초록 ▼

Difluoromethane (R-32) is of current interest as a partial replacement for chlorodifluoromethane (R-22) refrigerant heretofore widely used in vapor compression refrigeration systems. R-32 has, however, proved to be more reactive than is desirable with the zeolite A adsorbent-desiccant compositions u

Difluoromethane (R-32) is of current interest as a partial replacement for chlorodifluoromethane (R-22) refrigerant heretofore widely used in vapor compression refrigeration systems. R-32 has, however, proved to be more reactive than is desirable with the zeolite A adsorbent-desiccant compositions used in such systems to prevent corrosion and freeze-up problems. The potassium cation form of a zeolite A molecular sieve--with at least 60 percent of the sodium cations replaced with potassium ions, agglomerated with a clay binder, and pore-reduced to essentially exclude the adsorption of R-32 having essentially no reactivity with difluoromethane, and having a surface ratio of silicon to aluminum of less than about 1.7 mol/mol as determined by X-ray photoelectron spectroscopy--has been found to be an effective desiccant for refrigerants comprising difluoromethane.

대표청구항 ▼

[ We claim:] [1.] A process for the removal of water from a refrigerant comprising difluoromethane, said process comprising contacting said refrigerant with a desiccant comprising a potassium exchanged zeolite A having greater than about 60 percent of available cations exchanged with potassium and a

[ We claim:] [1.] A process for the removal of water from a refrigerant comprising difluoromethane, said process comprising contacting said refrigerant with a desiccant comprising a potassium exchanged zeolite A having greater than about 60 percent of available cations exchanged with potassium and a clay binder, said desiccant having a water adsorption capacity greater than about 15 weight percent, having essentially no difluoromethane adsorption capacity, and having a surface ratio of silicon to aluminum of less than about 1.7 mol/mol as determined by X-ray photoelectron spectroscopy.