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Method for creating diffusion areas for sources and drains without an etch step 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/8247
출원번호 US-0245811 (1999-02-04)
발명자 / 주소
  • Eitan Boaz,ILX
  • Rotstein Israel,ILX
출원인 / 주소
  • Tower Semiconductors Ltd., ILX
대리인 / 주소
    Skjerven Morrill MacPherson LLPMacPherson
인용정보 피인용 횟수 : 44  인용 특허 : 7

초록

A method for manufacturing a memory array having a plurality of memory cells thereon and diffusion areas therebetween includes the steps of laying down a layer of silicon nitride, defining the diffusion areas and creating diffusion oxides over the diffusion areas. Both steps of laying down and defin

대표청구항

[ We claim:] [1.] A method for manufacturing a memory array having a plurality of memory cells thereon and diffusion areas therebetween, said memory cells having silicon nitride therein, the method comprising the steps of:laying down a layer of silicon nitride;defining said diffusion areas without e

이 특허에 인용된 특허 (7)

  1. Woo Been-Jon (Saratoga CA) Holler Mark A. (Palo Alto CA), Method for improving erase characteristics of buried bit line flash EPROM devices without using sacrificial oxide growth.
  2. Hakozaki Kenji (Tenri JPX) Sato Shin-ichi (Nara JPX), Method for producing a floating gate memory device including implanting ions through an oxidized portion of the silicon.
  3. Ghneim Said N. ; Fulford ; Jr. H. Jim, Method of making non-volatile memory device having a floating gate with enhanced charge retention.
  4. Eitan Boaz,ILX, NROM fabrication method with a periphery portion.
  5. Wang Hsingya A. (Saratoga CA) Hsu James J. (Saratoga CA), Nonvolatile memory cell formed using self aligned source implant.
  6. Wang Hsingya Arthur (Saratoga CA) Hsu James Juen (Saratoga CA), Nonvolatile memory cell formed using self aligned source implant.
  7. Yang Ming-Tzong (Hsin-chu TWX) Huang Cheng-Han (Hsin-chu TWX) Hsue Chen-Chiu (Hsin-chu TWX), Process for producing memory devices having narrow buried N+lines.

이 특허를 인용한 특허 (44)

