초록 ▼

A microbolometer detector element (10) for a focal plane array is provided including an optically absorptive material structure (12) characterized by an electrical resistivity that varies as a function of its temperature coupled in spaced relation to a thermal isolation structure (20). The thermal i

A microbolometer detector element (10) for a focal plane array is provided including an optically absorptive material structure (12) characterized by an electrical resistivity that varies as a function of its temperature coupled in spaced relation to a thermal isolation structure (20). The thermal isolation structure (20) is coupled in spaced relation to a sensor (34) connected to the optically absorptive material structure (12) for sensing the absorptive structure's (12) electrical resistivity. The thermal isolation structure (20) facilitates very high fill factors even when the pixel size is shrunk below the baseline fifty micron size. The thickness of the optically absorptive material structure (12) and the thermal isolation structure (20) can be independently controlled since the thermal isolation structure (20) is disposed in spaced relation under the absorptive material structure (12). The thermal isolation structure (20) can be made several times longer than prior art designs to increase the thermal isolation of the optically absorptive material structure (12) and to increase pixel responsivity. The thermal isolation structure (20) may include a planar member (26) for reflecting incident optical radiation not absorbed by the absorptive material (12) back to the absorptive material (12). In a preferred embodiment of the present invention, the absorptive structure (12) is a polycrystalline semiconductive layer supported above the thermal isolation structure (20) by downwardly projecting leg members (18). The thermal isolation structure (20) also includes downwardly projecting leg members (28) for supporting it in spaced relation above a silicon substrate surface (30) overlying an integrated readout circuit (34).

대표청구항 ▼

[ What is claimed is:] [1.] An uncooled microbolometer detector element for a focal plane array, said microbolometer comprising:an optically absorptive material structure characterized by an absorptive material having an electrical resistivity that varies as a function of its temperature;a thermal i

[ What is claimed is:] [1.] An uncooled microbolometer detector element for a focal plane array, said microbolometer comprising:an optically absorptive material structure characterized by an absorptive material having an electrical resistivity that varies as a function of its temperature;a thermal isolation structure coupled in spaced relation to said optically absorptive material structure for thermally isolating said absorptive material;a sensor coupled in spaced relation to said thermal isolation structure and communicating with said optically absorptive material structure to sense a resistivity of said optically absorptive material structure;said optically absorptive material structure including a planar member coupled to a first set of downwardly projecting leg members, said first set of leg members being coupled to said thermal isolation structure for supporting said planar member in spaced relation above said thermal isolation structure;said thermal isolation structure including a planar surface coupled to a second set of downwardly projecting leg members, said second set of leg members being coupled to said sensor for supporting said planar surface in spaced relation above said sensor such that said thermal isolation structure is disposed between said optically absorptive material structure and said sensor; andsaid planar surface of thermal isolation structure having a serpentine configuration meandering from a first end to a second end.