초록 ▼

A method and apparatus for measuring at least one parameter of material are disclosed herein. The method includes generating multiple frequency signals having frequencies selectable by control signals, combining the multiple frequency signals into a combined frequency signal having multiple frequenc

A method and apparatus for measuring at least one parameter of material are disclosed herein. The method includes generating multiple frequency signals having frequencies selectable by control signals, combining the multiple frequency signals into a combined frequency signal having multiple frequency components, and applying the combined frequency signal as an excitation signal to a sensing element. The frequency response of the material is determined at each of the multiple frequencies using output signals from the sensing element, and a frequency analysis is performed to determine the parameters of the material. The sensing element may include a capaciflector sensor located non-intrusively along the surface of a conveyor. However, other sensing elements such as capacitive, resistive and inductive elements may be used. The parameters being measured may include mass flow rate and moisture content. The apparatus includes a frequency generating circuit for generating a frequency signal having multiple frequency components, a sensing circuit which applies the frequency signal as an excitation signal to a sensing element, a signal conditioning circuit which determines the frequency response of the material at the multiple frequencies based upon output signals from the sensing element, and a signal processing circuit for performing a frequency analysis. The apparatus may be used to measure parameters of material being moved by a vehicle-mounted conveyor. A pink or white noise generator may be used for the frequency generating circuit.

대표청구항 ▼

[ What is claimed is:] [1.]1. An apparatus for measuring at least one parameter of material comprising:a frequency generating circuit configured to generate a combined frequency signal having a plurality of frequency components selected in response to a plurality of frequency control signals;a sensi

[ What is claimed is:] [1.]1. An apparatus for measuring at least one parameter of material comprising:a frequency generating circuit configured to generate a combined frequency signal having a plurality of frequency components selected in response to a plurality of frequency control signals;a sensing circuit coupled to the frequency generating circuit and including a sensing element coupled to the material being measured, wherein the combined frequency signal is applied as an excitation signal to the sensing element and the sensing element generates output signals based upon the frequency response of the material at each of the frequencies;a signal conditioning circuit coupled to the sensing circuit and configured to determine the frequency response of the material at each of the frequencies based upon the output signals from the sensing element; anda signal processing circuit coupled to the conditioning circuit and configured to analyze the frequency response of the material to determine the at least one parameter of the material.