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Visual inspection system of moving strip edges using cameras and a computer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
출원번호 US-0927301 (1997-09-11)
발명자 / 주소
  • Kirby George J.
  • Ewing Jon F.
  • Borgeson Arthur B.
출원인 / 주소
  • The Gillette Company
대리인 / 주소
    Fish & Richardson P.C.
인용정보 피인용 횟수 : 30  인용 특허 : 21

초록

A continuous edge of a strip of material is processed as it moves in a direction along the length of the strip. The condition of the continuous edge of the moving strip is inspected after it has been processed. The strip is cut into pieces. And the pieces are sorted into groups in response to the co

대표청구항

[ What is claimed is:] [1.] A visualization system for razor blade manufacturing comprisingan inspector that detects defects in the edge of a moving strip of razor blade material moving along a path, said inspector being located at a first, upstream position along said path, said inspector generatin

이 특허에 인용된 특허 (21)

  1. Surka Ebun A. (Spartanburg SC), Apparatus and method for detecting defects in a moving web.
  2. Dreiling Mark J. (Bartlesville OK) Wood-Black Frankie K. (Bartlesville OK) Moczygemba George A. (Bartlesville OK), Apparatus and process for detecting the presence of defects on a moving sheet of material.
  3. McGarvey Kenneth J. (Medford OR), Center shot sorting system and method.
  4. Raker Mark L. (Clemmons NC) Cook William R. (Clemmons NC) Wilson Donna J. (Winston-Salem NC), Cigarette.
  5. Hagmann Karl (Emmenbrcke CHX), Device for photo-electrically monitoring a moving yarn using two sensor heads.
  6. Itaya Hisao (Kyoto JPX) Okada Toshihiko (Kyoto JPX) Hata Morishige (Kyoto JPX) Koike Shunji (Kyoto JPX) Onishi Takahiro (Kyoto JPX), Fabric inspecting method and appartus for detecting flaws.
  7. Lozar Boris (Milan ITX), High resolution electronic automatic imaging and inspecting system.
  8. Roberts James W. (Guelph DE CAX) Elias John G. (Wilmington DE) Jullien Graham A. (Tecumseh CAX), High speed defect detection apparatus having defect detection circuits mounted in the camera housing.
  9. Howey Robert E. (1217 Kukila St. Honolulu HI 96818), Industrial process for the production of glass razor blades.
  10. Henry James W. (Kingsport TN), Inspection of elongated material.
  11. Merlen Monty M. (Stamford CT) Slaker Frank A. (Norwalk CT), Method and apparatus for a web edge tracking flaw detection system.
  12. El-Sarout Mohamad (Villeneuve D\Ascq FRX), Method and apparatus for detecting and for counting any instantaneous variations in a profile, and applications thereof.
  13. Whitman ; III Hobart A. (Asheville NC), Method and apparatus for detecting web discontinuities.
  14. Hyslop David M. (Spartanburg SC), Method and apparatus for entering coordinates into a computer.
  15. Randall Malcolm W. (Milton-Freewater OR), Optical inspection apparatus for moving articles.
  16. White Kenneth W. (Lewisville NC) McConnell Bain C. (Winston-Salem NC) Henderson Calvin W. (Winston-Salem NC) Clark Shannun W. (Lewisville NC) Collett William R. (Winston-Salem NC) deMey ; III. Charle, Package inspection system.
  17. O\Connor Donald T. (Barrington Hills IL) Lorenzi Donald E. (Des Plaines IL) Flaherty John J. (Elk Grove Village IL) Schaefer Edward (Bellwood IL), Pipeline inspection apparatus.
  18. Ferriere Dominique (St Germain en Laye FRX) Giraudy Bernard (Taverny FRX), Process and equipment for sensing surface defects on a moving strip.
  19. Hurley Daniel T. (San Ramon CA) Chiang Ching-Lang (San Jose CA) Khurana Neeraj (Monte Sereno CA), Transportable image emission microscope.
  20. Dittmann Randall L. (Duluth MN) Petersen Scott B. (Proctor MN) Bundschuh William L. (Duluth MN), Web defect continuous surveillance system.
  21. Puffer Leroy G. (Vernon CT) Erf Robert K. (Glastonbury CT), Wire surface monitor.

