$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for simulating and optimizing a plant model 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05B-013/04
  • G05B-013/02
  • G05B-017/02
출원번호 US-0997056 (1997-10-01)
발명자 / 주소
  • Boston Joseph F.
  • Boys Ian,GBX
출원인 / 주소
  • Aspen Technology, Inc.
대리인 / 주소
    Hamilton, Brook, Smith & Reynolds, P.C.
인용정보 피인용 횟수 : 103  인용 특허 : 8

초록

The present invention is directed to a method for simulating and optimizing a plant model. The plant model having a multiplicity of equipment models for a desired processing plant and a multiplicity of local property models for the material components within the plant includes providing a set of ini

대표청구항

[ We claim:] [1.] In a digital processor, a method for simulating and optimizing a plant model, the plant model having a multiplicity of equipment models for a desired processing plant and a multiplicity of local property models for the material components within the plant, comprising the steps of:a

이 특허에 인용된 특허 (8)

  1. Manthey Michael (Myrdalstraede 273 9220 Aalborg 0 DKX), Artificial intelligence system.
  2. Shapiro Robert M. (Cambridge MA) Malhotra Jawahar (Waltham MA) Jensen Kurt (Hojbjerg DKX) Christensen Soren (Arhus MA DKX) Huber Peter (Cambridge MA), Computer-aided generation of programs modelling complex systems using colored petri nets.
  3. Khan Emdadur R. (San Jose CA), Intelligent controller with neural network and reinforcement learning.
  4. Carrette George J. (Concord MA) Clancy James E. (Chelmsford MA) Fossheim Gregory H. (Hollis NH), Method and apparatus for real-time control.
  5. Leeke Steven D., Method of simultaneous simulation of a complex system having system objects, parameter objects, state objects, and simul.
  6. Farag Samir F. (Roswell GA), Motor controller with instantaneous trip protection.
  7. Britt Herbert I. (Cambridge MA) Joshi Amol P. (Marlboro MA) Mahalec Vladimir (Sudbury MA) Piela Peter C. (Brighton MA) Venkataraman Swaminathan (Waltham MA), Plant simulation and optimization software apparatus and method using dual execution models.
  8. Lohman Guy M. (San Jose CA) Ono Kiyoshi (Yokohama CA JPX) Palmer John D. (San Jose CA), System for adapting query optimization effort to expected execution time.

이 특허를 인용한 특허 (103)

