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Device and method for mapping the topography of an eye using elevation measurements in combination with slope measurements 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • A61B-003/00
출원번호 US-0370559 (1999-08-09)
발명자 / 주소
  • Sarver Edwin J.
  • Broadus Charles R.
출원인 / 주소
  • Orbtek, Inc.
대리인 / 주소
    Trask Britt
인용정보 피인용 횟수 : 24  인용 특허 : 49

초록 ▼

In an inventive method for mapping the topography of an eye, elevation measurements of the eye are collected using a slit beam diffuse reflection system, such as an ORBSCAN.TM. device. An approximating b-spline surface is then fitted to the elevation measurements. Slope measurements of the eye are c

대표청구항 ▼

[ What is claimed is:] [1.] A method for collecting elevation and slope measurements from an eye, the method comprising:measuring one of the elevation and slope measurements; andmeasuring the other of the elevation and slope measurements by referencing the one of the elevation and slope measurements

이 특허에 인용된 특허 (49)

  1. van Gelderen Herman (Doorniksestraat 4 The Hague NLX 2587 XL), Apparatus and method for determining contact lenses.
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  2. Barrett Graham D. (Unit 13 ; Sanderling Mews ; 4 Perina Way City Beach ; Western Australia AUX), Apparatus and method for determining the symmetry of a surface.
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  3. El Hage Sami G. (Houston TX), Apparatus and technique for automatic centering and focusing a corneal topographer.
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  4. Reynolds Alvin E. (7732 E. 105 St. Tulsa OK 74133), Apparatus for corneal corrective techniques.
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  5. Lang Walter (Koenigsbronn DEX) Mueller Ortwin (Koenigsbronn DEX), Apparatus for determination of corneal astigmatism.
    상세보기
  6. El Hage Sami G. (5417 Del Monte Houston TX 77056), Apparatus for determining the contour of the cornea of a human eye.
    상세보기
  7. Schulz Kurt (Oberkochen DEX) Maglica Peter (Oberkochen DEX), Apparatus for examining eyes.
    상세보기
  8. Shalon Tadmor (35 York Dr. Brentwood MO 63144) Rutter Bryce (644 Vasser University City MO 63130), Automated hand-held keratometer.
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  9. Shalon Tadmor (Brentwood MO) Pund Marvin L. (Brentwood MO), Automated hand-held keratometer.
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  10. Holcomb Harry F. (4501 Mission Bay Dr. San Diego CA 92100), Bright ring keratoscope.
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  11. Gersten Martin (43 Strong Pl. Brooklyn NY 11231) Maus Roy (542 48th St. Brooklyn NY 11220) Tibbling Lars (555 Main St. New York NY 10044), Compact keratoscope with interchangeable cones.
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  12. Cohen Samuel W. (Brooklyn NY) Infantino Settimio (Brooklyn NY), Cornea-examining instrument.
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  13. Kitajima Nobuaki (Tokyo JPX), Corneal shape measuring apparatus.
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  14. Kuhn William P. (Tucson AZ) Baker Phillip C. (Orinda CA), Device and method for mapping objects.
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  15. Achatz Manfred (Heusenstamm DEX) Beck Rasmus (Neu-Isenburg DEX) Bockelmann Werner (Frankfurt am Main DEX), Device and method for measuring the curvature of the cornea.
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  16. Wallace David A. (Beverly Hills CA) Feldon Steven E. (San Marino CA) Mezack Gary (Norco CA) Whiting Douglas L. (South Pasadena CA) Dally William J. (Pasadena CA) Karns Scott A. (Pomona CA), Digital ultrasonic instrument for ophthalmic use.
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  17. Karickhoff John R. (Fairfax VA), Hand-held keratometer.
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  18. Muller Ortwin (Aalen DEX) Schulz Kurt (Oberkochen DEX) Stopar Viktor (Oberkochen DEX), High-precision ophthalmometer which is independent of distance.
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  19. Gersten Martin (Brooklyn NY) Maus Roy (Brooklyn NY) Tibbling Lars (New York NY), Illuminated ring device.
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  21. Hasegawa Hiroshi (Kawasaki JA) Sato Toru (Tokyo JA), Illuminating device in an ophthalmometer.
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  22. Gersten Martin (Brooklyn NY) Tibbling Lars (New York NY) Maus Roy (Brooklyn NY), Interchangeable keratoscope device.
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  23. Mount ; II Houston B. (Tulsa OK), Keratograph autoscanner system.
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  24. Penney Carl M. (Saratoga Springs NY), Keratographic instrument using holographic placido illuminator to reduce alignment sensitivity.
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  26. Tibbling Lars (RR3 952-A Highland Lakes ; Vernon Township NJ 07422) Maus Roy (2305 Garfield St. North Bellmore NY 11710), Keratometer device having photographically produced bore pattern.
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  27. Humphrey, William E., Keratometer having peripheral light entrance and exit paths.
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  28. Gersten Martin (New York NY), Mapping of corneal topography with display of pupil perimeter.
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  29. L\Esperance Francis A. (Englewood NJ), Method and apparatus for analysis and correction of abnormal refractive errors of the eye.
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  30. Cambier James L. (Rome NY) Strods Salvins J. (Waterville NY), Method and apparatus for obtaining the topography of an object.
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  31. Warnicki Joseph W. (Pittsburgh PA) Rehkopf Paul G. (Murrysville PA) Cambier James L. (Rome NY) Strods Salvins J. (Waterville NY), Method and apparatus for obtaining the topography of an object.
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  32. Sarver Edwin J. (Pearland TX), Method and apparatus for variable block size interpolative coding of images.
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  33. Karpov Alexandr V. (Moskovskaya SUX) Kivaev Anatoly A. (Moscow SUX) Elkind Solomon A. (Moscow SUX) Orlov Garri N. (Moskovskaya SUX) Lukin Nikolai I. (Moskovskaya SUX) Gashnev Mikhail S. (Moskovskaya , Method and device for determining cornea surface topography.
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  34. Gersten Martin (New York NY), Method for displaying corneal topography.
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  35. Shimizu Kimiya (Suite 503 ; 9-6 ; Nishikubo 2-chome Musashino-shi ; Tokyo JPX) Tanaka Shunichi (Suite 302 ; 9-8 ; Yushima 1-chome Bunkyo-ku ; Tokyo JPX), Method for displaying optical properties of corneas.
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  36. Massie Norbert A., Non-contact tonometer.
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  37. Isogai Naoki (Nishio JPX) Hanaki Hirohiko (Gamagori JPX), Ophthalmic apparatus for photographing the anterior part of the eye with a reproducible photographing position.
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  38. Snook Richard K. (Tucson AZ), Ophthalmic instrument and method of making ophthalmic determinations using Scheimpflug corrections.
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  39. Snook Richard K. (Houston TX), Ophthalmic pachymeter and method of making ophthalmic determinations.
    상세보기
  40. Koester Charles J. (Glen Rock NJ), Ophthalmometer system.
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  41. Cornsweet Tom N. (Houston TX) Harrison Richard A. (Houston TX), Optical apparatus for obtaining measurements of portions of the eye.
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  42. Miller David (9 Francis St. Brookline MA 02146) Ohtsuka Hiroyuki (c/o Tokyo Kogaku Kikai Kabushiki Kaisha 75-1 ; Hasunuma-cho Itabashi-ku ; Tokyo ; 174 JPX) Matsuzawa Hirofumi (c/o Tokyo Kogaku Kikai, Photokeratometric device.
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  43. van Saarloos Paul P. (Innaloo AUX), Photokeratoscope apparatus and method.
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  44. Terry Clifford (7087 Columbus Anaheim CA 92807), Surgical microscope system.
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  45. Jongsma Franciscus H. M. (Ulestraten NLX), System for determining the topography of a curved surface.
    상세보기
  46. Gersten Martin (Brooklyn NY) Mammone Richard J. (North Brunswick NJ) Zelvin Joseph L. (Larchmont NY), System for topographical modeling of anatomical surfaces.
    상세보기
  47. Labinger Richard (Trumbull CT) Macri Timothy F. (Trumbull CT) Yoder ; Jr. Paul R. (Wilton CT) Valovich David J. (Bridgeport CT), Topography measuring apparatus.
    상세보기
  48. Yoder ; Jr. Paul R. (Wilton CT), Topography measuring apparatus.
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  49. Safir Aran (3 Ellsworth Ave. Cambridge MA 02139), Visual vertex finder.
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이 특허를 인용한 특허 (24)

