$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Vector correlation system for automatically locating patterns in an image 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/66
출원번호 US-0556367 (1995-11-13)
발명자 / 주소
  • Wilson Stephen S.
출원인 / 주소
  • Applied Intelligent Systems, Inc.
대리인 / 주소
    Young & Basile, P.C.
인용정보 피인용 횟수 : 66  인용 특허 : 11

초록

The present invention relates to a combined approach of image and template correlation, and vector correlation wherein edge detection and pattern searching are joined in a single operation to provide great flexibility without requiring extensive computational facilities. A template is devised from a

대표청구항

[ What is claimed is:] [1.] For use in an automatic image processing system, a method for locating a position of an object within an image, the image defined by a plurality of image pixels, each image pixel having a known intensity value and a known coordinate point, comprising the steps of:determin

이 특허에 인용된 특허 (11)

  1. Mori Kazuhiro (Yokohama JPX), Character recognition apparatus.
  2. Sacks Jack (Thousand Oaks CA) Liudzius Valerie A. (Chatsworth CA) DeZotell Gary (Canoga Park CA) DeKlotz Richard E. (Moorpark CA), High speed pattern recognizer.
  3. Deering Michael F. (Mountain View CA), Image correlation system.
  4. Hamashima Muneki (Tokyo JPX) Okita Shinichi (Tokyo JPX), Image processing method and apparatus.
  5. Groezinger John L. (Madison WI), Image recognition edge detection method and system.
  6. Picard Len L. (Wilmington MA) Barber Frederic (Beverly MA), Locating curvilinear objects using feathered fiducials.
  7. Wingfield Perry E. (Tigard OR) Petrick Bruce E. (Lake Oswego OR), Method and apparatus for forming 3×3 pixel arrays and for performing programmable pattern contingent modifications of t.
  8. Takahashi Kozo (Tokyo JPX) Kitamura Toshiaki (Yokohama JPX) Hamashima Muneki (Urayasu JPX), Method and apparatus for pattern matching.
  9. Bernsen Johannes A. C. (Eindhoven NLX) van den Boomgaard Reinier (The Hague NLX), Method of recognizing a pattern in a field having a multi-valent amplitude, and device for performing such a method.
  10. Kobayashi Akira (Osaka JPX) Taira Nobutaka (Hirakata JPX) Ueda Hideshi (Yao JPX), Pattern position recognizing apparatus.
  11. Chatterjee Chanchal (Sterling Heights MI), Rotation and position invariant optical character recognition.

이 특허를 인용한 특허 (66)

