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Ferroelectric dynamic random access memory 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G11C-011/22
출원번호 US-0154056 (1998-09-16)
발명자 / 주소
  • Ma Tso-Ping
  • Han Jin-Ping
출원인 / 주소
  • Yale University
대리인 / 주소
    Fish & Richardson P.C.
인용정보 피인용 횟수 : 85  인용 특허 : 15

초록

A memory including an array of memory cells, each of which includes a ferroelectric field effect transistor (FET) as its memory element; and sense and refresh circuitry connected to the array of memory cells to read stored data within each cell by sensing source-to-drain conductivity of the ferroele

대표청구항

[ What is claimed is:] [1.] A memory comprising:an array of volatile memory cells, each of which includes as its memory element a ferroelectric field effect transistor (FET) which stores information in a polarization state that decays over time; andsense and refresh circuitry connected to the array

이 특허에 인용된 특허 (15)

  1. Eaton ; Jr. S. Sheffield (Colorado Springs CO), DRAM memory cell and method of operation thereof for transferring increased amount of charge to a bit line.
  2. Crossland William A. (Harlow GB2) Ayliffe Peter J. (Bishops Stortford GB2), Ferro-electric liquid crystal display with steady state voltage on front electrode.
  3. Natori Kenji (Kawasaki JPX), Ferroelectric memory device.
  4. Schmitt Jerome J. (265 College St. (12N) New Haven CT 06510), Method and apparatus for the deposition of solid films of a material from a jet stream entraining the gaseous phase of s.
  5. Katoh Yuukoh,JPX, Method of controlling non-volatile ferroelectric memory cell for inducing a large amount of electric charge representa.
  6. Ishihara Hiroshi,JPX ; Tokumitsu Eisuke,JPX, Method of writing data to a single transistor type ferroelectric memory.
  7. Taira Shigenobu,JPX, Non-volatile ferroelectric memory utilizing residual polarization of a ferroelectric film.
  8. Nakamura Takashi,JPX ; Nakao Yuichi,JPX, Non-volatile semiconductor memory of a metal ferroelectric field effect transistor.
  9. Achard Herv (Grenoble FRX) Joly Jean-Pierre (St. Egreve FRX), Non-volatile storage cell of the metal - ferroelectric - semiconductor type.
  10. Takasu Hidemi (Kyoto JPX), Semiconductor device having field effect transistor using ferroelectric film as gate insulation film.
  11. Honjo Shigeru (Ohtsuki JPX) Yanagisawa Kazumasa (Kokubunji JPX) Inoue Kiyoshi (Tokyo JPX), Semiconductor memory device.
  12. Honjo Shigeru,JPX ; Yanagisawa Kazumasa,JPX ; Inoue Kiyoshi,JPX, Semiconductor memory device.
  13. Nakamura Takashi (Kyoto JPX), Semiconductor memory device having ferroelectric film.
  14. Toda Haruki (Yokohama JPX), Semiconductor memory device with ferroelectric capacitor cells with a plate to which a mid-level voltage is applied.
  15. Lin He (Dallas TX) Ignatiev Alex (Houston TX) Wu Nai Juan (Houston TX), Three-terminal non-volatile ferroelectric/superconductor thin film field effect transistor.

이 특허를 인용한 특허 (85)

