초록 ▼

A diagnostic test unit for deterministically measuring one or more parameters, such as dead band, dead time, response time, gain, or overshoot, of a process control device that is connected in a process control loop during operation of a process includes a switch controller, a signal generator, a sw

A diagnostic test unit for deterministically measuring one or more parameters, such as dead band, dead time, response time, gain, or overshoot, of a process control device that is connected in a process control loop during operation of a process includes a switch controller, a signal generator, a switch, a response accumulator mechanism, and an analyzer mechanism. The switch controller monitors a process signal during operation of the process to determine whether the process signal is substantially stable. In the event that the process signal is substantially stable, the switch replaces a control signal with a diagnostic test signal generated by the signal generator. The response accumulator is in communication with the process control loop to obtain an indication of the response of the process control device to the diagnostic test signal. The analyzer unit then determines the device parameter from the test signal and the response indication.

대표청구항 ▼

[ What is claimed is:] [1.] A diagnostic test unit for determining a device parameter associated with a process control device utilized in connection with an operating process to receive a control signal, the diagnostic test unit comprising:a switch controller that monitors a process signal during o

[ What is claimed is:] [1.] A diagnostic test unit for determining a device parameter associated with a process control device utilized in connection with an operating process to receive a control signal, the diagnostic test unit comprising:a switch controller that monitors a process signal during operation of the operating process;a signal generator that generates a diagnostic test signal;a switch responsive to the switch controller to replace the control signal with the diagnostic test signal during operation of the operating process;means for obtaining an indication of the response of the process control device to the diagnostic test signal; andan analyzer unit that determines the device parameter from the diagnostic test signal and the response indication.