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Polishing pad refurbisher for in situ, real-time conditioning and cleaning of a polishing pad used in chemical-mechanical polishing of microelectronic substrates 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B24B-007/08
출원번호 US-0032230 (1998-02-27)
발명자 / 주소
  • Doan Trung T.
  • Sandhu Gurtej S.
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Seed and Berry LLP
인용정보 피인용 횟수 : 55  인용 특허 : 10

초록

A pad refurbisher that provides in situ, real-time conditioning and/or cleaning of a polishing surface on a polishing pad used in chemical-mechanical polishing of a semiconductor wafer and other microelectronic substrates. The pad refurbisher has a body adapted for attachment to a wafer carrier of a

대표청구항

[ We claim:] [1.] A pad refurbisher for in situ, real-time refurbishing of a polishing surface on a polishing pad used in chemical-mechanical polishing of a semiconductor wafer, comprising:a body adapted for attachment to a wafer carrier of a chemical-mechanical polishing machine with the body havin

이 특허에 인용된 특허 (10)

  1. Shendon Norman ; Bartlett William R., Apparatus and method for conditioning a chemical mechanical polishing pad.
  2. Southwick Scott A., Apparatus and method for refurbishing fixed-abrasive polishing pads used in chemical-mechanical planarization of semicon.
  3. Kreager Douglas P. ; Lee Junedong, Apparatus for conditioning polishing pads.
  4. Appel Andrew T. (Dallas TX) Chisholm Michael F. (Plano TX), Application of semiconductor IC fabrication techniques to the manufacturing of a conditioning head for pad conditioning.
  5. Ploessl Robert, Chemical mechanical polishing pad conditioner.
  6. Chen Lai-Juh,TWX, Chemical-mechanical polish (CMP) pad conditioner.
  7. Renteln Peter Henry (Sunnyvale CA), Methods and apparatus for control of polishing pad conditioning for wafer planarization.
  8. Manfredi Paul Anthony ; Bartley Richard Alan ; Morris Raymond George ; Chamberlin Timothy Scott, Polish pad conditioner with radial compensation.
  9. Hempel ; Jr. Eugene O., Polishing pad conditioning system and method.
  10. Kobayashi Hiroyuki (Omiya JPX) Miyairi Hiroo (Omiya JPX) Endo Osamu (Omiya JPX), Wafer polishing apparatus.

이 특허를 인용한 특허 (55)

