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Helicon wave plasma processing apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23F-001/02
출원번호 US-0840325 (1997-04-16)
우선권정보 JP-0205282 (1994-08-30)
발명자 / 주소
  • Kadomura Shingo,JPX
출원인 / 주소
  • Sony Corporation, JPX
대리인 / 주소
    Hill & Simpson
인용정보 피인용 횟수 : 34  인용 특허 : 18

초록

Controlling ion/radical ratio and monoatomic/polyatomic radical ratio in a process plasma provides improved processing performance during inductively-coupled plasma and/or helicon wave plasma processing of substrate materials. In a plasma processing method employing inductively coupled plasma, high

대표청구항

[ What is claimed is:] [1.] A plasma apparatus, comprising:a vacuum vessel for accommodating a substrate therein, said vacuum vessel having a wall,a portion of said wall of said vacuum vessel being formed of an electrically non-conductive material,a high-frequency antenna placed around the portion o

이 특허에 인용된 특허 (18)

  1. Barnes Michael S. (Mahopac NY) Coultas Dennis K. (Hopewell Junction NY) Forster John C. (Poughkeepsie NY) Keller John H. (Poughkeepsie NY) O\Neill James A. (New City NY), Apparatus for gettering of particles during plasma processing.
  2. Saxena Arjun N. (2 Birch Hill Rd. Ballston Lake NY 12019), Apparatus for selective chemical vapor deposition of dielectric, semiconductor and conductive films on semiconductor and.
  3. Ohba Kazuo (2-3 ; Matsubacho 4-chome Higashimatsuyama-shi ; Saitama JPX) Shima Yoshinori (768-15 ; Ohzenji Asaqu-ku ; Kawasaki-shi JPX) Ohba Akira (12-89 ; Miyado 3-chome Asaka-shi ; Saitama JPX), ECR plasma process.
  4. Egitto Frank D. (Binghamton NY) Mlynko Walter E. (Vestal NY), Enhanced plasma etching.
  5. Campbell Gregor (Glendale CA) Conn Robert W. (Los Angeles CA) Shoji Tatsuo (Nagoya JPX), High density plasma deposition and etching apparatus.
  6. Campbell Gregor (Glendale CA) Conn Robert W. (Los Angeles CA) Shoji Tatsuo (Nagoya JPX), High density plasma deposition and etching apparatus.
  7. Campbell Gregor A. (Glendale CA) Conn Robert W. (Los Angeles CA) Katz Dan (Beverly Hills CA) Parker N. William (Fairfield CA) Pearson David I. C. (Los Angeles CA), High density plasma deposition and etching apparatus.
  8. Campbell Gregor A. (Glendale CA) Conn Robert W. (Los Angeles CA) Katz Dan (Beverly Hills CA) Parker N. William (Fairfield CA) de Chambrier Alexis (Glendale CA), High density plasma deposition and etching apparatus.
  9. Salimian Siamak (Sunnyvale CA) Delfino Michelangelo (Los Altos CA) Chung Bu-Chin (Saratoga CA), Plasma etch process.
  10. Samukawa Seiji (Tokyo JPX), Plasma formation using electron cyclotron resonance and method for processing substrate by using the same.
  11. Ishii Nobuo,JPX ; Hata Jiro,JPX, Plasma processing apparatus.
  12. Yoshida Kazuyoshi (Tokyo JPX), Plasma processing apparatus.
  13. Saito Hiroshi (Fujisawa JPX) Suzuki Yasumichi (Yokohama JPX) Tamura Naoyuki (Kudamatsu JPX), Plasma processing method and an apparatus for carrying out the same.
  14. Horiike Yasuhiro (Hiroshima JPX) Fukasawa Takayuki (Yamanashi JPX), Plasma treatment apparatus.
  15. Charlet Barbara (Meylan FRX) Peccoud Louise (Claix FRX), Process for etching by gas plasma.
  16. Flamm Daniel L. (476 Green View Dr. Walnut Creek CA 94596), Processes depending on plasma discharges sustained in a helical resonator.
  17. Leung Ka-Ngo (Hercules CA), Pulsed source ion implantation apparatus and method.
  18. Cuomo Jerome J. (Lincolndale NY) Guarnieri Charles R. (Somers NY) Hopwood Jeffrey A. (Brewster NY) Whitehair Stanley J. (Peekskill NY), Radio frequency induction plasma processing system utilizing a uniform field coil.

이 특허를 인용한 특허 (34)

