$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Slurries for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods and apparatuses for making and using such slurries 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/306
출원번호 US-0144536 (1998-08-31)
발명자 / 주소
  • Robinson Karl M.
  • Andreas Michael
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Coie LLP
인용정보 피인용 횟수 : 66  인용 특허 : 9

초록

Slurries used in the manufacturing of microelectronic devices, and apparatuses and methods for making and using such slurries. In one aspect of the invention, a planarizing slurry for planarizing a microelectronic-device substrate assembly is made by fracturing agglomerations of abrasive particles i

대표청구항

[ What is claimed is:] [1.] In the manufacturing of microelectronic devices, a method of making a planarizing slurry, the method comprising:fracturing agglomerations of abrasive particles in a first solution comprising a liquid and the abrasive particles by imparting a mechanical energy to the first

이 특허에 인용된 특허 (9)

  1. Ueda Kazumasa (Niihama JPX) Takeuchi Yoshiaki (Niihama JPX), Abrasive particle, method for producing the same, and method of use of the same.
  2. Yu Chris C. (Austin TX) Yu Tat-Kwan (Austin TX) Klein Jeffrey L. (Austin TX), Acoustically regulated polishing process.
  3. Danielson Donald D. (Aloha OR) Feller Allen D. (Portland OR) Cadien Kenneth C. (Portland OR), Chemical mechanical polishing slurry delivery and mixing system.
  4. Neville Matthew (Champaign IL) Fluck David J. (Pesotum IL) Hung Cheng-Hung (Champaign IL) Lucarelli Michael A. (Mattoon IL) Scherber Debra L. (Orangevale CA), Chemical mechanical polishing slurry for metal layers.
  5. Sato Junichi (Tokyo JPX), Chemical-mechanical polishing method and apparatus using ultrasound applied to the carrier and platen.
  6. Yu Chris C. (Irvine CA) Yu Tat-Kwan (Austin TX), Chemical-mechanical-polishing pad cleaning process for use during the fabrication of semiconductor devices.
  7. Harato Takuo (Tokyo JPX) Furubayashi Toshiki (Niihama JPX) Ashitani Toshio (Niihama JPX) Ogawa Toru (Niihama JPX), Process for preparation of alumina.
  8. Jerbic Chris (Fremont CA), Ultrasonic energy enhanced chemi-mechanical polishing of silicon wafers.
  9. Andreas Michael T., Ultrasonic processing of chemical mechanical polishing slurries.

이 특허를 인용한 특허 (66)

