초록 ▼

This invention provides practical methods to make a DRAM fully compatible with existing SRAM products. This is accomplished by design and manufacture methods according to the invention, which includes a method to reduce standby power of reference voltage generators and a method to avoid the alpha pa

This invention provides practical methods to make a DRAM fully compatible with existing SRAM products. This is accomplished by design and manufacture methods according to the invention, which includes a method to reduce standby power of reference voltage generators and a method to avoid the alpha particle problem using a novel error correction code (ECC) mechanism. The reference voltage generator of the present invention can adjust the values of output voltage and driving power separately following simple procedures. It has very strong driving power to maintain the reference voltage, which is necessary to support high-speed operation of memory devices of the present invention. In the mean time, its standby power can be reduced by orders of magnitudes using simple control mechanism, which is necessary to make our memory device compatible with the properties of existing SRAM products. There is no need to use feedback circuits or operation amplifiers, so the circuit is extremely stable and reliable. It is an ideal reference voltage generator to generate the bit line pre-charge voltage for a DRAM designed to emulate an SRAM device. The unique features of the ECC protection of the present invention avoid RC delay problems in prior art ECC circuits, which is necessary to support high speed operation of our products. The alpha particle problem is no longer an issue. All the supporting circuits can use repeated layouts, which is very important for memory design. The manufacture technology for embedded IC is simplified dramatically, which allow us to have high performance logic circuits. The memory devices of the present invention are therefore compatible in every detailed feature with existing SRAM products.

대표청구항 ▼

[ I claim:] [1.]1. An error correction code (ECC) logic circuit for receiving N sets of input data bits D(i, j) and error correction bit C(i), for generating a set of correction bits F(i), where i=1, 2, 3, . . . , N, and j=1, 2, 3, . . . , M, and N and M are positive integers, the error correction c

[ I claim:] [1.]1. An error correction code (ECC) logic circuit for receiving N sets of input data bits D(i, j) and error correction bit C(i), for generating a set of correction bits F(i), where i=1, 2, 3, . . . , N, and j=1, 2, 3, . . . , M, and N and M are positive integers, the error correction code (ECC) logic circuit comprising:a set of identical parity check blocks (P(i), i=1, 2, 3, . . . , N) wherein each of said parity check blocks P(i) includes an external input means for receiving said input data bits D(i, j) and said error correction bit C(i);every one of said parity check blocks P(i) further includes a plurality of inter-block bit input lines for directly receiving inter-block input bits from two direct bit-line interconnected parity check blocks P(i-1) and P(i+1) and each of said parity check blocks P(i) further includes a plurality of inter-block bit output lines for directly transmitting inter-block output bits to said two direct bit-line interconnected parity check blocks P(i-1) and P(i+1) wherein a parity check block P(N) having two direct bit-line interconnected parity check blocks of P(N-1) and P(1) for constituting a circular configuration; andevery one of said parity check blocks P(i) further includes an external output means for outputting said parity correction bit F(i) wherein a combination of said parity correction bits {F(i), i=1, 2, 3, . . . , N} being provided as a N-bit error decoding input to a set of identical error decoding circuits {DC(i) i=1, 2, 3, . . . , N}, defined by a combination of said parity correction bits (F(i), i=1, 2, 3, . . . N} wherein said combination constituting a single-bit circular shifting relationship, and said error decoding circuits DC(i) generating an unique bit pattern for an error occurring to each of said data bits D(i, j).