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Substrate retaining ring 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23F-001/02
  • B24B-005/00
  • B24B-029/00
출원번호 US-0000516 (1997-12-30)
발명자 / 주소
  • Prince John
출원인 / 주소
  • Applied Materials, Inc.
대리인 / 주소
    Fish & Richardson
인용정보 피인용 횟수 : 38  인용 특허 : 5

초록

A retaining ring is configured for use with an apparatus for polishing a substrate. The substrate has upper and lower faces and a perimeter. The apparatus has a movable polishing pad with an upper polishing surface for contacting and polishing the lower face of the substrate. The retaining ring has

대표청구항

[ What is claimed is:] [7.] A retaining ring for use in conjunction with an apparatus for polishing a substrate, the substrate having upper and lower faces and a lateral perimeter, the apparatus having a polishing pad with an upper polishing surface for contacting and polishing the lower face of the

이 특허에 인용된 특허 (5)

  1. Zuniga Steven M. ; Blumenkranz Stephen J., Carrier head design for a chemical mechanical polishing apparatus.
  2. Stroupe Hugh (Boise ID) Sharan Sujit (Boise ID) Sandhu Gurtej S. (Boise ID), Process of polishing a semiconductor wafer having an orientation edge discontinuity shape.
  3. Hileman Harold J. (Kirkwood MO) Walsh Robert J. (Ballwin MO) Walsh Thomas A. (Templeton CA), Semiconductor wafer polishing appartus and method.
  4. Shendon Norm (San Carlos CA) Struven Kenneth C. (San Carlos CA) Kolenkow Robert J. (Berkeley CA), Wafer polisher head having floating retainer ring.
  5. Kobayashi Hiroyuki (Omiya JPX) Miyairi Hiroo (Omiya JPX) Endo Osamu (Omiya JPX), Wafer polishing apparatus.

이 특허를 인용한 특허 (38)

