초록 ▼

An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic ele

An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.

대표청구항 ▼

[ What is claimed is:] [1.] An electrooptic voltage waveform measuring apparatus comprising:an electrooptic element having an electrooptic effect;a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured;a first light source irradiating a light on the

[ What is claimed is:] [1.] An electrooptic voltage waveform measuring apparatus comprising:an electrooptic element having an electrooptic effect;a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured;a first light source irradiating a light on the electrooptic element;a polarization analyzer analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object;a second electrode mounted on the electrooptic element and separated from the first electrode;an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object; anda voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.