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Cluster tool method using plasma immersion ion implantation 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/302
출원번호 US-0123853 (1998-07-28)
발명자 / 주소
  • Henley Francois J.
  • Cheung Nathan
출원인 / 주소
  • Silicon Genesis Corporation
대리인 / 주소
    Townsend and Townsend and Crew LLP
인용정보 피인용 횟수 : 102  인용 특허 : 26

초록

A cluster tool method using plasma immersion ion implantation chamber. In some embodiments, the cluster tool method also includes a controlled cleaving process chamber, as well as others.

대표청구항

[ What is claimed is:] [1.] A cluster tool process for forming a silicon-on-insulator substrate, said process comprising steps of:providing a donor substrate;placing said donor substrate in a first chamber and introducing particles through a surface of said donor substrate to a predetermined selecte

이 특허에 인용된 특허 (26)

  1. White Nicholas R., Apparatus and method for temperature control of workpieces in vacuum.
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  9. Shohet Juda L. (Madison WI), Ion purification for plasma ion implantation.
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  12. Levy Karl B. (Los Altos CA), Method for forming capacitor in trench of semiconductor wafer by implantation of trench surfaces with oxygen.
  13. Sato Nobuhiko,JPX ; Yonehara Takao,JPX ; Sakaguchi Kiyofumi,JPX, Method for producing semiconductor substrate.
  14. Chan Chung (Newton MA) Allen Ryne C. (Framingham MA) Husein Imad (Boston MA) Zhou Yaunzhong (Malden MA), Method for the deposition and modification of thin films using a combination of vacuum arcs and plasma immersion ion imp.
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  16. Foster Robert F. (Weston MA) Srinivas Damodaran (Tempe AZ), Method of nucleating tungsten on titanium nitride by CVD without silane.
  17. Sueta Norio (Chiba JPX) Hoshino Hiroyasu (Tokyo JPX), Paper punch with punched-hole reinforcing piece sticking mechanism.
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  26. Edwards Richard C. (Ringwood NJ) Kolesa Michael S. (Suffern NY) Ishikawa Hiroichi (Mahwah NJ), Wafer processing cluster tool batch preheating and degassing method.

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