  1. Miller, John Philip, Abnormal situation prevention in a heat exchanger.
  2. Eryurek,Evren; Kavaklioglu,Kadir; Miller,John P., Abnormal situation prevention in a process plant.
  3. Paik,Young J., Adjusting manufacturing process control parameter using updated process threshold derived from uncontrollable error.
  4. Kavaklioglu,Kadir; Dillon,Steven R.; Rome,Gregory H.; Westbrock,Jon, Aggregation of asset use indices within a process plant.
  5. Eryurek, Evren; Harris, Stuart; Hokeness, Scott N.; Reeves, Todd W.; Garvey, III, Raymond E., Asset optimization reporting in a process plant.
  6. Eryurek, Evren; Harris, Stuart; Hokeness, Scott Nels; Reeves, Todd; Garvey, III, Raymond E., Asset optimization reporting in a process plant.
  7. Yedatore, Manjunath; Bhatia, Deepak; Prescott, John, Automated corrective and predictive maintenance system.
  8. Schwarm,Alexander T., Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools.
  9. Eryurek, Evren; Harris, Stuart; Marschall, Lester (David); Hokeness, Scott Nels, Automatic work order/parts order generation and tracking.
  10. Eryurek, Evren, Cavitation detection in a process plant.
  11. Arackaparambil,John F.; Chi,Tom; Chow,Billy; D'Souza,Patrick M.; Hawkins,Parris; Huang,Charles; Jensen,Jett; Krishnamurthy,Badri N.; Kulkarni,Pradeep M.; Kulkarni,Prakash M.; Lin,Wen Fong; Mohan,Shan, Computer integrated manufacturing techniques.
  12. Arackaparambil,John F.; Chi,Tom; Chow,Billy; D'Souza,Patrick M.; Hawkins,Parris; Huang,Charles; Jensen,Jett; Krishnamurthy,Badri N.; Kulkarni,Pradeep M.; Kulkarni,Prakash M.; Lin,Wen Fong; Mohan,Shan, Computer integrated manufacturing techniques.
  13. Eryurek, Evren; Kavaklioglu, Kadir; Miller, John P., Configuration system and method for abnormal situation prevention in a process plant.
  14. Paik, Young Joseph, Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life.
  15. Paik,Young Joseph, Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life.
  16. Eryurek, Evren; Schleiss, Trevor D., Creation and display of indices within a process plant.
  17. Eryurek,Evren; Schleiss,Trevor D., Creation and display of indices within a process plant.
  18. Eryurek,Evren; Kavaklioglu,Kadir; Miller,John P., Data presentation system for abnormal situation prevention in a process plant.
  19. Eryurek,Evren; Schleiss,Trevor D.; Harris,Stuart, Data sharing in a process plant.
  20. Eryurek,Evren; Harris,Stuart; Hokeness,Scott N., Data visualization within an integrated asset data system for a process plant.
  21. Romatier, Christophe; Huang, Richard; Klecka, Ronald; Anderson, Bryan, Database user interfaces with flowsheets of a simulation system.
  22. Dillon,Steven R., Delivery of process plant notifications.
  23. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T., Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing.
  24. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T., Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing.
  25. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T., Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing.
  26. Paik, Young Jeen, Dynamic offset and feedback threshold.
  27. Boys, Ian H., Dynamic simulation of fluid filled vessels.
  28. Chi, Yueh-Shian; Hawkins, Parris C M; Huang, Charles Q., Dynamic subject information generation in message services of distributed object systems.
  29. Chi,Yueh shian T.; Hawkins,Parris C. M.; Huang,Charles Q., Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility.
  30. Keyes, IV, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.
  31. Keyes, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.
  32. Davari, Bijan; Williams, Scott Terrell; Pechtl, Peter Anton; McDonald, Larry Keith; Ong'iro, Alfred, Energy system modeling apparatus and methods.
  33. Eryurek, Evren; Ramachandran, Ram; Scott, Cindy Alsup; Schleiss, Trevor Duncan, Enhanced fieldbus device alerts in a process control system.
  34. Eryurek, Evren; Westbrock, Jon Dale; Llewellyn, Craig Thomas, Enhanced hart device alerts in a process control system.
  35. Krishnamurthy,Badri N.; Hawkins,Parris C. M., Experiment management system, method and medium.
  36. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T.; Prabhu, Gopalakrishna B., Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles.
  37. Shanmugasundram,Arulkumar P.; Schwarm,Alexander T.; Prabhu,Gopalakrishna B., Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles.
