초록 ▼

A microcantilever potentiometric sensor utilized for detecting and measuring physical and chemical parameters in a sample of media is described. The microcantilevered spring element includes at least one chemical coating on a coated region, that accumulates a surface charge in response to hydrogen i

A microcantilever potentiometric sensor utilized for detecting and measuring physical and chemical parameters in a sample of media is described. The microcantilevered spring element includes at least one chemical coating on a coated region, that accumulates a surface charge in response to hydrogen ions, redox potential, or ion concentrations in a sample of the media being monitored. The accumulation of surface charge on one surface of the microcantilever, with a differing surface charge on an opposing surface, creates a mechanical stress and a deflection of the spring element. One of a multitude of deflection detection methods may include the use of a laser light source focused on the microcantilever, with a photo-sensitive detector receiving reflected laser impulses. The microcantilevered spring element is approximately 1 to 100 .mu.m long, approximately 1 to 50 .mu.m wide, and approximately 0.3 to 3.0 .mu.m thick. An accuracy of detection of deflections of the cantilever is provided in the range of 0.01 nanometers of deflection. The microcantilever apparatus and a method of detection of parameters require only microliters of a sample to be placed on, or near the spring element surface. The method is extremely sensitive to the detection of the parameters to be measured.

대표청구항 ▼

[ What is claimed is:] [1.] An apparatus for detecting and measuring physical and chemical parameters in a sample of monitored media, comprising:a transducer base;at least one cantilevered spring element secured to said base, said spring element comprising:at least one surface having a coated region

[ What is claimed is:] [1.] An apparatus for detecting and measuring physical and chemical parameters in a sample of monitored media, comprising:a transducer base;at least one cantilevered spring element secured to said base, said spring element comprising:at least one surface having a coated region;at least one chemical attached on said coated region, wherein said at least one chemical accumulates a first surface charge in response to said parameters in said sample, said sample placed on or in close proximity to said coated region; anda second surface on said spring element having a surface charge different than said first surface charge; anda means for measuring a deflection of said spring element due to mechanical stresses established by said surface charge on said surface of said spring element.