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Apparatus and method for drying solid articles 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F26B-005/04
출원번호 US-0312075 (1999-05-15)
발명자 / 주소
  • Bettcher Dean
  • Kubinski Christopher
출원인 / 주소
  • Kubinski
  • Christopher
대리인 / 주소
    Chaikin
인용정보 피인용 횟수 : 60  인용 특허 : 10

초록

Disclosed herein is an apparatus and method for drying solid articles such as semiconductor wafers. In one embodiment, the dryer comprises a process tank and a drying fluid supply system. The process tank includes a plurality spray nozzles to spray a non-flammable drying fluid to wet surfaces of the

대표청구항

[ What is claimed is:] [19.] A method of drying solid articles including the steps offixing the articles to be dried in a process tank;applying a drying fluid by spraying to the articles in the process tank, wherein the drying fluid including a drying agent of HFE and a surfactant of an alcohol base

이 특허에 인용된 특허 (10)

  1. Nam Chang-Hyun,KRX ; Ko Yong-Sun,KRX, Apparatus for drying semiconductor wafers using isopropyl alcohol.
  2. Ferrell Gary W. ; Elson Robert J. ; Schipper John F., Chemical drying and cleaning system.
  3. Schaal Ulrich (Konstanz DEX), Dry-cleaning apparatus permitting use of ignitable or potentially explosive solvents.
  4. Ikeda Tomohiko (Kusatsu JPX) Sakamoto Toshiaki (Shiga JPX), Drying machine.
  5. Ichiko Ikuhiro,JPX ; Watanabe Kazutoshi,JPX, Drying method and drying equipment.
  6. Turner Virgil Q. (Sugarland TX) Light William D. (Richmond TX) Trevino Hilario T. (Needville TX) Guldi Richard L. (Dallas TX) Poag Frank (Plano TX) Paradis Douglas E. (Richardson TX), Enhanced cleansing process for wafer handling implements.
  7. Sugiura Masamichi (Toyokawa JPX), Image reader having electrical and optical means for varying magnification.
  8. Yamada Kiyomi (Nagoya JPX) Hagiwara Haruo (Nagoya JPX) Takagi Nobuharu (Nagoya JPX) Tsukamoto Hideo (Nagoya JPX) Tsubaki Yasuhiro (Nagoya JPX) Hattori Toshio (Nagoya JPX), Method and apparatus for dry cleaning as well as method and device for recovery of solvent therein.
  9. Florez Barry K., Method of rinsing and drying semiconductor wafers in a chamber with a movable side wall.
  10. Kamikawa Yuuji (Kumamoto JPX), Substrate drying apparatus.

이 특허를 인용한 특허 (60)

