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Environmental test apparatus with partition-isolated thermal chamber 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
출원번호 US-0841216 (1997-04-30)
발명자 / 주소
  • Cochran John
  • Perry Roger L.
출원인 / 주소
  • RPI, Inc.
대리인 / 주소
    Jansson, Shupe, Bridge & Munger, Ltd.
인용정보 피인용 횟수 : 40  인용 특허 : 11

초록

Disclosed is an environmental test apparatus having a thermal chamber for stress testing electronic products. The apparatus has a carrier for supporting the products in the chamber and equipment for monitoring product characteristics during stress testing. The improved apparatus has an auxiliary cha

대표청구항

[ What is claimed is:] [1.] An environmental test apparatus comprising:a plurality of walls forming an enclosure, wherein said enclosure has at least a first compartment and a second compartment therewithin and said first compartment has insulating material at least partially therearound for maintai

이 특허에 인용된 특허 (11)

  1. Cutright Robert A. (Holland MI) Briggs Mark W. (Holland MI) Bouwman George J. (Hamilton MI), Apparatus for use in testing circuit boards.
  2. Gussman Robert L. (Limerick IEX), Automated burn-in system.
  3. Soeno Shigeru (Kawasaki JPX) Oide Hiroshi (Kawasaki JPX), Burn-in apparatus.
  4. Kilpatrick Robert A. (Santa Clara CA) Hefner Sherry M. (San Jose CA), Dual configuration connector port for burn-in systems.
  5. Leach Paul W. (East Orange NJ), Environmental hood for testing printed circuit cards.
  6. Szasz Norbert I. (Fremont CA) Shaw Russell G. (Contoocook NH), Environmental stress screening apparatus for electronic products.
  7. Vanderschaaf Donald (Holland MI), Environmental test chamber.
  8. Tracy ; John M., Probe station.
  9. O\Connor R. Bruce (San Diego CA) Toth Thomas E. (El Cajon CA) Ross James A. (Poway CA), Test station.
  10. Polen William E. (Cincinnati OH) Schlagheck Jerry (West Chester OH), Vibration chamber.
  11. Schwindt Randy J. (Portland OR) Harwood Warren K. (Vancouver WA) Tervo Paul A. (Vancouver WA), Wafer probe station having full guarding.

이 특허를 인용한 특허 (40)

  1. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  2. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  3. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  4. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  5. Martino, Peter, Damping vibrations within storage device testing systems.
  6. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
  7. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  8. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  9. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  10. Co,Ramon S.; Lai,Tat Leung; Sun,David, Efficient air-flow loop through dual burn-in chambers with removable pattern-generator boards for memory-module environmental testing.
  11. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
  12. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
  13. Merrow, Brian S., Enclosed operating area for storage device testing systems.
  14. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
  15. Botruff Dwayne D. ; Langfeldt Gregory J., Environmental test chamber.
  16. Knote, Elizabeth; Koehler, Philip G.; Pereira, Roberto M.; Walker, Wayne, Heat chamber for termination of bed bugs and other arthropods.
  17. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
  18. Lafleur, François; Laville, Frédéric; Thomas, Marc, Modal analysis method and apparatus therefor.
  19. Gray,Jeffrey Ross; Lind,Jeffrey Douglas, Operational verification for product safety testers.
  20. John Cochran ; Roger L. Perry, Product carrier for environmental test system.
  21. Johnson,Edward A., Quick disconnect interface for environmental testing.
  22. Eric D. Berchtold, Refrigeration system with a scroll compressor.
  23. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  24. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  25. Merrow, Brian S., Storage device testing system cooling.
  26. Merrow, Brian S., Storage device testing system cooling.
  27. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
  28. Merrow, Brian S., Temperature control within disk drive testing systems.
  29. Merrow, Brian S., Temperature control within disk drive testing systems.
  30. Merrow, Brian S., Temperature control within storage device testing systems.
  31. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  32. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  33. Liu, Yu-Ching; Su, Po-Lin; Yang, Fu-Chi; Wang, Zhi-Jun; Chen, Shun-Tung; Zhang, Li-Quan; Yang, Wei-Da; Kang, Jie-Peng, Testing apparatus for testing electrical circuit board having electrical connectors thereon.
  34. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
  35. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  36. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  37. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  38. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  39. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  40. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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