이 특허를 인용한 특허 (30)

  1. Gagnon, Richard; Sanschagrin, Gaétan; Lépine, Denis, Camera enclosure assembly.
  2. Mahuna, Tyson, Configurable image trigger for a vision system and method for using the same.
  3. Hamelin,Michel; Masek,William; Depuydt,Joseph A., Crack detection in razor blades.
  4. Lin, Chin-Lin, Dynamic imaging system.
  5. Lépine, Denis, Enclosure for an optical inspection apparatus.
  6. Silver, William M.; Phillips, Brian S., Human machine-interface and method for manipulating data in a machine vision system.
  7. Tremblay, Robert J.; Philips, Brian S.; Keating, John F.; Eames, Andrew; Whitman, Steven; Mirtich, Brian V.; Arbogast, Jr., Carroll McNeil, Human-machine-interface and method for manipulating data in a machine vision system.
  8. Tremblay, Robert; Phillips, Brian; Keating, John; Eames, Andrew; Whitman, Steven M.; Mirtich, Brian; Arbogast, Jr., Carroll McNeill, Human-machine-interface and method for manipulating data in a machine vision system.
  9. Silver, William M., Method and apparatus for automatic visual event detection.
  10. Silver, William M.; Phillips, Brian S., Method and apparatus for automatic visual event detection.
  11. Silver, William M.; Phillips, Brian S., Method and apparatus for automatic visual event detection.
  12. Eames, Andrew; Mirtich, Brian V.; Silver, William M, Method and apparatus for configuring and testing a machine vision detector.
  13. Eames, Andrew; Mirtich, Brian; Silver, William, Method and apparatus for configuring and testing a machine vision detector.
  14. Silver, William M, Method and apparatus for detecting and characterizing an object.
  15. Silver, William M., Method and apparatus for locating objects.
  16. Silver, William M., Method and apparatus for locating objects.
  17. Silver, William M., Method and apparatus for visual detection and inspection of objects.
  18. Silver, William M., Method and system for optoelectronic detection and location of objects.
  19. Mirtich, Brian V.; Silver, William M., Method for setting parameters of a vision detector using production line information.
  20. Mirtich, Brian V.; Silver, William M., Method for setting parameters of a vision detector using production line information.
  21. Lessard, Denis, Optical inspection apparatus and method.
  22. Kobayashi, Shinichi; Hamada, Noritsugu, Superconducting wire inspection apparatus and method.
  23. Mirtich, Brian V.; Eames, Andrew; Phillips, Brian S.; Tremblay, II, Robert J.; Keating, John F.; Whitman, Steven, System and method for assigning analysis parameters to vision detector using a graphical interface.
  24. Mirtich, Brian V.; Eames, Andrew; Phillips, Brian S.; Tremblay, II, Robert J.; Keating, John F.; Whitman, Steven, System and method for assigning analysis parameters to vision detector using a graphical interface.
  25. Zadeh, Ali Moghaddam, System and method for detecting flaws in objects using machine vision.
  26. Mirtich, Brian V.; Eames, Andrew; Phillips, Brian S.; Tremblay, II, Robert J.; Keating, John F.; Whitman, Steven, System and method for displaying and using non-numeric graphic elements to control and monitor a vision system.
  27. Mirtich, Brian V.; Eames, Andrew; Phillips, Brian S.; Tremblay, II, Robert J.; Keating, John F.; Whitman, Steven, System and method for displaying and using non-numeric graphic elements to control and monitor a vision system.
  28. Silver, William M.; Tremblay, Robert J.; Eames, Andrew, System for configuring an optoelectronic sensor.
  29. Whitman, Steven M.; Tremblay, Robert; Arbogast, Jr., Carroll McNeill, System, method and graphical user interface for displaying and controlling vision system operating parameters.
  30. Cottles, Vernon M.; Drutowski, Mark R., Tape edge monitoring.
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