  38. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T.; Iliopoulos, Ilias; Parkhomovsky, Alexander; Seamons, Martin J., Feedback control of plasma-enhanced chemical vapor deposition processes.
  39. Paik,Young Joseph, Feedforward and feedback control for conditioning of chemical mechanical polishing pad.
  40. Eryurek, Evren; Dewar, Ian Bryce, Fiducial technique for estimating and using degradation levels in a process plant.
  41. Miller, John Philip, Field device with capability of calculating digital filter coefficients.
  42. Majumdar, Alok Kumar; Bailey, John W.; Schallhorn, Paul Alan; Steadman, Todd E., Generalized fluid system simulation program.
  43. Reeves, Todd; Hilemon, Christopher; Walton, Keith, Generation of data indicative of machine operational condition.
  44. Miller, John Philip, Heat exchanger fouling detection.
  45. Eryurek, Evren; Llewellyn, Craig Thomas; Marschall, Lester David; Westbrock, Jon D.; Harris, Stuart A.; Hokeness, Scott N., Integrated alert generation in a process plant.
  46. Eryurek, Evren; Krouth, Terrance F.; Lansing, Jane E., Integrated configuration system for use in a process plant.
  47. Eryurek, Evren; Harris, Stuart Andrew; Hokeness, Scott Nels; Marschall, Lester David, Integrated device alerts in a process control system.
  48. Eryurek, Evren; Hokeness, Scott N.; Harris, Stuart; Dillon, Steven; Rome, Greg; Westbrock, Jon; Kavaklioglu, Kadir, Integrated navigational tree importation and generation in a process plant.
  49. Shanmugasundram,Arulkumar P.; Schwarm,Alexander T., Integrating tool, module, and fab level control.
  50. Reiss,Terry P.; Shanmugasundram,Arulkumar P.; Schwarm,Alexander T., Integration of fault detection with run-to-run control.
  51. Kephart, Richard W.; Sanchez, Herman; Abruzere, Eugene, Method and apparatus for deploying industrial plant simulators using cloud computing technologies.
  52. Armstrong, Steve; Hokeness, Scott N.; Di Giovanni, Augustine, Method and apparatus for monitoring and performing corrective measures in a process plant using monitoring data with corrective measures data.
  53. Nixon,Mark J.; Keyes, IV,Marion A.; Schleiss,Trevor D.; Gudaz,John A.; Blevins,Terrence L., Method and apparatus for performing a function in a plant using process performance monitoring with process equipment monitoring and control.
  54. Armstrong, Stephen; Hokeness, Scott N.; Di Giovanni, Augustine, Method and apparatus for performing a function in a process plant using monitoring data with criticality evaluation data.
  55. Opheim,Greg; Sigtermans,Walt; Wilson,Sean, Method and apparatus for providing help information in multiple formats.
  56. Chan,Jeffrey; Reinker,John Karl; Sharma,Suresh, Method and system for analyzing performance of a turbine.
  57. Miller, John P., Method and system for detecting abnormal operation of a level regulatory control loop.
  58. Scott,Cindy; Havekost,Robert; Reeves,Todd, Method and system for integrated alarms in a process control system.
  59. Miller, John Philip, Method and system for modeling a process variable in a process plant.
  60. Dobrowski, Patrick M.; Hokeness, Scott N.; Middendorf, Fred G., Method for launching applications.
  61. Schwarm,Alexander T.; Shanmugasundram,Arulkumar P.; Pan,Rong; Hernandez,Manuel; Mohammad,Amna, Method of feedback control of sub-atmospheric chemical vapor deposition processes.
  62. Spiegelman,Jeffrey J., Method of identifying fluid purification equipment which is optimized for individual fluid purification systems.
  63. Kokotov,Yuri; Entin,Efim; Seror,Jacques; Fisher,Yossi; Sarel,Shalomo; Shanmugasundram,Arulkumar P.; Schwarm,Alexander T.; Paik,Young Jeen, Method, system and medium for controlling manufacture process having multivariate input parameters.
  64. Al Bayati,Amir; Adibi,Babak; Foad,Majeed; Somekh,Sasson, Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements.
  65. Shanmugasundram,Arulkumar P.; Armer,Helen; Schwarm,Alexander T., Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities.
  66. Schwarm,Alexander T.; Shanmugasundram,Arulkumar P.; Seror,Jacques; Kokotov,Yuri; Entin,Efim, Method, system, and medium for handling misrepresentative metrology data within an advanced process control system.
  67. Dobrowski,Pat; Wilson,Sean; Hong,Nghy; Snyder,Eric, Methods and apparatus for importing device data into a database system used in a process plant.
  68. Miller, John P.; Kant, Ravi, Methods and systems for detecting deviation of a process variable from expected values.
  69. Miller, John P.; Kant, Ravi, Methods and systems for detecting deviation of a process variable from expected values.