  1. Taylor,Theodore M., Apparatus and method for conditioning a polishing pad used for mechanical and/or chemical-mechanical planarization.
  2. Chandrasekaran,Nagasubramaniyan, Apparatus and method for mechanical and/or chemical-mechanical planarization of micro-device workpieces.
  3. Kramer, Stephen J., Apparatus for conditioning chemical-mechanical polishing pads.
  4. Kramer,Stephen J., Apparatus, systems, and methods for conditioning chemical-mechanical polishing pads.
  5. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  6. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  7. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  8. Phillip R. Sommer ; Paul B. Butterfield ; Manoocher Birang, Chemical mechanical planarization system.
  9. Crevasse, Annette M.; Easter, William G.; Maze, John A.; Miceli, Frank, Cleaning brush conditioning apparatus.
  10. Chang Randy (C. H.),TWX, Coaxial dressing for chemical mechanical polishing.
  11. Chang, Randy (C. H.), Coaxial dressing for chemical mechanical polishing.
  12. Cho Sung-bum,KRX ; Choi Baik-soon,KRX ; Kim Jin-sung,KRX ; Choi Kyue-sang,KRX, Conditioner and conditioning disk for a CMP pad, and method of fabricating, reworking, and cleaning conditioning disk.
  13. Sung-bum Cho KR; Baik-soon Choi KR; Jin-sung Kim KR; Kyue-sang Choi KR, Conditioner and conditioning disk for a CMP pad, and method of fabricating, reworking, and cleaning conditioning disk.
  14. Henderson, Gary O., End effectors and methods for manufacturing end effectors with contact elements to condition polishing pads used in polishing micro-device workpieces.
  15. Henderson,Gary O., End effectors and methods for manufacturing end effectors with contact elements to condition polishing pads used in polishing micro-device workpieces.
  16. Osterheld, Thomas H., Grid relief in CMP polishing pad to accurately measure pad wear, pad profile and pad wear profile.
  17. Kramer,Stephen J., Method and apparatus for conditioning a chemical-mechanical polishing pad.
  18. Kramer,Stephen J., Method and apparatus for conditioning a chemical-mechanical polishing pad.
  19. Tobin, James F.; Weise, Greg, Method and apparatus for controlling a pad conditioning process of a chemical-mechanical polishing apparatus.
  20. Chopra, Dinesh; Meikle, Scott G., Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates.
  21. Fukushima,Dai; Minamihaba,Gaku; Yano,Hiroyuki; Kurashima,Nobuyuki; Yamamoto,Susumu, Method for fabricating semiconductor device and polishing method.
  22. Cho, Sung-bum; Choi, Baik-soon; Kim, Jin-sung; Choi, Kyue-sang, Method of cleaning conditioning disk.
  23. Cho, Sung-bum; Choi, Baik-soon; Kim, Jin-sung; Choi, Kyue-sang, Method of reworking a conditioning disk.
  24. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical mechanical planarization of microelectronic substrates.
  25. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  26. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  27. Blalock,Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  28. Chopra, Dinesh; Meikle, Scott G., Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads.
  29. Chopra, Dinesh; Meikle, Scott G., Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads.
  30. Chopra, Dinesh; Meikle, Scott G., Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads.
  31. Chopra, Dinesh; Meikle, Scott G., Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads.
  32. Lu, Jin, Methods and apparatuses for removing polysilicon from semiconductor workpieces.
  33. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  34. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  35. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  36. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  37. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  38. Elledge, Jason B., Methods and systems to detect defects in an end effector for conditioning polishing pads used in polishing micro-device workpieces.
  39. Joslyn, Michael J., Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces.
  40. Joslyn,Michael J., Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces.
  41. Moriyama,Shigeo; Ishida,Yoshihiro; Kugaya,Takashi; Ootsuki,Shigeo; Katagiri,Soichi; Nishimura,Sadayuki; Kawai,Ryosei; Yasui,Kan, Polishing apparatus and method for producing semiconductors using the apparatus.
  42. Stoeckgen, Uwe Gunter; Marxsen, Gerd Franz Christian, Polishing head and apparatus with an improved pad conditioner for chemical mechanical polishing.
  43. Naik, Sujit, Polishing liquids for activating and/or conditioning fixed abrasive polishing pads, and associated systems and methods.
  44. Naik,Sujit, Polishing liquids for activating and/or conditioning fixed abrasive polishing pads, and associated systems and methods.
  45. Dunn,Freddie L., Polishing pad conditioners having abrasives and brush elements, and associated systems and methods.
  46. Khoury Raymond M. ; Merkling ; Jr. Robert M. ; Ocasio Jose M. ; Ziemins Uldis A., Polishing pad reconditioning via polishing pad material as conditioner.
  47. Maruoka, Daisuke; Moroiwa, Koudai, Polishing pad seasoning method, seasoning plate, and semiconductor polishing device.
  48. Hirose,Takenori; Kojima,Hiroyuki; Nomoto,Mineo; Aiuchi,Susumu, Polishing pad surface condition evaluation method and an apparatus thereof and a method of producing a semiconductor device.
  49. Perrin Emmanuel,FRX ; Robert Frederic,FRX ; Banvillet Henri,FRX ; Liauzu Luc,FRX, Process for polishing wafers of integrated circuits.
  50. Kistler, Rod; Gotkis, Yehiel, System and method for controlled polishing and planarization of semiconductor wafers.
  51. Rod Kistler ; Yehiel Gotkis, System and method for controlled polishing and planarization of semiconductor wafers.
  52. Boyd, John M.; Gotkis, Yehiel; Kistler, Rod, System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques.
  53. Boyd, John M.; Gotkis, Yehiel; Kistler, Rod, System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques.
  54. Mayes,Brett A.; Barnhart,Gunnar A.; Meadows,Michael E.; Dringle,Charles K., Systems and methods for actuating end effectors to condition polishing pads used for polishing microfeature workpieces.
  55. Veldman, Robert, Wheel assembly and method for making same.
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