초록 ▼

A process for compensating for an incorrect operation of measuring devices fitted with a programming section caused by external influences. The measuring devices and a sensor responding to the influence are fitted in a chamber exposed to the influencing factor. When the influencing factor changes, m

A process for compensating for an incorrect operation of measuring devices fitted with a programming section caused by external influences. The measuring devices and a sensor responding to the influence are fitted in a chamber exposed to the influencing factor. When the influencing factor changes, measurements from the measuring device and the sensor are detected by a data processing system which provides the programming section of the measuring devices with signals compensating for the incorrect operation caused by the influencing factor. To perform such a process rapidly and thus economically, the influencing factor is continuously changed and the current output value of the sensor and the current measurement provided by the measuring device are detected with a timing predetermined by the data processing system.

대표청구항 ▼

[ What is claimed is:] [1.] A process for compensating for an incorrect operation of a measuring device caused by temperature changes in the measuring device, the measuring device including a programming section, the process comprising the steps of:(a) providing the measuring device in a chamber, th

[ What is claimed is:] [1.] A process for compensating for an incorrect operation of a measuring device caused by temperature changes in the measuring device, the measuring device including a programming section, the process comprising the steps of:(a) providing the measuring device in a chamber, the measuring device including an actual measuring section, the measuring device providing at least one measurand value;(b) providing a temperature sensor in the chamber immediately adjacent to the actual measuring section, the temperature sensor providing at least one output value;(c) coupling the programming section and the at least one temperature sensor to a data processing system, the data processing system processing the at least one measurand value;(d) providing a measured quantity to the measuring device;(e) after step (d), gradually and continuously changing a temperature in the chamber at a constant rate of rise;(f) while performing step (e), detecting the at least one output value and the at least one measurand value, the detecting step being performed at a predetermined frequency, the predetermined frequency being predetermined by the data processing system; and(g) providing, by the data processing system, at least one compensating signal to the programming section, the at least one compensating signal compensating for the incorrect operation of the measuring device as a function of the at least one output value.