  1. Maloney,Gerard S.; Price,Jason; Chin,Scott; Kajiwara,Jiro; Charif,Malik, Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure.
  2. Zuniga, Steven M., Apparatus and method of detecting a substrate in a carrier head.
  3. Maloney,Gerard S.; Price,Jason; Chin,Scott; Kajiwara,Jiro; Charif,Malik, Apparatus for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure.
  4. Tomoharu Watanabe JP; Nobuhiro Kato JP, Apparatus, backing plate, backing film and method for chemical mechanical polishing.
  5. Watanabe Tomoharu,JPX ; Kato Nobuhiro,JPX, Apparatus, backing plate, backing film and method for chemical mechanical polishing.
  6. Steven Zuniga ; Hung Chen, Carrier head for chemical mechanical polishing.
  7. Steven M. Zuniga, Carrier head with controllable pressure and loading area for chemical mechanical polishing.
  8. Zuniga, Steven M.; Chen, Hung Chih; Tseng, Ming Kuie, Carrier head with flexible membrane to provide controllable pressure and loading area.
  9. Zuniga, Steven M.; Chen, Hung Chih; Tseng, Ming Kuie, Carrier head with flexible membranes to provide controllable pressure and loading area.
  10. Kajiwara, Jiro; Moloney, Gerard S.; Wang, Huey-Ming; Yang, Junsheng, Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface.
  11. Maloney,Gerard S.; Chin,Scott; Geraghty,John J.; Dyson, Jr.,William; Dickey,Tanlin K., Chemical mechanical polishing head assembly having floating wafer carrier and retaining ring.
  12. Wang Huey-Ming ; Moloney Gerard S. ; Chin Scott ; Geraghty John J. ; Dyson ; Jr. William ; Dickey Tanlin K., Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control.
  13. Lansford, Christopher H.; Lansford, Jeremy S.; Yellitz, Bradley J., Chemical mechanical polishing with electrochemical control.
  14. Fukushima, Makoto; Yasuda, Hozumi; Nabeya, Osamu; Watanabe, Katsuhide; Namiki, Keisuke, Elastic membrane for semiconductor wafer polishing.
  15. Fukushima, Makoto; Yasuda, Hozumi; Nabeya, Osamu; Watanabe, Katsuhide; Namiki, Keisuke, Elastic membrane for semiconductor wafer polishing.
  16. Lansford, Christopher H.; Lansford, Jeremy S., Electrochemically generated reactants for chemical mechanical planarization.
  17. Chen,Hung Chih; Oh,Jeonghoon; Zuniga,Steven M., Flexible membrane for multi-chamber carrier head.
  18. Kao Tsung-En,TWX ; Wang Ming-Tsong,TWX, Method and device for reducing semiconductor defects caused by wafer clamping.
  19. Zuniga, Steven M., Method of chemical mechanical polishing with controllable pressure and loading area.
  20. VanHanehem, Matthew R., Method of reducing defectivity during chemical mechanical planarization.
  21. Chen, Hung Chih; Zuniga, Steven M., Multi-chamber carrier head with a flexible membrane.
  22. Wang, Junshi; Zuniga, Steven M., Multilayer retaining ring for chemical mechanical polishing.
  23. Chen, Hung Chih; Oh, Jeonghoon; Siu, Tsz-Sin; Brezoczky, Thomas B.; Zuniga, Steven M., Multiple zone carrier head with flexible membrane.
  24. Chen, Hung Chih; Oh, Jeonghoon; Siu, Tsz-Sin; Brezoczky, Thomas; Zuniga, Steven M., Multiple zone carrier head with flexible membrane.
  25. Chen,Hung Chih; Oh,Jeonghoon; Siu,Tsz Sin; Brezoczky,Thomas; Zuniga,Steven M., Multiple zone carrier head with flexible membrane.
  26. Loebmann, André; Nagel, Norman, Retainer ring.
  27. Lai Lei Ping ; Tucker Joshua L. ; Lujan Randall J., Retaining ring for chemical mechanical polishing.
  28. Chen, Hung Chih; Zuniga, Steven M.; Garretson, Charles C.; McAllister, Douglas R.; Lin, Jian; Meyer, Stacy; Huey, Sidney P.; Oh, Jeonghoon; Doan, Trung T.; Schmidt, Jeffrey P.; Wohlert, Martin S.; Hughes, Kerry F.; Wang, James C.; Lu, Danny Cam Toan; De Lamenie, Romain Beau; Balagani, Venkata R.; Allen, Aden Martin; Fong, Michael Jon, Retaining ring with Shaped Surface.
  29. Chen, Hung Chih; Zuniga, Steven M.; Garretson, Charles C.; McAllister, Douglas R.; Lin, Jian; Meyer, Stacy; Huey, Sidney P.; Oh, Jeonghoon; Doan, Trung T.; Schmidt, Jeffrey P.; Wohlert, Martin S.; Hughes, Kerry F.; Wang, James C.; Lu, Danny Cam Toan; De Lamenie, Romain Beau; Balagani, Venkata R.; Allen, Aden Martin; Fong, Michael Jon, Retaining ring with shaped surface.
  30. Chen, Hung Chih; Zuniga, Steven M.; Garretson, Charles C.; McAllister, Douglas R.; Lin, Jian; Meyer, Stacy; Huey, Sidney P.; Oh, Jeonghoon; Doan, Trung T.; Schmidt, Jeffrey; Wohlert, Martin S.; Hughes, Kerry F.; Wang, James C.; Lu, Danny Cam Toan; De Lamenie, Romain Beau; Balagani, Venkata R.; Allen, Aden Martin; Fong, Michael Jon, Retaining ring with shaped surface.
  31. Chen,Hung Chih; Zuniga,Steven M.; Garretson,Charles C.; McAllister,Douglas R.; Meyer,Stacy; Doan,Trung T.; Lu,Daniel Cam Toan; De Lamenie,Romain Beau; Balagani,Venkata R.; Allen,Aden Martin; Fong,Michael Jon, Retaining ring with shaped surface.
  32. Yamaki, Satoru; Yasuda, Hozumi; Namiki, Keisuke; Nabeya, Osamu; Fukushima, Makoto; Togashi, Shingo, Substrate holder, polishing apparatus, polishing method, and retaining ring.
  33. Wang, Yu Piao, Substrate retaining ring for CMP.
  34. Wang, Yu Piao, Substrate retaining ring for CMP.
  35. Izumi, Hirohiko; Michiya, Satomi; Fujita, Takashi; Numoto, Minoru; Tuzov, Mikhail, Wafer polishing apparatus.
  36. Sung, Jae Chel, Wafer support member, method for manufacturing the same and wafer polishing unit comprising the same.
  37. Tatsunori Kobayashi JP; Hiroshi Tanaka JP; Jiro Kajiwara JP, Wafer transfer apparatus and wafer polishing apparatus, and method for manufacturing wafer.
  38. Lougher, Wayne F.; McPeek, Frank; Key, Robert, Workpiece carrier retaining element.
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