
  231. Henley Francois J. ; Cheung Nathan W., Silicon-on-silicon wafer bonding process using a thin film blister-separation method.
  232. Malik, Igor J.; Kang, Sien G., Smoothing method for cleaved films made using a release layer.
  233. Sien G. Kang ; Igor J. Malik, Smoothing method for cleaved films made using a release layer.
  234. Igor J. Malik ; Sien G. Kang, Smoothing method for cleaved films made using thermal treatment.
  235. Lochtefeld, Anthony J.; Currie, Matthew T.; Cheng, Zhi Yuan; Fiorenza, James, Solutions for integrated circuit integration of alternative active area materials.
  236. Xie, Ya-Hong, Spin injection device having semiconductor-ferromagnetic-semiconductor structure and spin transistor.
  237. Xie, Ya-Hong, Spin injection device having semiconductor-ferromagnetic-semiconductor structure and spin transistor.
  238. Moriceau, Hubert; Aspar, Bernard; Margail, Jacques, Stacked structure and production method thereof.
  239. Werkhoven, Christiaan J., Strain relaxation using metal materials and related structures.
  240. Werkhoven, Christiaan J., Strain relaxation using metal materials and related structures.
  241. Koester,Steven John; Sadana,Devendra Kumar; Shahidi,Ghavam G., Structure and method of integrating compound and elemental semiconductors for high-performance CMOS.
  242. Sakaguchi, Kiyofumi, Substrate and manufacturing method therefor.
  243. Sakaguchi, Kiyofumi, Substrate and manufacturing method therefor.
  244. Sakaguchi, Kiyofumi; Sato, Nobuhiko, Substrate and production method thereof.
  245. Bryan Michael A. ; Kai James K., Substrate cleaving tool and method.
  246. Bryan, Michael A.; Kai, James K., Substrate cleaving tool and method.
  247. Henley, Francois; Lamm, Al; Chow, Yi-Lei, Substrate cleaving under controlled stress conditions.
  248. Henley, Francois; Lamm, Al; Chow, Yi-Lei, Substrate cleaving under controlled stress conditions.
  249. Henley, Francois; Lamm, Al; Chow, Yi-Lei, Substrate cleaving under controlled stress conditions.
  250. Kang,Sien G.; Malik,Igor J., Surface finishing of SOI substrates using an EPI process.
  251. Brailove, Adam; Liu, Zuqin; Henley, Francois J.; Lamm, Albert J., Techniques for forming thin films by implantation with reduced channeling.
  252. Iwane, Masaaki; Yonehara, Takao, Thin film formation process by clearing the implanted layer with laser radiation.
  253. Tauzin,Aur��lie, Thin film splitting method.
  254. Doyle, Brian S., Thin film using non-thermal techniques.
  255. Ben Mohamed,Nadia; Nguyen,Nguyet Phuong; Akatsu,Takeshi; Boussagol,Alice; Suciu,Gabriela, Thin layer transfer method utilizing co-implantation to reduce blister formation and to surface roughness.
  256. Kang, Sien G.; Malik, Igor J., Treatment method of film quality for the manufacture of substrates.
  257. Lochtefeld, Anthony J., Tri-gate field-effect transistors formed by aspect ratio trapping.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로