  1. Lai, Shui T.; Dreher, Andreas, Apparatus and method for determining objective refraction using wavefront sensing.
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  2. Campbell, Charles E., Combined wavefront and topography systems and methods.
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  3. Dreher, Andreas W., Eyeglass manufacturing method using variable index layer.
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  4. Dreher, Andreas W., Eyeglass manufacturing method using variable index layer.
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  5. Dreher, Andreas W., Eyeglass manufacturing method using variable index layer.
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  6. Dreher, Andreas W., Eyeglass manufacturing method using variable index layer.
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  7. Dreher, Andreas W., Eyeglass manufacturing method using variable index layer.
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  8. Dreher,Andreas W., Eyeglass manufacturing method using variable index layer.
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  9. Dreher,Andreas W., Eyeglass manufacturing method using variable index layer.
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  10. Dreher,Andreas W., Eyeglass manufacturing method using variable index layer.
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  11. Dreher, Andreas W., Improving vision in macular degeneration patients.
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  12. Lai,Shui T.; Dreher,Andreas W., Method for determining objective refraction using wavefront sensing.
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  13. Farrer, Stephen W.; Raymond, Thomas D.; Xiong, Wei; Dixson, John; Neal, Daniel R., Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots.
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  14. Raymond, Thomas D.; Dixson, John G.; Farrer, Stephen W.; Xiong, Wei; Neal, Daniel R., Method of qualifying light spots for optical measurements and measurement instrument employing method of qualifying light spots.
    상세보기
  15. Campbell, Charles E.; Farrer, Stephen W.; Neal, Daniel R.; Powers, William S.; Raymond, Thomas D., System and method for measuring corneal topography.
    상세보기
  16. Horwitz, Larry S., System and method for wavefront measurement.
    상세보기
  17. Horwitz,Larry S., System and methods for wavefront measurement.
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  18. Blum, Ronald D.; Duston, Dwight P.; Katzman, Dan, System, apparatus and method for correcting vision with an adaptive optic.
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  19. Blum, Ronald D.; Duston, Dwight P.; Katzman, Dan, System, apparatus and method for correcting vision with an adaptive optic.
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  20. Blum, Ronald D.; Duston, Dwight P.; Katzman, Dan, System, apparatus and method for correcting vision with an adaptive optic.
    상세보기
  21. Farrer, Stephen W.; Copland, James; Raymond, Thomas D.; Xiong, Wei, Systems and methods for measuring surface shape.
    상세보기
  22. Farrer, Stephen W; Copland, James; Raymond, Thomas D; Xiong, Wei, Systems and methods for measuring surface shape.
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  23. Campbell, Charles E.; Farrer, Stephen W.; Neal, Daniel R.; Powers, William S.; Raymond, Thomas D.; Copland, James, Systems and methods for measuring the shape and location of an object.
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  24. Horwitz,Larry S., Systems and methods for wavefront measurement.
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