  1. Taylor, Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  2. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  3. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  4. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  5. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  6. Taylor, Theodore M., Apparatus and method for enhanced processing of microelectronic workpieces.
  7. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  8. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  9. Agarwal,Vishnu K., Apparatuses and methods for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  10. Agarwal,Vishnu K.; Chopra,Dinesh, Apparatuses for forming a planarizing pad for planarization of microlectronic substrates.
  11. Agarwal,Vishnu K., Apparatuses for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  12. Doan, Trung T., Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers and other microelectronic substrates.
  13. Suzuki, Yosuke, Manufacturing method of a glass substrate for a magnetic disk.
  14. Sabde, Gundu M.; Hofmann, James J.; Joslyn, Michael J.; Lee, Whonchee, Method and apparatus for chemical-mechanical planarization of microelectronic substrates with selected planarizing liquids.
  15. Chopra, Dinesh; Meikle, Scott G., Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates.
  16. Chopra, Dinesh; Meikle, Scott G., Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates.
  17. Meikle, Scott G., Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates.
  18. Meikle,Scott G., Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates.
  19. Meikle,Scott G., Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates.
  20. Kramer, Stephen J.; Joslyn, Michael J., Method and apparatus for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  21. Kramer,Stephen J.; Joslyn,Michael J., Method and apparatus for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  22. Moore, Scott E., Method and apparatus for supporting a microelectronic substrate relative to a planarization pad.
  23. Moore,Scott E., Method and apparatus for supporting a microelectronic substrate relative to a planarization pad.
  24. Guy F. Hudson, Method and apparatuses for making and using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies.
  25. Hudson, Guy F., Method and apparatuses for making and using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies.
  26. Sabde, Gundu M.; Lee, Whonchee, Method and apparatuses for planarizing microelectronic substrate assemblies.
  27. Yune, Ji Hyung, Method for fabricating a semiconductor device.
  28. Agarwal, Vishnu K.; Chopra, Dinesh, Method for forming a planarizing pad for planarization of microelectronic substrates.
  29. Kramer,Stephen J.; Joslyn,Michael J., Method for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  30. Yang Ming-Sheng,TWX ; Peng Peng-Yih,TWX ; Chang Chia-Jui,TWX ; Wu Juan-Yuan,TWX, Method of mixing slurries.
  31. Marshall, Brian, Methods and apparatuses for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates.
  32. Marshall, Brian, Methods and apparatuses for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates.
  33. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical mechanical planarization of microelectronic substrates.
  34. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  35. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  36. Blalock,Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  37. Sabde, Gundu M.; Lee, Whonchee, Methods and apparatuses for planarizing microelectronic substrate assemblies.
  38. Sabde,Gundu M.; Lee,Whonchee, Methods and apparatuses for planarizing microelectronic substrate assemblies.
  39. Sabde,Gundu M.; Lee,Whonchee, Methods and apparatuses for planarizing microelectronic substrate assemblies.
  40. Lu, Jin, Methods and apparatuses for removing polysilicon from semiconductor workpieces.
  41. Elledge, Jason B., Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  42. Elledge,Jason B., Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  43. Elledge,Jason B., Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  44. Marshall,Brian, Methods for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates.
  45. Taylor,Theodore M.; Kramer,Stephen J., Methods for removing doped silicon material from microfeature workpieces.
  46. Hudson,Guy F., Methods for using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies.
  47. Moore, Scott E., Planarizing machines and control systems for mechanical and/or chemical-mechanical planarization of microelectronic substrates.
  48. Joslyn, Michael J., Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces.
  49. Joslyn,Michael J., Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces.
  50. Wright, David Q., Planarizing machines and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  51. Agarwal, Vishnu K.; Chopra, Dinesh, Planarizing pads for planarization of microelectronic substrates.
  52. Dapeng Wang, Planarizing pads, planarizing machines and methods for making and using planarizing pads in mechanical and chemical-mechanical planarization of microelectronic device substrate assemblies.
  53. Taylor, Theodore M.; Chandrasekaran, Nagasubramaniyan, Planarizing solutions including abrasive elements, and methods for manufacturing and using such planarizing solutions.
  54. Taylor,Theodore M.; Chandrasekaran,Nagasubramaniyan, Planarizing solutions including abrasive elements, and methods for manufacturing and using such planarizing solutions.
  55. Karl M. Robinson ; Scott G. Meikle, Planarizing solutions, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  56. Robinson, Karl M.; Meikle, Scott G., Planarizing solutions, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  57. Robinson, Karl M.; Meikle, Scott G., Planarizing solutions, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  58. Robinson,Karl M.; Meikle,Scott G., Planarizing solutions, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  59. Grumbine,Steven K, Polishing composition storage container.
  60. Naik, Sujit, Polishing liquids for activating and/or conditioning fixed abrasive polishing pads, and associated systems and methods.
  61. Naik,Sujit, Polishing liquids for activating and/or conditioning fixed abrasive polishing pads, and associated systems and methods.
  62. Andreas, Michael T., Post-planarization clean-up.
  63. Andreas, Michael T., Post-planarization clean-up.
  64. Andreas,Michael T., Post-planarization clean-up.
  65. Steven L. Peace ; Paul Z. Wirth ; Eric Lund, Reactor for processing a workpiece using sonic energy.
  66. Klein, Rita J., System for planarizing microelectronic substrates having apertures.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로