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Combined wide angle and narrow angle imaging system and method for surveillance and monitoring 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
  • H04N-009/47
출원번호 US-0034745 (1998-03-04)
발명자 / 주소
  • Nayar Shree K.
  • Swaminathan Rahul
  • Gluckman Joshua M.
출원인 / 주소
  • The Trustees of Columbia University in the City of New York
대리인 / 주소
    Baker Botts L.L.P.
인용정보 피인용 횟수 : 113  인용 특허 : 21

초록

A surveillance and monitoring system and method for monitoring an area which includes a first imaging system having a wide-angle field of view approximately equal to or greater than the area. The system also includes one or more second imaging systems having adjustable view settings, each of one or

대표청구항

[ We claim:] [1.]1. The surveillance and monitoring system for monitoring an area, comprising:(a) a first imaging system having a wide-angle field of view approximately equal to or greater than said area, said first imaging system providing a direction information for at least one portion of said ar

이 특허에 인용된 특허 (21)

  1. Means Kevin P. (3126 Goldsmith St. San Diego CA 92106), Apparatus and method for synchronizing search and surveillance devices.
  2. Weil Richard S. (Highland Park IL) Hodgdon Dana (Evanston IL) Steinberg Neil (Los Angeles CA), Automatic recording system.
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  5. Biferno Michael A. (Duarte CA) Durck Craig H. (Lake Forest CA), Computer imaging system and method for remote in-flight aircraft refueling.
  6. Otsuki Akira (Matsudo JPX), Image processing device and method for sensing moving objects and rangefinder employing the same.
  7. Struhs Kenneth E. (Salt Lake City UT) Struhs Mark J. (Salt Lake City UT) Struhs Patrick L. (Salt Lake City UT), Imaging assembly and mounting for surveillance viewing under remote control.
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  11. Zimmermann Steven D. (Knoxville TN), Omniview motionless camera orientation system.
  12. Kuban Daniel P. (Oak Ridge TN) Martin H. Lee (Knoxville TN) Zimmermann Steven D. (Knoxville TN) Busko Nick (Knoxville TN), Omniview motionless camera surveillance system.
  13. Ringlien James A. (Maumee OH), Optical inspection of container finish dimensional parameters.
  14. Nalwa Vishvjit S. (Middletown NJ), Panoramic projection apparatus.
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