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Methods and apparatuses for in-line solder paste inspection 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0211539 (1998-12-15)
발명자 / 주소
  • Koljonen Juha
출원인 / 주소
  • Cognex Corporation
대리인 / 주소
    Calabresi
인용정보 피인용 횟수 : 37  인용 특허 : 3

초록

Inspection of solder paste on a printed circuit board using a histogram of an image before printing (pre-application image) to normalize an image after printing of the printed circuit board (post-application image) is described. Existing lighting and optics used for alignment of the screen-printing

대표청구항

[ What is claimed is:] [1.] A method of identifying a first region within a second-state image, the method comprising:providing a first-state image having a first region;calculating at least one first-state characteristic representative of at least the first region of the first-state image;acquiring

이 특허에 인용된 특허 (3)

  1. Lang George F. (Lansdale PA) Leon Robert L. (Maple Glen PA), Method and apparatus for isolating and identifying periodic Doppler signals in a turbine.
  2. Scott Brian L. (Denton TX) Newell John M. (Denton TX), Method for signal processing.
  3. Lombardi Julian, Systems, methods, and computer program products for accessing, leasing, relocating, constructing and modifying internet.

이 특허를 인용한 특허 (37)

  1. Aghajan, Hamid K., Adaptive mask technique for defect inspection.
  2. Jahnke, Ronny; Sczepurek, Tristan, Apparatus and method for automatic inspection of through-holes of a component.
  3. Koljonen, Juha, Apparatus for locating features of an object using varied illumination.
  4. Lee, Shih-Jong J.; Oh, Seho; Nelson, Larry A., Automatic detection of alignment or registration marks.
  5. Koljonen, Juha; Taycher, Leonid, Automatic training of inspection sites for paste inspection by using sample pads.
  6. Wada, Hiromitsu, Bonding apparatus.
  7. Case,Steven K., Component feeder exchange diagnostic tool.
  8. Case,Steven K., Component feeder exchange diagnostic tool.
  9. Haugen, Paul R., Enhanced illumination control for three-dimensional imaging.
  10. McDaniel, C. Steven; Salazar, Mauricio, Equipment decontamination system and method.
  11. Fishbaine,David, High speed optical image acquisition system with extended dynamic range.
  12. Duquette, David W.; Rudd, Eric P.; Bushman, Thomas W.; Manickam, Swaminathan; Skunes, Timothy A.; Case, Steven K., Image analysis for pick and place machines with in situ component placement inspection.
  13. Sato,Makoto, Image processing apparatus and image processing method capable of displaying a difference image.
  14. Sato,Makoto, Image processing apparatus, image processing method, program, and recording medium for generating a difference image from a first radiographic image and second radiographic image.
  15. Sato, Makoto, Image processing device, image processing method, program, storage medium and image processing system.
  16. Lipson,Pamela R.; Ratan,Aparna; Srinivas,Chukka; Sinha,Pawan, Image processing system for use with inspection systems.
  17. Takarada, Shinichi, Image recognition method and image recognition apparatus.
  18. Wang,Yibing (Michelle), Image sensing system with histogram modification.
  19. Wang,Yibing (Michelle), Image sensing system with histogram modification.
  20. Gaukroger, David Alexander, Inspection system for and method of inspecting deposits printed on workpieces.
  21. Skunes, Timothy A.; Fishbaine, David, Inspection system with vibration resistant video capture.
  22. Obrador,Pere, Method and system for processing images using histograms.
  23. Koljonen, Juha, Method for locating features on an object using varied illumination.
  24. Longacre, Jr., Andrew, Method for omnidirectional processing of 2D images including recognizable characters.
  25. Longacre, Jr., Andrew, Method for omnidirectional processing of 2D images including recognizable characters.
  26. Fisher, Lance K.; Haugen, Paul R., Method for three-dimensional imaging using multi-phase structured light.
  27. Case, Steven K., Method of validating component feeder exchanges.
  28. Garrepally, Srinivas; ChingTong, Sim; Sowmithri, Channasumudram Krishnamurthy; Dey, Manoj Kumar, Methodology of creating an object database from a Gerber file.
  29. Kranz, David M.; Rudd, Eric P.; Fishbaine, David; Haugan, Carl E., Phase profilometry system with telecentric projector.
  30. Duquette,David W.; Haugen,Paul R.; Fishbaine,David; Gaida,John D.; Madsen,David D.; Dale,Theodore Paul; Liberty,Todd D.; Buchika,Brant O.; Roth,Scott D.; Bushman,Thomas W., Pick and place machine with component placement inspection.
  31. Manickam, Swaminathan; Konicek, John P.; Duquette, David W.; Case, Steven K., Pick and place machine with improved component pick image processing.
  32. Gaida, John D., Pick and place machine with improved component placement inspection.
  33. Bushman, Thomas W.; Madsen, David D.; Haugen, Paul R.; Case, Steven K.; Gaida, John D.; Madsen, M. Hope, Pick and place machine with workpiece motion inspection.
  34. Rudd, Eric P.; Haugan, Carl E., Rapid-firing flashlamp discharge circuit.
  35. Ray,Michael, Solder paste stencil manufacturing system.
  36. Wagman, Adam H., System and method for in-line inspection of stencil aperture blockage.
  37. Murphy, Michael; Schmidt, Eric; Diaz, Aly, System and method for modifying electronic design data.
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