초록 ▼

A method of using a processor-based integrated circuit (IC) tester (12) to automatically invoke diagnostic testing. A diagnostic schedule (30) is user-defined (FIG. 3), and checked by the tester (12) at various times, such as before and after the tester 12 tests an IC lot (FIGS. 6, 7, 8). The schedu

A method of using a processor-based integrated circuit (IC) tester (12) to automatically invoke diagnostic testing. A diagnostic schedule (30) is user-defined (FIG. 3), and checked by the tester (12) at various times, such as before and after the tester 12 tests an IC lot (FIGS. 6, 7, 8). The schedule (30) has various scheduling parameters that permit diagnostic testing to be scheduled to occur at certain times, at the expiration of intervals, or upon certain events. The schedule (30) also permits different levels of diagnostic testing, each level with its own schedule. The tester (12) is programmed to run an appropriate level of diagnostic testing if more than one level is due to occur.

대표청구항 ▼

[ What is claimed is:] [1.] A method of using a processor-based integrated circuit tester to perform program scheduled diagnostic self testing by said tester, where said tester performs device testing on a number of integrated circuits as a lot, comprising the steps of:providing a programmable diagn

[ What is claimed is:] [1.] A method of using a processor-based integrated circuit tester to perform program scheduled diagnostic self testing by said tester, where said tester performs device testing on a number of integrated circuits as a lot, comprising the steps of:providing a programmable diagnostic scheduler for programmably setting a programmed diagnostic schedule of diagnostic self tests including at opening and closing of said lot;said scheduler scheduling different levels of diagnostic testing and when diagnostic testing is to be performed at the different levels;accessing said programmed diagnostic schedule before said device testing, said schedule indicating when said diagnostic self testing is to be performed, whether said schedule is to be checked at the opening of said lot, and whether said schedule is to be checked at the close of said lot;before and after said device testing, checking said programmed diagnostic schedule to determine whether said programmed diagnostic schedule indicates that diagnostic testing is to be performed; andautomatically performing said diagnostic self testing in accordance with said programmed diagnostic schedule.