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Abrasive articles comprising a fluorochemical agent for wafer surface modification 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/302
출원번호 US-0933870 (1997-09-19)
발명자 / 주소
  • Messner Robert P.
  • Kessel Carl R.
  • Moore George G.
출원인 / 주소
  • 3M Innovative Properties Company
대리인 / 주소
    Pastirik
인용정보 피인용 횟수 : 95  인용 특허 : 52

초록

This invention relates to fixed abrasive articles and abrasive constructions containing at least one fluorochemical agent. The fixed abrasive articles and abrasive constructions are used in semiconductor wafer surface modification processes during the fabrication of semiconductor devices. Specifical

대표청구항

[ We claim:] [1.] A fixed abrasive article comprising a fluorochemical agent for the modification of a surface of a semiconductor wafer, comprising:(a) three-dimensional abrasive composites, each composite comprising a plurality of abrasive particles fixed and dispersed in a binder providing a textu

이 특허에 인용된 특허 (52)

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  3. Calhoun Clyde D. (Stilwater MN), Abrasive article having precise lateral spacing between abrasive composite members.
  4. Hibbard Louis D. (Eagan MN) Collins Stanley B. (White Bear Lake MN) Haas John D. (Woodbury MN), Abrasive article, a process of making same, and a method of using same to finish a workpiece surface.
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  11. Hyde Thomas C. (Chandler AZ) Roberts John V. H. (Newark DE), Apparatus for interlayer planarization of semiconductor material.
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  13. Harmer Walter L. (Arden Hills MN) DeVoe Robert J. (Oakdale MN) Larson Eric G. (Lake Elmo MN) Kincaid Don H. (Hudson WI) Willett Peggy S. (Stillwater MN) Williams Jerry W. (Cottage Grove MN), Coated abrasive article and method of making same.
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