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Ion beam milling to generate custom reticles 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G03F-009/00
  • G23C-014/00
출원번호 US-0229710 (1999-01-13)
발명자 / 주소
  • May Charles E.
  • Goodwin Thomas J.
출원인 / 주소
  • Advanced Micro Devices, Inc.
대리인 / 주소
    Honeycutt
인용정보 피인용 횟수 : 56  인용 특허 : 5

초록

Various methods of fabricating a reticle are provided. In one aspect, a pattern of opaque structures is formed on a plate capable of transmitting electromagnetic radiation. Adjacently positioned angled surfaces of the opaque structures are identified. Preselected portions of the opaque structures th

대표청구항

[ What is claimed is:] [1.] A method of fabricating a reticle, comprising the steps of:forming a pattern of opaque structures on a plate capable of transmitting electromagnetic radiation;identifying an interior corner of one of the opaque structures, an exterior corner of another of the opaque struc

이 특허에 인용된 특허 (5)

  1. Lee Fourmun (Chandler AZ) Zirkle Thomas E. (Tempe AZ), Chromeless phase-shift mask and method for making.
  2. Dao Giang T. (Fremont CA), Layout methodology, mask set, and patterning method for phase-shifting lithography.
  3. Kawata Shintaro,JPX, Manufacturing method for mask for charged-particle-beam transfer or mask for x-ray transfer.
  4. Capodieci Luigi, Modification of mask layout data to improve writeability of OPC.
  5. Lee Jun Seok,KRX, Optical proximity correction mask for semiconductor device fabrication.

이 특허를 인용한 특허 (56)