  1. Chien, Pien, 2-port memory device.
  2. Salling, Craig T., Array architecture for depletion mode ferroelectric memory devices.
  3. Salling, Craig T., Array architecture for depletion mode ferroelectric memory devices.
  4. Berstis, Viktors; Klim, Peter Juergen; Lam, Chung, Batteryless, osciliatorless, analog time cell usable as an horological device with associated programming methods and devices.
  5. Berstis, Viktors; Klim, Peter Juergen; Lam, Chung, Batteryless, oscillatorless, binary time cell usable as an horological device with associated programming methods and devices.
  6. Craig T. Salling, Bi-state ferroelectric memory devices, uses and operation.
  7. Sun, Xiao; Ma, Tso-Ping, Circuitry for ferroelectric FET-based dynamic random access memory and non-volatile memory.
  8. Salling, Craig T., Depletion mode ferroelectric memory device and method of writing to and reading from the same.
  9. Dubourdieu, Catherine Anne; Frank, Martin Michael; Narayanan, Vijay, Engineering multiple threshold voltages in an integrated circuit.
  10. Myoungho Lim ; Vikram Joshi ; Jeffrey W. Bacon ; Joseph D. Cuchiaro ; Larry D. McMillan ; Carlos A. Paz de Araujo, Ferroelectric field effect transistor, memory utilizing same, and method of operating same.
  11. Miyamoto, Hideaki; Sakai, Naofumi; Yamada, Kouichi; Matsushita, Shigeharu, Ferroelectric memory having a refresh control circuit capable of recovering residual polarization of unselected memory cells.
  12. Kang, Hee Bok, Ferroelectric random access memory.
  13. Kang, Hee Bok, Ferroelectric register, and method for manufacturing capacitor of the same.
  14. Kang, Hee Bok, Ferroelectric register, and method for manufacturing capacitor of the same.
  15. Kang,Hee Bok, Ferroelectric register, and method for manufacturing capacitor of the same.
  16. Yamaguchi, Tetsuya, Ferroelectric semiconductor memory.
  17. Dimmler, Klaus; Gnadinger, Alfred P., Ferroelectric transistor for storing two data bits.
  18. Dimmler, Klaus; Gnadinger, Alfred P., Ferroelectric transistor for storing two data bits.
  19. Dimmler,Klaus; Gnadinger,Alfred P., Ferroelectric transistor for storing two data bits.
  20. Dimmler, Klaus; Gnadinger, Alfred P., Ferroelectric transistor with enhanced data retention.
  21. Kang,Hee Bok, Input/output byte control device using nonvolatile ferroelectric register.
  22. Kang,Hee Bok, Input/output upper and lower byte control device using nonvolatile ferroelectric register.
  23. Heinz Honigschmid ; Marc Ullmann DE, Integrated memory having memory cells that each include a ferroelectric memory transistor.
  24. Salling, Craig T.; Huber, Brian W., Junction-isolated depletion mode ferroelectric memory.
  25. Salling, Craig T.; Huber, Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  26. Salling, Craig T.; Huber, Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  27. Salling, Craig T.; Huber, Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  28. Salling, Craig T.; Huber, Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  29. Salling, Craig T.; Huber, Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  30. Salling,Craig T.; Huber,Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  31. Salling,Craig T.; Huber,Brian W., Junction-isolated depletion mode ferroelectric memory devices.
  32. Salling,Craig T.; Huber,Brian W., Junction-isolated depletion mode ferroelectric memory devices and systems.
  33. Salling,Craig T.; Huber,Brian W., Junction-isolated depletion mode ferroelectric memory devices and systems.
  34. Chih, Yu-Der; Chen, Yun-Sheng; Lin, Chun-Jung, Memories with metal-ferroelectric-semiconductor (MFS) transistors.
  35. Reohr, William Robert; Wang, Li-Kong, Memory array employing single three-terminal non-volatile storage elements.
  36. Kim, Yong Tae; Park, Young Kyun, Memory device using a transistor and its fabrication method.
  37. Scalia, Antonio Maria; Greco, Maurizio, Memory support provided with memory elements of ferroelectric material and non-destructive reading method thereof.
  38. Hecht,Thomas; Birner,Albert; Seidl,Harald; Schr?der,Uwe; Jakschik,Stefan; Gutsche,Martin, Method and configuration for reinforcement of a dielectric layer at defects by self-aligning and self-limiting electrochemical conversion of a substrate material.
  39. Goebel, Holger; Hoenigschmid, Heinz; H?nlein, Wolfgang; Haneder, Thomas, Method for reading out or in a status from or to a ferroelectrical transistor of a memory cell and memory matrix.