  1. Park, Su-Chan; Im, Ye-Hoon; Min, Kyoung-Hoon, Air knife chamber including blocking member.
  2. Mehmandoust, Yassin, Apparatus and method for drying a substrate using hydrophobic and polar organic compounds.
  3. Yokomizo,Kenji, Apparatus and method of securing a workpiece during high-pressure processing.
  4. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of a workpiece.
  5. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of multiple workpieces.
  6. Kim, Ki-Hyun; Im, Ki-Vin; Choi, Hoon-Sang; Han, Moon-Hyeong, Atomic layer deposition apparatus.
  7. Kim, Ki-Hyun; Im, Ki-Vin; Choi, Hoon-Sang; Han, Moon-Hyeong, Atomic layer deposition apparatus.
  8. Nomura, Michinao; Kubo, Mitsuru; Fukasawa, Chujiro, Cleaning/drying apparatus and cleaning/drying method.
  9. Jones,William Dale, Control of fluid flow in the processing of an object with a fluid.
  10. Arena Foster,Chantal J.; Awtrey,Allan Wendell; Ryza,Nicholas Alan; Schilling,Paul, Developing photoresist with supercritical fluid and developer.
  11. Arena-Foster, Chantal J.; Awtrey, Allan Wendell; Ryza, Nicholas Alan; Schilling, Paul, Developing photoresist with supercritical fluid and developer.
  12. Arena-Foster, Chantal J.; Awtrey, Allan Wendell; Ryza, Nicholas Alan; Schilling, Paul, Drying resist with a solvent bath and supercritical CO2.
  13. Sheydayi,Alexei; Sutton,Thomas, Gate valve for plus-atmospheric pressure semiconductor process vessels.
  14. Fukuoka, Tetsuo; Akimoto, Masami; Kitano, Takahiro; Kimura, Yoshio; Hayashi, Shinichi; Ito, Hikaru, Heating apparatus, and coating and developing apparatus.
  15. Sutton, Thomas R.; Biberger, Maximilan A., High pressure compatible vacuum chuck for semiconductor wafer including lift mechanism.
  16. Jones, William D., High pressure fourier transform infrared cell.
  17. Biberger, Maximilian A.; Layman, Frederick Paul; Sutton, Thomas Robert, High pressure processing chamber for semiconductor substrate.
  18. Biberger,Maximilian A.; Layman,Frederick Paul; Sutton,Thomas Robert, High pressure processing chamber for semiconductor substrate.
  19. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  20. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  21. Sheydayi,Alexei, Method and apparatus for clamping a substrate in a high pressure processing system.
  22. Jih-Churng Twu TW; Ming-Dar Guo TW; Yu-Chien Hsiao TW; Chia-Chun Cheng TW, Method and apparatus for drying wafers after wet bench.
  23. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method and apparatus for supercritical processing of multiple workpieces.
  24. Parent,Wayne M.; Goshi,Gentaro, Method and system for cooling a pump.
  25. Parent,Wayne M., Method and system for determining flow conditions in a high pressure processing system.
  26. Parent, Wayne M.; Geshell, Dan R., Method and system for passivating a processing chamber.
  27. Hansen,Brandon; Lowe,Marie, Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid.
  28. Kawamura,Kohei; Asano,Akira; Miyatani,Koutarou; Hillman,Joseph T.; Palmer,Bentley, Method for supercritical carbon dioxide processing of fluoro-carbon films.
  29. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method for supercritical processing of multiple workpieces.
  30. Biberger, Maximilian A.; Schilling, Paul E., Method of depositing metal film and metal deposition cluster tool including supercritical drying/cleaning module.
  31. Biberger,Maximilian A.; Schilling,Paul E., Method of depositing metal film and metal deposition cluster tool including supercritical drying/cleaning module.
  32. Hillman,Joseph, Method of inhibiting copper corrosion during supercritical COcleaning.
  33. Toma,Dorel Ioan; Schilling,Paul, Method of passivating of low dielectric materials in wafer processing.
  34. Biberger,Maximilian Albert; Layman,Frederick Paul; Sutton,Thomas Robert, Method of supercritical processing of a workpiece.
  35. Schilling,Paul, Method of treating a composite spin-on glass/anti-reflective material prior to cleaning.
  36. Schilling,Paul, Method of treatment of porous dielectric films to reduce damage during cleaning.
  37. Sheydayi,Alexei, Non-contact shuttle valve for flow diversion in high pressure systems.
  38. Sheydayi,Alexei, Pressure energized pressure vessel opening and closing device and method of providing therefor.
  39. Wuester,Christopher D., Process flow thermocouple.
  40. Mullee,William H.; de Leeuwe,Marc; Roberson, Jr.,Glenn A.; Palmer,Bentley J., Removal of CMP and post-CMP residue from semiconductors using supercritical carbon dioxide process.
  41. Bertram, Ronald Thomas; Scott, Douglas Michael, Removal of contaminants from a fluid.
  42. Mullee, William H., Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process.
  43. Stein, Nathan D.; Achkire, Younes; Franklin, Timothy J.; Svirchevski, Julia; Marohl, Dan A., Single wafer apparatus for drying semiconductor substrates using an inert gas air-knife.
  44. Nam, Chang-Hyeon; Lee, Seung-Kun, Substrate dryer and a drying method.
  45. Tanaka, Hiroshi; Nakao, Hidetoshi; Shindo, Naoki; Yamashita, Atushi; Hirayama, Tsukasa; Tsurusaki, Kotaro, Substrate drying processing apparatus, method, and program recording medium.
  46. Yang, Jen-Yuan, Substrate drying system.
  47. Matsushita, Jun; Miyamoto, Takashi; Hayashi, Konosuke; Yamazaki, Osamu, Substrate processing apparatus and substrate processing method.
  48. Miyagi, Masahiro; Fujikawa, Kazunori, Substrate processing apparatus and substrate processing method.
  49. Ohno, Hiroki; Sekiguchi, Kenji, Substrate processing apparatus and substrate processing method.
  50. Heiko D Moritz ; Jonathan A. Talbott ; Mohan Chandra ; James A. Tseronis ; Ijaz Jafri, Supercritical fluid drying system and method of use.
  51. Gale,Glenn; Hillman,Joseph T.; Jacobson,Gunilla; Palmer,Bentley, System and method for processing a substrate using supercritical carbon dioxide processing.
  52. Christenson,Kurt Karl; Lee,Nam Pyo; Michalko,Gary William; Rathman,Christina Ann, Transition flow treatment process and apparatus.
  53. Jacobson,Gunilla; Yellowaga,Deborah, Treatment of a dielectric layer using supercritical CO.
  54. Kevwitch, Robert, Treatment of substrate using functionalizing agent in supercritical carbon dioxide.
  55. Sheydayi,Alexei, Vacuum chuck utilizing sintered material and method of providing thereof.
  56. Hanawa, Yosuke; Miya, Katsuhiko, Vapor supplying apparatus, vapor drying apparatus, vapor supplying method, and vapor drying method.
  57. Ferrell,Gary W.; Ratra,Jagjit S., Wafer dryer and method for drying a wafer.
  58. Tice, Scott, Wafer dryer apparatus and method.
  59. Bae, Jeong-Yong; Yoon, Chang-Ro; Park, Pyeng-Jae, Wafer drying apparatus.
  60. Kim, Tae-Ho; Hong, Dong-Kwan; Kang, Nung-Suck, Wafer drying apparatus.
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