  1. Taguchi, Junichi; Ikeda, Mitsuji, Apparatus, method and program product for matching with a template.
  2. Chabreck,Thomas E.; Howells,Samuel C.; Hubbard,John J.; Teitzel,Robin L., Area based optical proximity correction in raster scan printing.
  3. Evans, Frank; Singer, Mark, Automatic separation of subject pixels using segmentation based on multiple planes of measurement data.
  4. Withum, Timothy O.; Kopchik, Kurt P.; Highland, Frederic; Hebbal, Supreeth; Dasch, Summer C.; Graham, Stephanie M., Color form dropout using dynamic geometric solid thresholding.
  5. Kitamura, Tadashi; Ishikawa, Akio, Defect and critical dimension analysis systems and methods for a semiconductor lithographic process.
  6. Hoffberg, Steven M.; Hoffberg-Borghesani, Linda I., Ergonomic man-machine interface incorporating adaptive pattern recognition based control system.
  7. Hoffberg, Steven M.; Hoffberg-Borghesani, Linda Irene, Ergonomic man-machine interface incorporating adaptive pattern recognition based control system.
  8. Siddiqui, Matheen; Davis, Jason, General pose refinement and tracking tool.
  9. Mouttet, Blaise Laurent, Image correlation sensor.
  10. Hiramoto Masao,JPX, Image matching apparatus.
  11. Minami, Mamoru, Image recognition method.
  12. Pearson, Eric; Hansen, Mark R.; Moersfelder, Bradly S.; Noffke, Patrick James; Seymour, John C., Imaging an imprinted substrate on a printing press.
  13. Pearson, Eric; Hansen, Mark R.; Moersfelder, Bradly S.; Noffke, Patrick James; Seymour, John C., Imaging an imprinted substrate on a printing press using an image sensor.
  14. Shniberg,Moti; Nemet,Yaron, Indexing, storage and retrieval of digital images.
  15. Pearson, Eric; Hansen, Mark R.; Moersfelder, Bradly S.; Noffke, Patrick James; Seymour, John C., Inspecting an imprinted substrate on a printing press.
  16. Pearson, Eric; Hansen, Mark R.; Moersfelder, Bradly S.; Noffke, Patrick James; Seymour, John C., Inspection system for inspecting an imprinted substrate on a printing press.
  17. Hoffberg, Steven Mark, Intelligent electronic appliance system and method.
  18. Chang Yian Leng, Locating an image of an object having a concentric profile.
  19. Gielis, Johan, Method and apparatus for creating timewise display of widely variable naturalistic scenery on an amusement device.
  20. Gielis, Johan Leo Alfons, Method and apparatus for synthesizing and analyzing patterns.
  21. Gielis, Johan Leo Alfons, Method and apparatus for synthesizing and analyzing patterns utilizing novel "super-formula" operator.
  22. Klatchko,Asher; Howells,Samuel C.; Ward,Michael A., Method for adjusting edges of grayscale pixel-map images.
  23. Shniberg, Moti; Nemet, Yaron; Sali, Erez, Method for automatic identification and data capture.
  24. Russo, Anthony P., Method for combining fingerprint templates representing various sensed areas of a fingerprint to derive one fingerprint template representing the fingerprint.
  25. Silver, William M.; McGarry, E. John, Method for fast, robust, multi-dimensional pattern recognition.
  26. Silver, William M.; McGarry, E. John; Foster, Nigel J.; Nichani, Sanjay, Method for fast, robust, multi-dimensional pattern recognition.
  27. Silver, William M.; McGarry, E. John; Hill, Matt; Foster, Nigel J.; Foster, Willard, Method for fast, robust, multi-dimensional pattern recognition.
  28. Silver, William M.; McGarry, E. John; Hill, Matt; Foster, Willard, Method for fast, robust, multi-dimensional pattern recognition.
  29. Silver, William M.; McGarry, E. John; Hill, Matt; Foster, Willard; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  30. Silver, William M.; McGarry, E. John; Hill, Matthew L.; Foster, Nigel J.; Nichani, Sanjay; Foster, Willard P.; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  31. Silver, William M.; McGarry, E. John; Hill, Matthew L.; Foster, Nigel J.; Nichani, Sanjay; Foster, Willard P.; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  32. Silver, William M.; McGarry, E. John; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  33. Silver, William M.; McGarry, E. John; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  34. Silver, William M.; McGarry, E. John; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  35. Silver, William M.; McGarry, E. John; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  36. Silver, William M.; McGarry, E. John; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  37. Silver, William M.; McGarry, E. John; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  38. Silver, William M.; Nichani, Sanjay; Wagman, Adam, Method for fast, robust, multi-dimensional pattern recognition.
  39. Wagman, Adam, Method for finding a pattern which may fall partially outside an image.
  40. Davis, Jason; Koljonen, Juha, Method for partitioning a pattern into optimized sub-patterns.
  41. Davis, Jason, Methods for finding and characterizing a deformed pattern in an image.
  42. Beauchaine, Robert J.; Chabreck, Thomas E.; Howells, Samuel C.; Hubbard, John J.; Klatchko, Asher; Pirogovsky, Peter; Teitzel, Robin L., Optical proximity correction in raster scan printing based on corner matching templates.
  43. Klatchko,Asher; Pirogovsky,Peter Y., Optical proximity correction in raster scan printing based on grayscale manipulation of the bitmap.
  44. Kitamura, Tadashi; Hasebe, Toshiaki; Tsuneoka, Masatoshi, Pattern inspection apparatus and method.
  45. Kitamura, Tadashi; Hasebe, Toshiaki; Tsuneoka, Masotoshi, Pattern inspection apparatus and method.
  46. Kitamura, Tadashi; Hasebe, Toshiaki; Tsuneoka, Masotoshi, Pattern inspection apparatus and method.
  47. Kitamura, Tadashi; Kubota, Kazufumi; Nakazawa, Shinichi; Vohra, Neeti; Yamamoto, Masahiro, Pattern inspection apparatus and method.
  48. Kitamura, Tadashi; Kubota, Kazufumi; Nakazawa, Shinichi; Vohra, Neeti; Yamamoto, Masahiro; Hasebe, Toshiaki, Pattern inspection apparatus and method.
  49. Kitamura, Tadashi; Kubota, Kazufumi; Nakazawa, Shinichi; Vohra, Neeti; Yamamoto, Masahiro; Hasebe, Toshiaki, Pattern inspection apparatus and method.
  50. Yamamoto, Masahiro; Kitamura, Tadashi, Pattern inspection apparatus, pattern inspection method, and recording medium.
  51. Wilson, Stephen S., Pattern recognition using multiple templates.
  52. Nakazawa, Masamoto, Photoelectric transducer, image reading device, image forming apparatus, and image reading method.
  53. Takai Kensuke,JPX, Positioning device.
  54. Dougherty,Edward R.; Kim,Seungchan; Bittner,Michael L.; Chen,Yidong, Quantifying gene relatedness via nonlinear prediction of gene.
  55. Lake,Adam T.; Marshall,Carl S.; Blackstein,Marc S.; Johnston,Daniel, Real-time digital three dimensional engraving.
  56. Barker, Simon; Michael, David J., Semi-supervised method for training multiple pattern recognition and registration tool models.
  57. Barker, Simon; Michael, David J., Semi-supervised method for training multiple pattern recognition and registration tool models.
  58. Kitamura, Tadashi; Ishikawa, Akio, System and method for a semiconductor lithographic process control using statistical information in defect identification.
  59. Zadeh, Ali Moghaddam, System and method for detecting flaws in objects using machine vision.
  60. Steger,Carstan, System and method for object recognition.
  61. Goede,Patricia Anne; Lauman,Jason R.; Cochella,Christopher, System and method for visual annotation and knowledge representation.
  62. Shniberg,Moti; Nemet,Yaron; Sali,Erez, System and methodology for tracking objects using visually sensible indicators.
  63. Freeman, James F.; Williams, Roy E., System to automatically detect eye corneal striae.
  64. Dobyns Kenneth P., Technique for displaying enveloped waveform.
  65. Stephen S. Wilson, Vector correlation system for automatically locating patterns in an image.
  66. Pearson,Eric; Hansen,Mark R.; Moersfelder,Bradly S.; Noffke,Patrick James; Seymour,John C., Web inspection module including contact image sensors.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로