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Method and apparatus for positioning a member relative to an object surface 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01C-003/08
출원번호 US-0465650 (1995-06-05)
발명자 / 주소
  • Pryor Timothy R.,CAX
  • Hockley Bernard,CAX
  • Liptay-Wagner Nick,CAX
  • Hageniers Omer L.,CAX
  • Pastorius Walter J.,CAX
출원인 / 주소
  • Diffracto Ltd., CAX
대리인 / 주소
    Larson & Taylor
인용정보 피인용 횟수 : 6  인용 특허 : 28

초록

A method and apparatus for positioning a member in a desired position relative to a surface of an object including providing positioning means for positioning the member, sensing the attitude of the object surface relative to the member or the positioning means using a non-contact sensing means, the

대표청구항

[ What is claimed is:] [1.] Apparatus for positioning a member in a desired position relative to a surface of an object comprising:positioning means for positioning a member,non-contact sensing means to sense the attitude of said object surface relative to one of said member and said positioning mea

이 특허에 인용된 특허 (28)

  1. Bamberg Jack A. (Boulder CO) Bucher Hans R. (Boulder CO) Bultena John G. (Boulder CO), Active sensor automatic range sweep technique.
  2. Davis ; Jr. Ray E. (Black River NY) Becker Richard J. (Watertown NY) Foster Robert G. (Brownville NY) Westkamper Michael J. (Clinton CT), Automatic glass blowing apparatus and method.
  3. Hosoe Kazuya (Machida JPX) Niwa Yukichi (Yokohama JPX) Tsunekawa Tokuichi (Yokohama JPX) Owada Mitsutoshi (Yokohama JPX) Asano Noriyuki (Kawasaki JPX) Masunaga Makoto (Tokyo JPX), Device for focus detection or distance detection.
  4. Rasberger Michael (Riehen CHX), Dioxaphosphepines.
  5. Lowrey ; Jr. Orvey P. (Madison CT) Molden Frederick P. (Manchester CT) Waters James P. (Rockville CT), Gauging surfaces by remotely tracking multiple images.
  6. Hewitt Larry E. (Vermilion OH) Popovich David T. (Lorain OH), Golf ball.
  7. Pentecost Eugene E. (Anaheim CA), Integrated automatic ranging device for optical instruments.
  8. Nosler John C. (2587 Floral Hill Dr. Eugene OR 97403), Linear array signal processing circuitry for locating the midpoint of a source of light.
  9. Ueda Hirotada (San Jose CA) Yasue Toshikazu (Hachioji JPX) Uno Takeshi (Sayama JPX), Mark detecting system using image pickup device.
  10. Chasson Leon H. (Los Altos Hills CA), Method and apparatus for automatically processing a workpiece employing calibrated scanning.
  11. Michaud Jimmie A. (Bellbrook OH), Method and apparatus for determining the position of a body.
  12. Pryor Timothy R. (Windsor CAX) Hockley Bernard (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining dimension, location and altitude of objects.
  13. Pryor Timothy R. (Windsor CAX) Hockley Bernard (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining the dimension, location and attitude of objects.
  14. Pryor Timothy R. (Windsor CAX) Hockley Bernard S. (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining the dimension, location and attitude of objects.
  15. Pryor Timothy R. (Windsor CAX) Hockley Bernard (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining the dimension, location and attitude of objects including light s.
  16. Laliotis Theodore A. (Los Altos CA), Method and apparatus for measuring dimensions.
  17. Pryor Timothy R. (all Windsor CAX) Hockley Bernard (all Windsor CAX) Liptay-Wagner Nick (all Windsor CAX) Hageniers Omer L. (all Windsor CAX) Pastorius W. J. (all Windsor CAX), Method and apparatus utilizing an orientation code for automatically guiding a robot.
  18. Shimizu Ken-Ichi (Tokorozawa JPX) Ikeya Chuji (Higashi-Murayama JPX), Method for measurement of displacement of moving body by use of target mark and apparatus therefor.
  19. Suzuki Etsuji (Yokohama JPX) Yasue Itaru (Yokohama JPX) Kashihama Tomio (Yokohama JPX), Method of positioning a semiconductor member by examining it and a die bonding apparatus using the same.
  20. Hutchins ; IV Thomas B. (310 NW. Brynwood Lane Portland OR 97229), Noncontacting method and apparatus for monitoring the speed and travel of a moving article.
  21. Raber Peter E. (Milford CT) Gordon Jason M. (Katonah NY), Optical inspection system employing spherical mirror.
  22. Harris David E. (Columbus OH), Optical triangulation gauging system.
  23. Nihonmatsu Takashi (Nagano JPX), Optoelectric multi-sensor measuring apparatus and a method for measuring surface flatness therewith.
  24. Chen Richard M. (51-25 Goldsmith St. Elmhurst NY 11373), Orientation and control system for robots.
  25. Lemelson Jerome H. (85 Rector St. Metuchen NJ 08840), Position indicating system and methods.
  26. Wagner Herbert A. (Corona Del Mar CA), Railroad track profile spacing and alignment apparatus.
  27. Kirsch Jerry (36 Beacon Hill Grosse Pointe Farms MI 48236) Kirsch Kerry F. (36 Beacon Hill Grosse Pointe Farms MI 48236), Rotary video article centering, orienting and transfer device for computerized electronic operating systems.
  28. Birk John R. (Peacedale RI) Kelley Robert B. (Kingston RI) Seres David A. (Newark DE), System for visually determining position in space and/or orientation in space and apparatus employing same.

이 특허를 인용한 특허 (6)

  1. Oka, Kiyoshi; Obara, Kenjiro; Tada, Eisuke; Takahashi, Satoru, Baseline length variable surface geometry measuring apparatus and range finder.
  2. Wolters, Christian; Petrenko, Aleksey; Haller, Kurt L.; Reich, Juergen; Xu, Zhiwei; Biellak, Stephen; Kren, George, Illumination energy management in surface inspection.
  3. Wolters, Christian; Petrenko, Aleksey; Haller, Kurt L.; Reich, Juergen; Xu, Zhiwei; Biellak, Stephen; Kren, George, Illumination energy management in surface inspection.
  4. McGraw, Julie M., Method for reestablishing holes in a component.
  5. Xu, Yiping; Abdulhalm, Ibrahim, Spectroscopic scatterometer system.
  6. Bareket, Noah; Wack, Daniel C.; Zhao, Guoheng, System for measuring a sample with a layer containing a periodic diffracting structure.
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