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Method and apparatus for removing post-etch residues and other adherent matrices 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G03F-007/36
출원번호 US-0397956 (1999-09-17)
발명자 / 주소
  • Starov Vladimir
  • Basha Syed S.
  • Shrinivasan Krishnan
  • Reinhardt Karen A.
  • Kabansky Aleksandr
출원인 / 주소
  • Gasonics International Corporation
대리인 / 주소
    Townsend and Townsend and Crew LLP
인용정보 피인용 횟수 : 116  인용 특허 : 17

초록

Adherent matrix layers such as post-etch and other post-process residues are removed from a substrate by exposing them to a vapor phase solvent to allow penetration of the vapor phase solvent into the adherent matrix layers and condensing the vapor phase solvent into the adherent matrix layers and r

대표청구항

[ What is claimed is:] [1.]1. A method of removing an adherent matrix from a substrate surface of a substrate, the method comprising:exposing the adherent matrix on the substrate to a plasma-activated gas which reacts with the adherent matrix;separating the substrate from the plasma-activated gas;ex

이 특허에 인용된 특허 (17)

  1. Ury Michael G. (Bethesda MD) Matthews John C. (Gaithersburg MD) Rounds Stuart N. (Germantown MD), Apparatus for photoresist stripping.
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  5. Bran Mario E. (Garden Grove CA), Megasonic cleaning apparatus.
  6. Bran Mario E. (Garden Grove CA), Megasonic cleaning method.
  7. Bran Mario E. (Garden Grove CA), Megasonic cleaning system.
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  9. Nishizawa Hisao (Shiga JPX) Morita Masaru (Minami JPX) Tanaka Masato (Nagahama JPX), Method and apparatus for surface treating of substrates.
  10. Starov Vladimir (Redwood City CA), Method for removing photoresist and other adherent materials from substrates.
  11. Fukuyama Ryooji (Kudamatsu JPX) Nawata Makoto (Kudamatsu JPX) Kakehi Yutaka (Hikari JPX) Kawahara Hironobu (Kudamatsu JPX) Sato Yoshiaki (Kudamatsu JPX) Torii Yoshimi (Tachikawa JPX) Kawaraya Akira (, Method of treating samples.
  12. Hoffman Joe G. ; Clark R. Scott, On-site ammonia purification for semiconductor manufacture.
  13. Hoffman Joe G. ; Clark R. Scot, On-site generation of ultra-high-purity buffered-HF for semiconductor processing.
  14. Hoffman Joe G. ; Clark R. Scot, Point-of-use ammonia purification for electronic component manufacture.
  15. Olesen Michael B. (Yorba Linda CA) Bran Mario E. (Garden Grove CA), Semiconductor wafer cleaning system.
  16. Bran Mario E. (Garden Grove CA), Single wafer megasonic semiconductor wafer processing system.
  17. Bran Mario E. (Garden Grove CA), Single wafer megasonic semiconductor wafer processing system.

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