  40. Berstis,Viktors; Klim,Peter Juergen; Lam,Chung, Methods and systems for performing horological functions using time cells.
  41. Yoshihisa Kato JP, Methods of reading and writing data from/ on semiconductor memory device, and method for driving the device.
  42. Salling, Craig T., Methods of reading ferroelectric memory cells.
  43. Salling, Craig T.; Huber, Brian W., Methods of reading junction-isolated depletion mode ferroelectric memory devices.
  44. Salling, Craig T.; Huber, Brian W., Methods of writing junction-isolated depletion mode ferroelectric memory devices.
  45. Redecker, Michael, Non-volatile memory device and matrix display panel using the same.
  46. Misewich, James A.; Reohr, William Robert; Schrott, Alejandro Gabriel; Wang, Li-Kong, Non-volatile memory using ferroelectric gate field-effect transistors.
  47. Kang, Hee Bok, Nonvolatile ferroelectric memory and control device using the same.
  48. Kang,Hee Bok, Nonvolatile ferroelectric memory and control device using the same.
  49. Hee Bok Kang KR, Nonvolatile ferroelectric memory and method for fabricating the same.
  50. Kang, Hee Bok, Nonvolatile ferroelectric memory and method for fabricating the same.
  51. Kang, Hee Bok, Nonvolatile ferroelectric memory device.
  52. Kang,Hee Bok, Nonvolatile ferroelectric memory device having a multi-bit control function.
  53. Kang,Hee Bok, Nonvolatile ferroelectric memory device having a multi-bit control function.
  54. Kang,Hee Bok, Nonvolatile ferroelectric memory device having a multi-bit control function.
  55. Kang,Hee Bok, Nonvolatile ferroelectric memory device having timing reference control function and method for controlling the same.
  56. Kang, Hee Bok, Nonvolatile programmable logic circuit.
  57. Kang, Hee Bok, Nonvolatile programmable logic circuit.
  58. Kang, Hee Bok, Nonvolatile programmable logic circuit.
  59. Kang, Hee Bok, Nonvolatile programmable logic circuit.
  60. Kang, Hee Bok, Nonvolatile programmable logic circuit.
  61. Kang,Hee Bok, Nonvolatile programmable logic circuit.
  62. Berstis, Viktors, Performing horological functions in commercial transactions using time cells.
  63. Berstis, Viktors, Performing horological functions in commercial transactions using time cells.
  64. Buchanan,Douglas A.; Neumayer,Deborah Ann, Precursor source mixtures.
  65. Almadhoun, Mahmoud N.; Odeh, Ihab N.; Khan, Mohd Adnan, Processing of thin film organic ferroelectric materials using pulsed electromagnetic radiation.
  66. Salling, Craig T., Reading ferroelectric memory cells.
  67. Kang,Hee Bok, Reset signal generating circuit.
  68. Kwon, Duk Min; Kwon, Kee Won, Self-calibrating temperature sensors and methods thereof.
  69. Nakamura, Takashi, Semiconductor memory and method for accessing semiconductor memory.
  70. Takashi Nakamura JP, Semiconductor memory and method for accessing semiconductor memory.
  71. Thomas Bohm DE; Georg Braun DE; Heinz Honigschmid ; Thomas Rohr DE, Semiconductor memory configuration with a refresh logic circuit, and method of refreshing a memory content of the semiconductor memory configuration.
  72. Kang, Hee Bok, Semiconductor memory device.
  73. Uchiyama, Kiyoshi; Shimada, Yasuhiro; Arita, Koji; Otsuki, Tatsuo, Semiconductor memory device.
  74. Berstis, Viktors; Klim, Peter Juergen; Lam, Chung, Sensing methods and devices for a batteryless, oscillatorless, analog time cell usable as an horological device.
  75. Berstis, Viktors; Klim, Peter Juergen; Lam, Chung, Sensing methods and devices for a batteryless, oscillatorless, binary time cell usable as an horological device.
  76. Kang, Hee Bok, Serial bus controller using nonvolatile ferroelectric memory.
  77. Kang,Hee Bok, Serial bus controller using nonvolatile ferroelectric memory.
  78. Gnadinger, Alfred P., Single transistor ferroelectric memory cell, device and method for the formation of the same incorporating a high temperature ferroelectric gate dielectric.
  79. Gnadinger,Fred P., Single transistor rare earth manganite ferroelectric nonvolatile memory cell.
  80. Kang,Hee Bok, Test mode control device using nonvolatile ferroelectric memory.
  81. Kang,Hee Bok, Test mode control device using nonvolatile ferroelectric memory.
  82. Kang,Hee Bok, Test mode control device using nonvolatile ferroelectric memory.
  83. Salling, Craig T., Writing to ferroelectric memory devices.
  84. Salling,Craig T., Writing to ferroelectric memory devices.
  85. Salling,Craig T., Writing to ferroelectric memory devices.
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