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Switched current temperature sensor circuit with compounded .DELTA.V.sub.BE 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-035/00
출원번호 US-0910676 (1997-08-13)
발명자 / 주소
  • Tuthill Michael G.,IEX
출원인 / 주소
  • Analog Devices, Inc.
대리인 / 주소
    Iandiorio & Teska
인용정보 피인용 횟수 : 77  인용 특허 : 4

초록

A switched current temperature sensor circuit with compounded .DELTA.V.sub.BE includes an amplifier having an inverting input with a corresponding non-inverting output, and a non-inverting input with a corresponding inverting output; a first PN junction connected to the non-inverting input through a

대표청구항

[ What is claimed is:] [1.] A switched current temperature circuit with compounded .DELTA.V.sub.BE comprising:an amplifier having an inverting input with corresponding non-inverting output and a non-inverting input with a corresponding inverting output;a first PN junction connected to said non-inver

이 특허에 인용된 특허 (4)

  1. Audy Jonathan M. (Campbell CA) Gilbert Barrie (Portland OR), Multiple sequential excitation temperature sensing method and apparatus.
  2. Neely Andrew (Phoenixville PA) Fussell Richard L. (Berwyn PA), On chip noise tolerant temperature sensing circuit.
  3. Yamauchi Yukio (Kawasaki JPX), Temperature detecting apparatus.
  4. Beran Anthony V. (Santa Ana CA), Temperature measurement.

이 특허를 인용한 특허 (77)