  70. Menter,Patrick W.; Toeppe,Steven M., Model simulation and calibration.
  71. Miller, John P., Modeling a process using a composite model comprising a plurality of regression models.
  72. Stone, Terry Wayne; Nolen, James S., Multi-component multi-phase fluid analysis using flash method.
  73. Lundeberg, Marcus R.; Samardzija, Nikola; Miller, John P., Multivariate monitoring and diagnostics of process variable data.
  74. Samardzija, Nikola; Miller, John Philip, On-line monitoring and diagnostics of a process using multivariate statistical analysis.
  75. Samardzija, Nikola; Miller, John Philip, On-line multivariate analysis in a distributed process control system.
  76. Dillon, Steven R.; Rome, Gregory H., Personalized plant asset data representation and search system.
  77. Paik,Young J., Process control by distinguishing a white noise component of a process variance.
  78. Paik,Young Jeen, Process control by distinguishing a white noise component of a process variance.
  79. Strain, Cathal J.; Lalonde, Adam; Kimball, Richard W.; Rajab, Majdi, Process design and management system.
  80. Eryurek, Evren; Smith, Ross Stephen; Dewar, Ian Bryce; Raynor, Stuart Brian; Minto, Jeffrey Alan, Remote analysis of process control plant data.
  81. Padhi,Deenesh; Gandikota,Srinivas; Naik,Mehul; Parikh,Suketu A.; Dixit,Girish A., Selective metal encapsulation schemes.
  82. Keyes, Marion A.; Deshmukh, Rahul; Cacciatore, Gary G.; Staphanos, Stephen J.; Kennedy, James Patrick, Shared-use data processing for process control systems.
  83. Miller, John P., Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.
  84. Miller, John Philip, Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.
  85. Balentine, James R.; Dicaire, Andre A.; Scott, Cindy A.; Lattimer, Donald Robert; Schibler, Kenneth; Shepard, John R.; Jundt, Larry O., Software lockout coordination between a process control system and an asset management system.
  86. Miller, John P.; Lundeberg, Marcus R., Statistical signatures used with multivariate analysis for steady-state detection in a process.
  87. Selway,James Walker, System and method for controlling a design process by specifying active variables and passive variables.
  88. Heavner, III, Louis W.; Sharpe, Jr., Joseph H.; Eryurek, Evren; Kavaklioglu, Kadir, System and method for detecting an abnormal situation associated with a heater.
  89. Sharpe, Jr., Joseph H., System and method for detecting an abnormal situation associated with a process gain of a control loop.
  90. Ford, Jr.,Ferrill E.; Eryurek,Evren, System and method for detecting an abnormal situation associated with a reactor.
  91. Hess, Todd M.; Richards, Martyn Glenn; Kroll, Andreas, System and method for dynamic modeling, parameter estimation and optimization for processes having operating targets.
  92. Van Peursem, David J.; Xu, Gang, System and method for efficient computation of simulated thermodynamic property and phase equilibrium characteristics using comprehensive local property models.
  93. Van Peursem, David J.; Xu, Gang, System and method for efficient computation of simulated thermodynamic property and phase equilibrium characteristics using comprehensive local property models.
  94. Noble,Robert G.; Laing,Douglas M.; McBrien,Andrew; Ward,Peter, System and method for organizing and sharing of process plant design and operations data.
  95. Farrah, Timothy Francis; Filmer, Peter John; Hamilton, Fiona Elizabet; Nihill, Mark Francis; Selway, James Walker; Shaw, Ernest Yuet Ning; Van Den Hout, Frederick Walter, System and method for specifying elements in a packaging process.
  96. Adelman, Stephen Thomas; Gay, Rodney Reves, System for evaluating performance of a combined-cycle power plant.
  97. Eryurek, Evren; Westbrock, Jon, System for preserving and displaying process control data associated with an abnormal situation.
  98. Schwarm,Alexander T., System, method, and medium for monitoring performance of an advanced process control system.
  99. Surana,Rahul; Zutshi,Ajoy, Technique for process-qualifying a semiconductor manufacturing tool using metrology data.
  100. Schleiss,Trevor D.; Nixon,Mark J.; Peterson,Neil J.; Felts,Christopher; Wilson,Grant, Transactional data communications for process control systems.
  101. Romatier, Christophe; Huang, Richard; Klecka, Ronald, Utilizing spreadsheet user interfaces with flowsheets of a CPI simulation system.
  102. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.
  103. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로