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Drying treatment method and apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F26B-003/00
출원번호 US-0156751 (1998-09-16)
우선권정보 JP-0269214 (1997-09-17)
발명자 / 주소
  • Kamikawa Yuji,JPX
  • Minami Teruomi,JPX
  • Kitahara Shigenori,JPX
출원인 / 주소
  • Tokyo Electron Limited, JPX
대리인 / 주소
    Graham & James LLP
인용정보 피인용 횟수 : 56  인용 특허 : 3

초록

A drying treatment apparatus for drying cleaned semiconductor wafers comprises drying gas producing means (41) connected to a drying treating unit (30) through a drying gas supplying pipe line (32). A flowrate controlling diaphragm pump (50) is provided in an isopropyl alcohol (IPA) supplying pipe l

대표청구항

[ What is claimed is:] [1.] A drying treatment method comprising the steps of:supplying a solvent at a controlled flowrate:supplying an inert gas at a controlled flowrate:mixing and heating said solvent and said inert gas to produce a drying gas having a solvent concentration in a range of three per

이 특허에 인용된 특허 (3)

  1. Nam Chang-Hyun,KRX ; Ko Yong-Sun,KRX, Apparatus for drying semiconductor wafers using isopropyl alcohol.
  2. Mohindra Raj (Los Altos Hills CA) Bhushan Abhay (Palo Alto CA) Bhushan Rajiv (Mountain View CA) Puri Suraj (Los Altos CA) Anderson John H. (Milpitas CA) Nowell Jeffrey (San Francisco CA), Method for cleaning and drying a semiconductor wafer.
  3. Roberson ; Jr. Glenn A. (Hollister CA) Eglinton Robert B. (Montery CA), Vapor device and method for drying articles such as semiconductor wafers with substances such as isopropyl alcohol.

이 특허를 인용한 특허 (56)

