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A battery system includes an electrical storage cell having a positive terminal and a negative terminal. The electrical storage cell is provided with a normally open bypass circuit path that is closed in the event of an open-circuit failure of the electrical storage cell. The bypass circuit path inc

A battery system includes an electrical storage cell having a positive terminal and a negative terminal. The electrical storage cell is provided with a normally open bypass circuit path that is closed in the event of an open-circuit failure of the electrical storage cell. The bypass circuit path includes a normally open bypass circuit path comprising a diode having a cathode and an anode. The cathode of the diode is electrically connected to the positive terminal of the electrical storage cell and the anode of the diode is electrically connected to the negative terminal of the electrical storage cell. The diode fails to a shorted current path at an imposed current less than a cell failure current, providing a low-resistance, low-voltage-drop bypass of the electrical storage cell.

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[ What is claimed is:] [1.] A battery system, comprising:a first electrical storage cell having a positive terminal and a negative terminal, the first electrical storage cell having an open-circuit failure mode;a normally open bypass circuit path comprising a diode having a cathode and an anode, the

[ What is claimed is:] [1.] A battery system, comprising:a first electrical storage cell having a positive terminal and a negative terminal, the first electrical storage cell having an open-circuit failure mode;a normally open bypass circuit path comprising a diode having a cathode and an anode, the cathode of the diode being electrically connected to the positive terminal of the electrical storage cell and the anode of the diode being electrically connected to the negative terminal of the electrical storage cell, the diode failing to a shorted current path when heated to a temperature above a maximum diode temperature rating; andat least one additional electrical storage cell in electrical series connection with the first electrical storage cell, the at least one additional electrical storage cell imposing a cell failure current on the diode such that the diode is heated to a temperature greater than the maximum diode temperature rating during the open-circuit failure mode of the first electrical storage cell.