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Integrated wafer fab time standard (machine tact) database 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06G-007/48
출원번호 US-0941831 (1997-10-01)
발명자 / 주소
  • Chacon Guillermo Rudolfo
출원인 / 주소
  • Sony Electronics, Inc.
대리인 / 주소
    Kananen
인용정보 피인용 횟수 : 86  인용 특허 : 3

초록

An integrated wafer fab production characterization and scheduling system incorporates a manufacturing execution system with a scheduling system based on simulation. The integrated characterization/scheduling system provides manufacturing with a simulation tool integrated with the manufacturing exec

대표청구항

[ What is claimed is:] [1.] A modeling and manufacturing execution system comprising:said manufacturing execution system for automatically controlling routing of product lots and production inputs in said manufacturing production line based on a production scheduling model, wherein feedback data fro

이 특허에 인용된 특허 (3)

  1. Chi Keh-Fei Chris,SGX, Fuzzy logic method and system for adjustment of priority rating of work in process in a production line.
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  3. Saka Nobuo (Ishikawa JPX) Oda Junichi (Ishikawa JPX) Kajihara Kazuyuki (Ishikawa JPX) Ishiyama Yasuaki (Ishikawa JPX), Versatile production system and method of operating same.

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