  1. Yang, Jang Gyoo; Hoffman, Daniel J.; Carducci, James D.; Buchberger, Jr., Douglas A.; Hagen, Melissa; Miller, Matthew L.; Chiang, Kang-Lie; Delgadino, Gerardo A., Capacitively coupled plasma reactor with uniform radial distribution of plasma.
  2. Yim, David; McGarry, Steve, Covered housing.
  3. Yang,Jang Gyoo; Hoffman,Daniel J.; Shannon,Steven C.; Burns,Douglas H.; Lee,Wonseok; Kim,Kwang Soo, Dual bias frequency plasma reactor with feedback control of E.S.C. voltage using wafer voltage measurement at the bias supply output.
  4. Hagseth, Paul E.; McClure, Paul D., Inlet electromagnetic flow control.
  5. Hoffman,Daniel J.; Ye,Yan; Katz,Dan; Buchberger, Jr.,Douglas A.; Zhao,Xiaoye; Chiang,Kang Lie; Hagen,Robert B.; Miller,Matthew L., MERIE plasma reactor with overhead RF electrode tuned to the plasma with arcing suppression.
  6. Hoffman, Daniel J.; Ye, Yan; Katz, Dan; Buchberger, Jr., Douglas A.; Zhao, Xiaoye; Chiang, Kang-Lie; Hagen, Robert B.; Miller, Matthew L., Merie plasma reactor with overhead RF electrode tuned to the plasma with arcing suppression.
  7. Bailey ; III Andrew D. ; Schoepp Alan M. ; Bright Nicolas, Method and apparatus for controlling the volume of a plasma.
  8. Lymberopoulos Dimitris ; Loewenhardt Peter ; Yamartino John, Method and apparatus for improving processing and reducing charge damage in an inductively coupled plasma reactor.
  9. Bailey, III,Andrew D., Method and apparatus for plasma forming inner magnetic bucket to control a volume of a plasma.
  10. Gessner, Thomas; Bertz, Andreas; Schubert, Reinhard; Werner, Thomas; Hentsch, Wolfgang; Fendler, Reinhard; Koehler, Lutz, Method and apparatus for structuring components made of a material composed of silicon oxide.
  11. Hoffman,Daniel J.; Gold,Ezra Robert, Method of characterizing a chamber based upon concurrent behavior of selected plasma parameters as a function of plural chamber parameters.
  12. Hoffman,Daniel J.; Gold,Ezra Robert, Method of characterizing a chamber based upon concurrent behavior of selected plasma parameters as a function of source power, bias power and chamber pressure.
  13. Hoffman, Daniel J.; Gold, Ezra Robert, Method of controlling a chamber based upon predetermined concurrent behavior of selected plasma parameters as a function of selected chamber parameters.
  14. Hoffman, Daniel J., Method of determining plasma ion density, wafer voltage, etch rate and wafer current from applied bias voltage and current.
  15. Hoffman, Daniel J., Method of determining wafer voltage in a plasma reactor from applied bias voltage and current and a pair of constants.
  16. Zin, Kelvin Kyaw, Method of etching a thin film using pressure modulation.
  17. Yang,Jang Gyoo; Hoffman,Daniel J.; Shannon,Steven C.; Burns,Douglas H.; Lee,Wonseok; Kim,Kwang Soo, Method of feedback control of ESC voltage using wafer voltage measurement at the bias supply output.
  18. Hoffman, Daniel J., Method of operating a plasma reactor chamber with respect to two plasma parameters selected from a group comprising ion density, wafer voltage, etch rate and wafer current, by controlling chamber parameters of source power and bias power.
  19. Kutney, Michael C.; Hoffman, Daniel J.; Delgadino, Gerardo A.; Gold, Ezra R.; Sinha, Ashok; Zhao, Xiaoye; Burns, Douglas H.; Ma, Shawming, Methods to avoid unstable plasma states during a process transition.
  20. McClure, Paul D.; Chase, Charles J., Over-wing traveling-wave axial flow plasma accelerator.
  21. Hoffman,Daniel J., Plasma density, energy and etch rate measurements at bias power input and real time feedback control of plasma source and bias power.
  22. Andrew D. Bailey, III ; Alan M. Schoepp ; David J. Hemker ; Mark H. Wilcoxson ; Andras Kuthi, Plasma processing systems.
  23. Buchberger, Jr.,Douglas A.; Hoffman,Daniel J.; Regelman,Olga; Carducci,James; Horioka,Keiji; Yang,Jang Gyoo, Plasma reactor overhead source power electrode with low arcing tendency, cylindrical gas outlets and shaped surface.
  24. Hoffman, Daniel J.; Lindley, Roger A.; Kutney, Michael C.; Salinas, Martin J.; Tavassoli, Hamid F.; Horioka, Keiji; Buchberger, Jr., Douglas A., Plasma reactor with minimal D.C. coils for cusp, solenoid and mirror fields for plasma uniformity and device damage reduction.
  25. Hoffman, Daniel J.; Yin, Gerald Zheyao, Plasma reactor with overhead RF electrode tuned to the plasma.
  26. Hoffman, Daniel J.; Yin, Gerald Zheyao, Plasma reactor with overhead RF electrode tuned to the plasma.
  27. Hoffman,Daniel J.; Yin,Gerald Zheyao; Ye,Yan; Katz,Dan; Buchberger, Jr.,Douglas A.; Zhao,Xiaoye; Chiang,Kang Lie; Hagen,Robert B.; Miller,Matthew L., Plasma reactor with overhead RF electrode tuned to the plasma with arcing suppression.
  28. Hoffman,Daniel; Yang,Jang Gyoo; Buchberger, Jr.,Douglas A.; Burns,Douglas, Plasma reactor with overhead RF source power electrode having a resonance that is virtually pressure independent.
  29. Hofman,Daniel J.; Sun,Jennifer Y.; Thach,Senh; Ye,Yan, Plasma reactor with overhead RF source power electrode with low loss, low arcing tendency and low contamination.
  30. Wang, Yiqiong; Khan, Anisul; Kumar, Ajay; Podlesnik, Dragan; Pamarthy, Sharma V., Process for etching conductors at high etch rates.
  31. Lukic, Branko; Takayama, Steve Ryutaro; Yim, David; O'Keefe, Denis; O'Connell, Neil; McGarry, Steve; LaBrutto, Chris, Speaker housing.
  32. Lukic, Branko; Takayama, Steven Ryutaro; Yim, David; O'Keeffe, Denis; O'Connell, Neil; McGarry, Steve; LaBrutto, Chris, Speaker housing.
  33. Gottscho, Richard A.; Steger, Robert J., Switched uniformity control.
  34. Gottscho,Richard A.; Steger,Robert J., Switched uniformity control.
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