  1. McLeod,Scott C.; Bashar,Aniruddha, Accurate temperature measurement method for low beta transistors.
  2. McLeod,Scott C.; Castellano,William, Accurate testing of temperature measurement unit.
  3. Bisping, Michael; Jabs, Hermann; Marschner, Juergen, Arrangement for measuring the temperature of an electronic circuit.
  4. Shen, Guozhong; Erdogan, Ozan E.; Mahmud, Syed T.; Knox, Kenneth W., Background noise measurement and frequency selection in touch panel sensor systems.
  5. Cave, David, Bandgap circuit with temperature correction.
  6. Cave, David, Bandgap circuit with temperature correction.
  7. Cave, David, Bandgap circuit with temperature correction.
  8. Harvey, Barry, Bandgap voltage reference circuits and methods for producing bandgap voltages.
  9. Aslan,Mehmet; Branch,John W., Beta variation cancellation in temperature sensors.
  10. Lin, Xijian; Benzel, Phillip J., CMOS temperature-to-digital converter with digital correction.
  11. Lin, Xijian; Benzel, Phillip J., CMOS temperature-to-digital converter with digital correction.
  12. Erdogan, Ozan E.; Shen, Guozhong; Anantharaman, Rajesh; Taparia, Ajay; Javid, Behrooz; Mahmud, Syed T.; Chowdhury, Rahim F., Capacitive touch sense architecture having a correlator for demodulating a measured capacitance from an excitation signal.
  13. Erdogan, Ozan E.; Shen, Guozhong; Anantharaman, Rajesh; Taparia, Ajay; Javid, Behrooz; Mahmud, Syed T.; Chowdhury, Rahim F., Capacitive touch sense architecture having a correlator for demodulating a measured capacitance from an excitation signal.
  14. Kamath, Umanath R.; Jennings, John K.; Lynam, Adrian, Circuit for and method of implementing a multifunction output generator.
  15. Ash, Mikel K.; Nagaraj, Krishnaswamy; Kimelman, Paul; Vu, Steve, Circuits and methods for determining the temperature of a transistor.
  16. Harvey, Barry, Circuits and methods to produce a VPTAT and/or a bandgap voltage.
  17. Herbst, Steven G., Circuits and methods to produce a VPTAT and/or a bandgap voltage with low-glitch preconditioning.
  18. Harvey, Barry, Circuits and methods to produce a bandgap voltage with low-drift.
  19. Trampitsch, Gerd, Circuits for and methods of accurately measuring temperature of semiconductor junctions.
  20. Gay, Michael J., Circuits, architectures, apparatuses, systems, and methods for low noise reference voltage generators with offset compensation.
  21. Henderson, Richard Dean; Aslan, Mehmet, Constant offset buffer for reducing sampling time in a semiconductor temperature sensor.
  22. Erdogan, Ozan E.; Shen, Guozhong; Ananthararman, Rajesh; Taparia, Ajay; Javid, Behrooz; Mahmud, Syed T., Continuous time correlator architecture.
  23. McLeod,Scott C.; Gay,Kenneth W., Conversion clock randomization for EMI immunity in temperature sensors.
  24. Wan,Jun, Correlated double sampling modulation system with reduced latency of reference to input.
  25. Bakker Anthonius,NLX ; Huijsing Johan H.,NLX, Current generator for delivering a reference current of which the value is proportional to the absolute temperature.
  26. Miranda, Evaldo M.; Mahony, Michelle; Cleary, John; Blake, John, Current measurement circuit.
  27. Lin, Ming-Tse; Hung, Chung-Chih, Current-mode dual-slope temperature-digital conversion device.
  28. Miranda ; Jr. Evaldo Martino ; Tuthill Michael G.,IEX ; Blake John,IEX, Decoupled switched current temperature circuit with compounded .DELTA.V .sub.be.
  29. Holloway, Peter R.; Blom, Eric D.; Wan, Jun; Urie, Stuart H., Digitizing temperature measurement system.
  30. Holloway, Peter R.; Blom, Eric D.; Wan, Jun; Urie, Stuart H., Digitizing temperature measurement system and method of operation.
  31. McLeod, Scott C., EMI rejection for temperature sensing diodes.
  32. Henderson,Richard; Aslan,Mehmet, Efficient method of sharing diode pins on multi-channel remote diode temperature sensors.
  33. Doorenbos,Jerry L.; Gardner,Marco A.; Trifonov,Dimitar T., Hybrid delta-sigma/SAR analog to digital converter and methods for using such.
  34. Tesi,Davide; Zampieri,Ugo, Integrated digital temperature sensor.
  35. McLeod,Scott C., Integrated resistance cancellation in temperature measurement systems.
  36. Shih,Kelvin, LED junction temperature tester.
  37. Holloway, Peter R.; Blom, Eric D.; Wan, Jun, Low noise correlated double sampling modulation system.
  38. Zhang, Hong; Rypka, William Robert; Tan, Emy; Izadinia, Mansour, M-level diode junction temperature measurement method cancelling series and parallel parasitic influences.
  39. Garavan,Patrick J., Method and circuit for the provision of accurately scaled currents.
  40. Sheehan, Gary E.; Wan, Jun, Method for synchronized delta-VBE measurement for calculating die temperature.
  41. Jeon, Young Deuk; Lee, Seung Chul; Kim, Kwi Dong; Kwon, Chong Ki; Kim, Jong Dae, Multi-bit pipeline analog-to-digital converter having merged capacitor switching structure.
  42. Lorenz, Perry Scott, Multi-slope analog temperature sensor.
  43. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring circuit and method.
  44. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
  45. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
  46. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring method.
  47. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring method.
  48. Wadhwa, Sanjay K., On-die temperature sensor for integrated circuit.
  49. Sugiura, Masakazu; Sawai, Hideyuki, Overheat detection circuit and semiconductor device.
  50. Júlio, Alexandre; Chatinho, Vitor; Monteiro, António Barny; Cardoso, André, PN-junction temperature sensing apparatus.
  51. Glaser, Jerome I.; Hann, Raymond; Igawa, Makoto, Power transistor array temperature control system.
  52. St. Pierre, Robert; McLeod, Scott C., Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current.
  53. St. Pierre,Robert; McLeod,Scott C., Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current.
  54. Harvey, Barry; Herbst, Steven, Rotating gain resistors to produce a bandgap voltage with low-drift.
  55. Matsumoto, Toru; Mori, Yasuhiro, Semiconductor temperature detecting method and its circuit.
  56. Lechner, Moritz; Haeberli, Andreas Martin, Sensor and sigma-delta converter.
  57. Breinlinger, Richard H., Solid state temperature measuring device and method.
  58. Breinlinger,Richard H., Solid state temperature measuring device and method.
  59. Miranda,Evaldo M.; Brokaw,A. Paul, Switched current temperature sensing circuit and method to correct errors due to beta and series resistance.
  60. Wan, Jun; Holloway, Peter R.; Sheehan, Gary E., Synchronized delta-VBE measurement system.
  61. Gardner, Marco A.; Doorenbos, Jerry L., Systems and methods for PWM clocking in a temperature measurement circuit.
  62. Gardner, Marco A.; Doorenbos, Jerry L., Systems and methods for resistance compensation in a temperature measurement circuit.
  63. Doorenbos, Jerry L.; Gardner, Marco A., Systems and methods for temperature measurement using n-factor coefficient correction.
  64. Descombes Arthur,CHX, Temperature level detection circuit.
  65. Chiu,Jui Te, Temperature measurement circuit calibrated through shifting a conversion reference level.
  66. Miyazaki, Takashi; Hamano, Hiroyuki, Temperature measurement device, integrated circuit, and temperature measurement method.
  67. Tanaka, Nobue, Temperature measuring sensor incorporated in semiconductor substrate, and semiconductor device containing such temperature measuring sensor.
  68. Liepold, Carl F; Aykroyd, Craig M; McLin, Jonathan Daniel, Temperature sensing circuit.
  69. Yang,Hung Ming, Temperature sensor.
  70. Buter, Berry Anthony Johannus, Temperature-to-digital converter.
  71. Stockstad, Troy L., Temperature-to-digital converter.
  72. Raychowdhury, Arijit; Lakdawala, Hasnain; Li, Yee (William); Taylor, Greg; Krishnamurthy, Soumyanath, Thermal sensor device.
  73. Aslan, Mehmet; Henderson, Richard; Ng, Chung Wai Benedict, Three-terminal dual-diode system for fully differential remote temperature sensors.
  74. Aslan, Mehmet; Henderson, Richard Dean; Wong, Michael; Ren, Qing Feng; Ng, Chungwai Benedict; Oshima, Hideya, Time-interleaved sampling of voltages for improving accuracy of temperature remote sensors.
  75. Manea, Danut; Kotowski, Jeff; Fritz, Scott N.; Wang, Yongliang, Voltage reference with low sensitivity to package shift.
  76. Manea, Danut; Kotowski, Jeff; Fritz, Scott N.; Wang, Yongliang, Voltage reference with low sensitivty to package shift.
  77. Daly,Michael P.; Miranda,Evaldo M.; Thomson,David; Brokaw,A. Paul, Voltage source circuit with selectable temperature independent and temperature dependent voltage outputs.
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