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Method for controlled cleaving process 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/22
  • H01L-021/38
출원번호 US-0370975 (1999-08-10)
발명자 / 주소
  • Henley Francois J.
  • Cheung Nathan W.
출원인 / 주소
  • Silicon Genesis Corporation
대리인 / 주소
    Townsend and Townsend and Crew LLP
인용정보 피인용 횟수 : 202  인용 특허 : 1

초록

A technique for forming a film of material (12) from a donor substrate (10). The technique has a step of forming a stressed region in a selected manner at a selected depth (20) underneath the surface. An energy source such as pressurized fluid is directed to a selected region of the donor substrate

대표청구항

[ What is claimed is:] [1.] A process for forming a film of material from substrates, said process comprising:forming a stressed region at a selected depth underneath a surface of a substrate, said stressed region at said selected depth to define a substrate material to be removed above said selecte

이 특허에 인용된 특허 (1)

  1. Bruel Michel (Veurey FRX), Process for the production of thin semiconductor material films.

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