  1. Kweon, Hyug Jin; Son, Hae Joon, Apparatus and method for deaerating liquid crystal.
  2. Asada Kazumi,JPX ; Iwamoto Hayato,JPX ; Minami Teruomi,JPX, Apparatus and method for drying semiconductor substrate.
  3. Yokomizo,Kenji, Apparatus and method of securing a workpiece during high-pressure processing.
  4. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of a workpiece.
  5. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of multiple workpieces.
  6. Jones,William Dale, Control of fluid flow in the processing of an object with a fluid.
  7. Raaijmakers Ivo ; Marohl Dan, Degassing method using simultaneous dry gas flux pressure and vacuum.
  8. Jahanbani, Mohamad; Ruemmelin, Stefan; Hoyer, Ronald, Device for performing surface treatment on semiconductor wafers.
  9. Classen, Egbert; Rosenbauer, Michael; Steck, Wolfgang; Stickel, Martin, Drying method for a household appliance and household appliance for carrying the drying method.
  10. Sheydayi,Alexei; Sutton,Thomas, Gate valve for plus-atmospheric pressure semiconductor process vessels.
  11. Aoki, Shigeki; Sakai, Yuichi; Yamashita, Mitsuo; Shinya, Hiroshi, Heat processing apparatus and heat processing method.
  12. Aoki, Shigeki; Sakai, Yuichi; Yamashita, Mitsuo; Shinya, Hiroshi, Heat processing apparatus and heat processing method.
  13. Sutton, Thomas R.; Biberger, Maximilan A., High pressure compatible vacuum chuck for semiconductor wafer including lift mechanism.
  14. Jones, William D., High pressure fourier transform infrared cell.
  15. Biberger, Maximilian A.; Layman, Frederick Paul; Sutton, Thomas Robert, High pressure processing chamber for semiconductor substrate.
  16. Biberger,Maximilian A.; Layman,Frederick Paul; Sutton,Thomas Robert, High pressure processing chamber for semiconductor substrate.
  17. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  18. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  19. Tseronis, James A.; Mortiz, Heiko D.; Chandra, Mohan; Farmer, Robert B.; Jafri, Ijaz H.; Talbott, Jonathan, Inverted pressure vessel with horizontal through loading.
  20. Robert B Farmer ; Jonathan A. Talbott ; Mohan Chandra ; James A. Tseronis ; Heiko D. Moritz, Inverted pressure vessel with shielded closure mechanism.
  21. Sheydayi,Alexei, Method and apparatus for clamping a substrate in a high pressure processing system.
  22. Goshi,Gentaro, Method and apparatus for cooling motor bearings of a high pressure pump.
  23. Peng, Fu-Sheng, Method and apparatus for drying semiconductor wafers.
  24. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method and apparatus for supercritical processing of multiple workpieces.
  25. Dinh, Thuc M.; Ma, Yamin; Liu, Benjamin Y. H., Method and apparatus for vapor generation and wafer cleaning.
  26. Parent,Wayne M.; Goshi,Gentaro, Method and system for cooling a pump.
  27. Parent,Wayne M., Method and system for determining flow conditions in a high pressure processing system.
  28. Parent, Wayne M.; Geshell, Dan R., Method and system for passivating a processing chamber.
  29. Hansen,Brandon; Lowe,Marie, Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid.
  30. Kawamura,Kohei; Asano,Akira; Miyatani,Koutarou; Hillman,Joseph T.; Palmer,Bentley, Method for supercritical carbon dioxide processing of fluoro-carbon films.
  31. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method for supercritical processing of multiple workpieces.
  32. Jae-Hyung Jung KR, Method of and apparatus for drying a wafer using isopropyl alcohol.
  33. Biberger,Maximilian Albert; Layman,Frederick Paul; Sutton,Thomas Robert, Method of supercritical processing of a workpiece.
  34. Sheydayi,Alexei, Non-contact shuttle valve for flow diversion in high pressure systems.
  35. Sheydayi,Alexei, Pressure energized pressure vessel opening and closing device and method of providing therefor.
  36. Hans-Jurgen Kruwinus AT, Process and device for drying disk-like objects.
  37. Wuester,Christopher D., Process flow thermocouple.
  38. Berman, Allan, Processing tank with improved quick dump valve.
  39. Wang, Song; Wan, Jiyu; Feng, He; Wu, Hongjiang, Reduced pressure drying method and device of a substrate.
  40. Mullee, William H., Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process.
  41. Yang, Jen-Yuan, Substrate drying system.
  42. Kawamoto, Tomokazu, Substrate processing apparatus, substrate processing method, and method of manufacturing semiconductor device.
  43. Kawamoto, Tomokazu, Substrate processing method, and method of manufacturing semiconductor device.
  44. Nishimura, Hideki; Nakashima, Mikio, Substrate processing method, and program storage medium therefor.
  45. Nishimura, Hideki; Nakashima, Mikio, Substrate processing method, substrate processing apparatus, and program storage medium.
  46. Heiko D Moritz ; Jonathan A. Talbott ; Mohan Chandra ; James A. Tseronis ; Ijaz Jafri, Supercritical fluid drying system and method of use.
  47. Gale,Glenn; Hillman,Joseph T.; Jacobson,Gunilla; Palmer,Bentley, System and method for processing a substrate using supercritical carbon dioxide processing.
  48. Gallagher, Emily F.; Kindt, Louis M., System and method for storing and transporting photomasks in fluid.
  49. Chen, Chaoyuan; Galluzi, George; Cho, John, Temperature dependent pull speeds for drying of a wet cleaned workpiece.
  50. Jacobson,Gunilla; Yellowaga,Deborah, Treatment of a dielectric layer using supercritical CO.
  51. Kevwitch, Robert, Treatment of substrate using functionalizing agent in supercritical carbon dioxide.
  52. Sheydayi,Alexei, Vacuum chuck utilizing sintered material and method of providing thereof.
  53. Kamikawa, Yuji; Kobayashi, Kazuhiko; Kuroda, Nobutaka; Nakashima, Mikio; Tsuda, Osamu, Vapor drying method, apparatus and recording medium for use in the method.
  54. Elsawy Tamer ; Hall R. Mark ; Butler Josh, Vapor drying system and method.
  55. Kim, Tae-Ho; Hong, Dong-Kwan; Kang, Nung-Suck, Wafer drying apparatus.
  56. Lee, Keum-Joo, Wafer spin drying apparatus with a plurality of supply nozzles and methods for using the same.
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