  1. Dadashev, Oleg; Betser, Yoram; Maayan, Eduardo, Apparatus and methods for multi-level sensing in a memory array.
  2. Wang, Fei; Foote, David K.; Park, Stephen K., Bit-line oxidation by removing ONO oxide prior to bit-line implant.
  3. Kushnarenko, Alexander, Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same.
  4. Shappir, Assaf, Contact in planar NROM technology.
  5. Miller,Gayle W.; Rathbun,Irwin D.; Schwantes,Stefan; Graf,Michael; Dudek,Volker, DMOS device with sealed channel processing.
  6. Bloom, Ilan; Eitan, Boaz; Irani, Rustom, Dense non-volatile memory array and method of fabrication.
  7. Irani, Rustom; Eitan, Boaz; Bloom, Ilan; Shappir, Assaf, Double density NROM with nitride strips (DDNS).
  8. Sofer,Yair; Maayan,Eduardo; Betser,Yoram, Dynamic matching of signal path and reference path for sensing.
  9. Maayan, Eduardo; Eliyahu, Ron; Eitan, Boaz, EEPROM array and method for operation thereof.
  10. Irani, Rustom; Givant, Amichai, Forming silicon trench isolation (STI) in semiconductor devices self-aligned to diffusion.
  11. Lee,Sung Hoon, Gate structure in flash memory cell and method of forming the same, and method of forming dielectric film.
  12. Betser, Yoram; Kushnarenko, Alexander; Dadashev, Oleg, Measuring and controlling current consumption and output current of charge pumps.
  13. Polansky, Yan; Lavan, Avi, Memory array programming circuit and a method for using the circuit.
  14. Dadashev,Oleg, Method and apparatus for measuring charge pump output current.
  15. Maayan, Eduardo; Eitan, Boaz; Lann, Ameet, Method for programming a reference cell.
  16. Maayan,Eduardo; Eliyahu,Ron; Lann,Ameet; Eitan,Boaz, Method for programming a reference cell.
  17. Schwalbe,Grit; Wang,Kae Horng; Feldner,Klaus; Von Kamienski,Elard Stein, Method for providing bitline contacts in a memory cell array and a memory cell array having bitline contacts.
  18. Lusky, Eli; Eitan, Boaz, Method of erasing non-volatile memory cells.
  19. Eitan, Boaz; Shainsky, Natalie, Method, circuit and device for disturb-control of programming nonvolatile memory cells by hot-hole injection (HHI) and by channel hot-electron (CHE) injection.
  20. Shappir,Assaf; Eisen,Shai, Method, circuit and systems for erasing one or more non-volatile memory cells.
  21. Cohen, Guy; Polansky, Yan, Method, system and circuit for programming a non-volatile memory array.
  22. Cohen,Guy, Method, system, and circuit for operating a non-volatile memory array.
  23. Shappir,Assaf; Avni,Dror; Eitan,Boaz, Method, system, and circuit for operating a non-volatile memory array.
  24. Bloom, Ilan; Maayan, Eduardo, Methods, circuits and systems for reading non-volatile memory cells.
  25. Betser, Yoram; Sofer, Yair; Shlomo, Oren; Harush, Avri, Minimizing read disturb in an array flash cell.
  26. Maayan, Eduardo; Eitan, Boaz, Multiple use memory chip.
  27. Boaz Eitan IL, NROM cell with generally decoupled primary and secondary injection.
  28. Eitan, Boaz; Shainsky, Natalie, NROM non-volatile memory and mode of operation.
  29. Yider Wu ; Jean Yee-Mei Yang ; Mark Ramsbey ; Emmanuel H. Lingunis ; Yu Sun, Nitride barrier layer for protection of ONO structure from top oxide loss in a fabrication of SONOS flash memory.
  30. Wu, Yider; Yang, Jean Yee-Mei; Ramsbey, Mark; Lingunis, Emmanuel H.; Sun, Yu, Nitride barrier layer for protection of ONO structure from top oxide loss in fabrication of SONOS flash memory.
  31. Lavan, Avi; Sahar, Ran, Non binary flash array architecture and method of operation.
  32. Eitan,Boaz, Non-volatile memory cell and non-volatile memory devices.
  33. Eitan, Boaz; Kushnir, Maria; Shappir, Assaf, Non-volatile memory cell with injector.
  34. Lusky, Eli; Shappir, Assaf; Irani, Rustom; Eitan, Boaz, Non-volatile memory structure and method of fabrication.
  35. Shih, Yen-Hao; Lee, Shih-Chin; Hsieh, Jung-Yu; Lai, Erh-Kun; Hsieh, Kuang-Yeu, ONO formation of semiconductor memory device and method of fabricating the same.
  36. Lusky,Eli; Eitan,Boaz; Cohen,Guy; Maayan,Eduardo, Operating array cells with matched reference cells.
  37. Shappir,Assaf; Eisen,Shai, Partial erase verify.
  38. Horesh, Yaal; Dadashev, Oleg; Betser, Yoram; Harush, Avri, Pre-charge sensing scheme for non-volatile memory (NVM).
  39. Fei Wang ; David K. Foote ; Bharath Rangarajan ; George Kluth, Process for fabricating an EEPROM device having a pocket substrate region.
  40. Lusky,Eli; Bloom,Ilan; Shappir,Assaf; Eitan,Boaz, Protection of NROM devices from charge damage.
  41. Rizel, Arik; Cohen, Guy, Rd algorithm improvement for NROM technology.
  42. Eitan, Boaz; Kushnir, Maria; Shappir, Assaf, Retention in NVM with top or bottom injection.
  43. Eitan, Boaz, Secondary injection for NROM.
  44. Eitan,Boaz, Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping.
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