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Computerized automation system and method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/28
출원번호 US-0104922 (1998-06-25)
발명자 / 주소
  • Ivaturi Devi Prasad
  • Patel Kushal A.
출원인 / 주소
  • Cisco Technology, Inc.
대리인 / 주소
    Cesari and McKenna
인용정보 피인용 횟수 : 28  인용 특허 : 19

초록

Computerized system and method are provided which have particular utility in the field of automated testing. In one embodiment of the method of the present invention, an array is stored in computer-readable memory. The array has a plurality of tuples, each of which includes a respective action field

대표청구항

[ What is claimed is:] [1.] A computerized automation system, comprising:a. a memory for storing an array including a plurality of tuples, each said tuple including a respective action field, a respective reaction field, a respective success field, and a respective failure field, wherein in each sai

이 특허에 인용된 특허 (19)

  1. Qureshi Fazal U. R. (Cupertino CA), Built-in self tests for large multiplier, adder, or subtractor.
  2. Beck Ronald R. (Banks OR) Stanbro Michael E. (Tigard OR) Thomsen Eric J. (Aloha OR), Circuit verification accessory.
  3. Nelson Mark B. ; Clark Richard F. ; Watrobski Ken R., Debug vector launch tool.
  4. Orengo Gerard (Biot FRX), Device and method of managing asynchronous events in a finite state machine.
  5. Hershey Paul C. (Manassas VA), High availability data processing system and method using finite state machines.
  6. Ross Ken (Santa Cruz CA) Margozzi Michael (San Jose CA) White Kevin (Los Gatos CA) First Carl (San Jose CA), Method and apparatus for analyzing networks.
  7. Poisner David I., Method and apparatus for detecting and reporting failed processor reset.
  8. Larkin Louis J. ; Healy Timothy A. ; Kerr Laura J., Method and apparatus for estimating an actual magnitude of a physical parameter on the basis of three or more redundant signals.
  9. Klein Philippe (Newton MA) Maruska David W. (Hopkinton MA) Ludlam Kevin W. (Stow MA), Method and apparatus for testing high speed busses using gray-code data.
  10. Lee David (Murray Hill NJ) Sabnani Krishan Kumar (Berkeley Heights NJ) Uyar Muharrem Umit (Sea Bright NJ), Method and apparatus for testing protocols.
  11. Bencivenga Robert, Method for testing path delay faults in sequential logic circuits.
  12. Hershey Paul C. (Manassas VA) Johnson Donald B. (Manassas VA) Le An V. (Manassas VA) Matyas Stephen M. (Manassas VA) Waclawsky John G. (Frederick MD) Wilkins John D. (Somerville VA), Network security system and method using a parallel finite state machine adaptive active monitor and responder.
  13. Douglas Robert H. (Phoenix AZ), Passive monitor for broadcast communication network.
  14. Derr Andrew G. (Endicott NY) Poliquin Richard J. (Endwell NY), Problem analysis of a node computer with assistance from a central site.
  15. Hershey Paul C. (Manassas VA), System and method for adaptive active monitoring of high speed data streams using finite state machines.
  16. Medicke John A. (Gaithersburg MD) Posharow Paul (Frederick MD), System and method for finite state machine processing using action vectors.
  17. Chen James Newman (Austin TX) Ross Joseph Clinton (Georgetown TX), System and method for maintaining performance data in a data processing system.
  18. Luk Fong, System configuration and methods for on-the-fly testing of integrated circuits.
  19. Andreasen David A. (Newtown Square PA) Buggert Jerrold E. (San Juan Capistrano CA) Desai Harshad K. (Mission Viejo CA) Hussain Zubair (Sunnyvale CA), User interface processor for computer network with maintenance and programmable interrupt capability.

이 특허를 인용한 특허 (28)

  1. Kannan, Ramakrishnan; Mani, Anbazhagan; Subbian, Karthik; Vallabhaneni, Vasu, Automated learning system for improving graphical user interfaces.
  2. Kher, Minesh R.; Simoes, Alejandro, Automated microcode test packet generation engine.
  3. Anderson, Dale H.; Jennas, II, Paul A.; Peipelman, Jason L., Command execution results verification.
  4. Suehiro Orita JP; Masao Kobori JP, Data inspection method and apparatus.
  5. Alex Raj ; Hseu-Chuan Tsai ; John F. McGlauphlin ; David Snay, Data network protocol conformance test system.
  6. Barsness, Eric L.; Branson, Michael J.; Cook, Alexander; Santosuosso, John M., Data tuple testing and routing for a streaming application.
  7. Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming; Ho, Lawrence Wai Cheung, Determining data valid windows in a system and method for testing an integrated circuit device.
  8. Snay David K. ; Syed Faiz, Generic test execution method and apparatus.
  9. Bleier, Jr., William H.; Blue, Dale E.; Brady, Kevin J.; Jones, Jeff R.; Maurer, Max M., Intelligent work station simulation—generalized LAN frame generation simulation structure.
  10. Chen, Huei-Ping; Tan, Ting Chuan, Mechanisms for providing and using a scripting language for flexibly simulationg a plurality of different network protocols.
  11. Akhtar, Shahid; Craciun, Viorel; Liefooghe, Pieter; Chaudhry, Ather, Method and apparatus for improving HTTP adaptive streaming performance using TCP modifications at content source.
  12. Lai, Bosco Chun Sang; Chang, Sunny Lai Ming; Ho, Lawrence Wai Cheung, Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels.
  13. Carey,John A., Method for designing an initiator in an integrated circuit.
  14. Jesse H. Jenkins, IV ; Walter H. Edmondson, Method for remotely testing microelectronic device over the internet.
  15. Carey,John A., Method of designing an initiator in an integrated circuit.
  16. Lopian, Eli, Methods circuits apparatuses systems and associated computer executable code for generating a software unit test.
  17. Lopian, Eli, Methods, circuits, devices, systems and associated computer executable code for testing software code.
  18. He, Guan Nan; Xi, Ying, System and method for configuring a sliding window for testing an event processing system based on a system time.
  19. He, Guan Nan; Xi, Ying, System and method for supporting a sliding window for testing an event processing system.
  20. He, Guan Nan; Xi, Ying, System and method for supporting a testing framework for an event processing system using multiple input event streams.
  21. Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming; Song, Charlie; Chu, Kevin, System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices.
  22. Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming, System and method for testing integrated circuits by determining the solid timing window.
  23. Denniston,William B., System and methods for functional testing of embedded processor-based systems.
  24. Ho, Lawrence Wai Cheung; Chiu, Eric Sin Kwok, Systems and methods for testing and assembling memory modules.
  25. Ho, Lawrence Wai Cheung; Chiu, Eric Sin Kwok; Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming, Systems and methods for testing and assembling memory modules.
  26. Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming; Chan, Hong Liang; Lam, Yu Kuen; Ho, Lawrence Wai Cheung, Systems and methods for testing integrated circuit devices.
  27. Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming; Chiu, Eric Sin Kwok; Cao, Xiaoyi; Zhou, Shaodong; Zhang, Lei, Systems and methods for testing memory.
  28. Lai, Bosco Chun Sang; Chang, Sunny Lai-Ming; Ho, Lawrence Wai Cheung; Choi, Shu Man, Testing apparatus and method for analyzing a memory module operating within an application system.
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