  1. Ma, Melody W.; Liu, Hua-Yu, Alleviating line end shortening by extending phase shifters.
  2. Ma, Melody W.; Liu, Hua-Yu, Alleviating line end shortening in transistor endcaps by extending phase shifters.
  3. Liu, Hua-Yu; Pierrat, Christophe; Richardson, Kent, Alternating phase shift mask design conflict resolution.
  4. Liu,Hua Yu; Pierrat,Christophe; Richardson,Kent, Alternating phase shift mask design conflict resolution.
  5. Liu, Hua-Yu, Automated flow in PSM phase assignment.
  6. Pierrat, Christophe, Blank for alternating PSM photomask with charge dissipation layer.
  7. Wang, Yao-Ting; Richardson, Kent; Wu, Shao-Po; Pierrat, Christophe; Sanie, Michael, Conflict sensitive compaction for resolving phase-shift conflicts in layouts for phase-shifted features.
  8. Pierrat,Christophe, Critical dimension control using full phase and trim masks.
  9. Pierrat, Christophe; C?t?, Michel Luc, Cutting patterns for full phase shifting masks.
  10. Côté, Michel Luc; Pierrat, Christophe, Design and layout of phase shifting photolithographic masks.
  11. Cote,Michel L.; Pierrat,Christophe, Design and layout of phase shifting photolithographic masks.
  12. Cote,Michel L.; Pierrat,Christophe, Design and layout of phase shifting photolithographic masks.
  13. C?t?, Michel L.; Pierrat, Christophe, Design data format and hierarchy management for phase processing.
  14. Pierrat, Christophe; C?t?, Michel Luc, Exposure control for phase shifting photolithographic masks.
  15. Pierrat, Christophe; Cote, Michel Luc, Exposure control for phase shifting photolithographic masks.
  16. Pierrat,Christophe; Cote,Michel Luc, Exposure control for phase shifting photolithographic masks.
  17. Wu, Shao-Po; Cho, Seonghun; Chou, Yu-Yu, Facilitating an adjustable level of phase shifting during an optical lithography process for manufacturing an integrated circuit.
  18. Tabery, Cyrus E.; Rangarajan, Bharath; Singh, Bhanwar; Subramanian, Ramkumar, Feed forward process control using scatterometry for reticle fabrication.
  19. Pierrat, Christophe, Full phase shifting mask in damascene process.
  20. Pierrat, Christophe, Full phase shifting mask in damascene process.
  21. Pierrat, Christophe, Full phase shifting mask in damascene process.
  22. Cote, Michel L.; Pierrat, Christophe, Handling of flat data for phase processing including growing shapes within bins to identify clusters.
  23. C��t��,Michel Luc; Pierrat,Christophe, Handling of flat data for phase processing including growing shapes within bins to identify clusters.
  24. Wu, Shao-Po; Wang, Yao-Ting, Incrementally resolved phase-shift conflicts in layouts for phase-shifted features.
  25. Wu, Shao-Po; Wang, Yao-Ting, Incrementally resolved phase-shift conflicts in layouts for phase-shifted features.
  26. Wu,Shao Po; Wang,Yao Ting, Incrementally resolved phase-shift conflicts in layouts for phase-shifted features.
  27. Liu, Hua-Yu, Method and apparatus for allowing phase conflicts in phase shifting mask and chromeless phase edges.
  28. Cho, Seonghun; Wu, Shao-Po, Method and apparatus for reducing color conflicts during trim generation for phase shifters.
  29. Kling, Michael E.; Liu, Hua-Yu, Method and apparatus for reducing incidental exposure by using a phase shifter with a variable regulator.
  30. Wu, Shao-Po; Cho, Seonghun; Arkhipov, Alexandre; Grishashvili, Ilya, Method and apparatus for resolving coloring conflicts between phase shifters.
  31. Cho, Seonghun; Wu, Shao-Po, Method and apparatus for using phase shifter cutbacks to resolve phase shifter conflicts.
  32. Sezginer,Abdurrahman, Method and apparatus of model-based photomask synthesis.
  33. Veerasamy, Vijayen S.; Petrmichl, Rudolph Hugo, Method of ion beam milling a glass substrate prior to depositing a coating system thereon, and corresponding system for carrying out the same.
  34. Vijayen S. Veerasamy ; Rudolph Hugo Petrmichl, Method of ion beam milling substrate prior to depositing diamond like carbon layer thereon.
  35. Thomsen, Scott V.; Petrmichl, Rudolph Hugo; Veerasamy, Vijayen S.; Longobardo, Anthony V.; Luten, Henry A.; Hall, Jr., David R., Method of manufacturing window using ion beam milling of glass substrate(s).
  36. Pierrat, Christophe, Model-based data conversion.
  37. Pierrat,Christophe, Model-based data conversion.
  38. Manoo, Masoud, Modifying a hierarchical representation of a circuit to process composite gates.
  39. Pierrat, Christophe; Cote, Michel Luc, Optical proximity correction for phase shifting photolithographic masks.
  40. Pierrat,Christophe; C척t챕,Michel Luc, Phase conflict resolution for photolithographic masks.
  41. Pierrat,Christophe; C?t?,Michel Luc, Phase conflict resolution for photolithographic masks.
  42. Pierrat, Christophe, Phase shift mask including sub-resolution assist features for isolated spaces.
  43. Pierrat, Christophe, Phase shift mask including sub-resolution assist features for isolated spaces.
  44. Pierrat, Christophe, Phase shift mask layout process for patterns including intersecting line segments.
  45. Pierrat, Christophe, Phase shift mask sub-resolution assist features.
  46. Pierrat, Christophe, Phase shift masking for "double-T" intersecting lines.
  47. Pierrat, Christophe, Phase shift masking for complex patterns.
  48. Pierrat, Christophe, Phase shift masking for complex patterns with proximity adjustments.
  49. Pierrat,Christophe, Phase shift masking for complex patterns with proximity adjustments.
  50. Pierrat, Christophe, Phase shift masking for intersecting lines.
  51. Pierrat, Christophe; Cote, Michel Luc, Phase shifting design and layout for static random access memory.
  52. Wu, Shao-Po; Cho, Seonghun; Wang, Yao-Ting, Resolving phase-shift conflicts in layouts using weighted links between phase shifters.
  53. Wu,Shao Po; Cho,Seonghun; Wang,Yao Ting, Resolving phase-shift conflicts in layouts using weighted links between phase shifters.
  54. C척t챕,Michel L.; Pierrat,Christophe, Standard cell design incorporating phase information.
  55. Kling, Michael E.; Liu, Hua-Yu, Using double exposure effects during phase shifting to control line end shortening.
  56. Pierrat, Christophe, Using second exposure to assist a PSM exposure in printing a tight space adjacent to large feature.
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