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Method and apparatus for testing computer cooling systems 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01L-025/00
  • G01M-010/00
  • G01M-015/00
출원번호 US-0149599 (1998-09-08)
발명자 / 주소
  • Sinclair Mark T.
  • Cascio Francis G.
  • Coq Marc H.
  • Critelli Ronald D.
  • Desiano Frank M.
  • Quinn Terrence A.
  • Simmons Daren
출원인 / 주소
  • International Business Machines Corporation
대리인 / 주소
    Gonzales
인용정보 피인용 횟수 : 50  인용 특허 : 9

초록

A method and apparatus for testing cooling units used in computers is presented. Testing of such cooling systems increases the reliability thereof, which in turn increases the reliability of the computers utilizing these cooling systems. The cooling system tester comprises a test frame which support

대표청구항

[ What is claimed is:] [1.]1. A tester for testing at least one cooling unit used with a computer, the cooling unit having an inlet and an outlet, comprising:a heating element for generating heat simulating a heat load of the computer;an evaporator disposed relative to said heating element for recei

이 특허에 인용된 특허 (9)

  1. McMullin Larry D. (807 Arlington Rd. Park Hills KY 41001), Chiller monitoring system.
  2. Shimizu Haruhito (Tokyo JPX), Constant-temperature control using surroundings temperature of a device.
  3. Winick Alan Lee ; Mitty Nagaraj ; Harpell Gary A., Cooling system for enclosed electronic components.
  4. Swamy Deepak (Austin TX), Embedded thermistor for on-board thermal monitoring of electrical components.
  5. Hollowell ; II J. Rhoads (Sunnyvale CA) Beninghaus James R. (Cupertino CA) Hansen ; Jr. Daniel J. (Georgetown TX), Method and apparatus for thermal management in a computer system.
  6. Cawley Richard E. (Hurst TX), Method for controlling the operation of two-speed, refrigerant motor compressors.
  7. Fouts Robert F. (Rancho Palos Verdes CA) Fouts Craig (Encinitas CA) Fouts Earl J. (Rolling Hills CA), Modular cooler.
  8. Mueller Paul (Springfield MO) Manna Daniel C. (Springfield MO) Prine Ray A. (Springfield MO), Refrigerated receiver.
  9. Hales Paul D. (P. O. Box 7573 High Point NC 27264), Remote temperature control activation apparatus.

이 특허를 인용한 특허 (50)

  1. VanGilder, James William; Healey, Christopher M.; Zhang, Xuanhang, Analysis of effect of transient events on temperature in a data center.
  2. Chang,Chun Yi, Apparatus for performance testing of heat dissipating modules.
  3. Hamann, Hendrik F.; Iyengar, Madhusudan K.; Lacey, James A.; O'Boyle, Martin P.; Schmidt, Roger R., Apparatus for three-dimensional measurements of physical characteristics within a data center.
  4. Hermerding, II,James G., Automated method and apparatus for processor thermal validation.
  5. Dalgas, Mikkel; Silberbauer, Kristian; Pedersen, Daniel René Hagen, Data center control.
  6. Hermerding,James G., Dynamic cooling of computing systems.
  7. Ghose, Kanad, Energy aware processing load distribution system and method.
  8. Wexler, Peter, In-row air containment and cooling system and method.
  9. Frankel, Scott; Martin, Peter; Hardt, Eric, Intelligent cooling fan.
  10. Frankel, Scott; Martin, Peter; Hardt, Eric, Intelligent cooling fan.
  11. Larson, Thane M.; Monfared, Akbar; Inglis, Ian R., Method and apparatus for controlling fans and power supplies to provide accelerated run-in testing.
  12. Tutunoglu, Ozan, Method and apparatus for cooling.
  13. Tutunoglu, Ozan; Bean, Jr., John H., Method and apparatus for cooling.
  14. Tutunoglu, Ozan; Lingrey, David James, Method and apparatus for cooling.
  15. Vaidyanathan, Kalyanaraman; Gross, Kenny C.; Urmanov, Aleksey M., Method and apparatus for determining whether a cooling device in a computer system is responsive to control signals.
  16. Charles G. Butts ; Richard H. Bair, III ; Mark R. Lunsford, Method and apparatus for testing heat pumps.
  17. Hamann,Hendrik F.; Iyengar,Madhusudan K.; Lacey,James A.; O'Boyle,Martin P.; Schmidt,Roger R., Method and apparatus for three-dimensional measurements.
  18. Gross, Kenny C.; Urmanov, Aleksey M.; McElfresh, David K., Method and apparatus for using a heater to control the temperature of a power supply in a computer system.
  19. VanGilder, James W.; Healey, Christopher M., Method for computing cooling redundancy at the rack level.
  20. Tutunoglu, Ozan; Bean, Jr., John H., Method of operating a cooling system having one or more cooling units.
  21. Rasmussen, Neil; VanGilder, James W.; Buell, Scott Douglass; Shrivastava, Saurabh Kumar; Dalgas, Mikkel, Methods and systems for managing facility power and cooling.
  22. Rasmussen, Neil; VanGilder, James W.; Buell, Scott Douglass; Shrivastava, Saurabh Kumar; Dalgas, Mikkel, Methods and systems for managing facility power and cooling.
  23. Rasmussen, Neil; VanGilder, James W.; Dalgas, Mikkel; Berard, Stephen; Jensen, Henrik; Daae, Henrik; Schoellhammer, Sandi, Methods and systems for managing facility power and cooling.
  24. Rasmussen, Neil; VanGilder, James W.; Dalgas, Mikkel; Berard, Stephen; Jensen, Henrik; Daae, Henrik; Schoellhammer, Sandi, Methods and systems for managing facility power and cooling.
  25. Bean, Jr., John H., Modular ice storage for uninterruptible chilled water.
  26. Bean, Jr., John H., Modular ice storage for uninterruptible chilled water.
  27. Shrivastava, Saurabh K.; VanGilder, James W., System and method for arranging equipment in a data center.
  28. Shrivastava, Saurabh K.; VanGilder, James W., System and method for arranging equipment in a data center.
  29. Rasmussen, Neil; VanGilder, James W.; Zhang, Xuanhang, System and method for assessing and managing data center airflow and energy usage.
  30. Rasmussen, Neil; VanGilder, James W.; Zhang, Xuanhang, System and method for assessing and managing data center airflow and energy usage.
  31. VanGilder, James W.; Shrivastava, Saurabh K.; Zhang, Xuanhang, System and method for evaluating equipment rack cooling performance.
  32. VanGilder, James W.; Shrivastava, Saurabh K.; Zhang, Xuanhang, System and method for evaluating equipment rack cooling performance.
  33. Healey, Christopher; Zhang, Xuanhang; VanGilder, James W., System and method for measurement aided prediction of temperature and airflow values in a data center.
  34. VanGilder, James W.; Zhang, Xuanhang, System and method for predicting cooling performance of arrangements of equipment in a data center.
  35. VanGilder, James W.; Zhang, Xuanhang, System and method for predicting cooling performance of arrangements of equipment in a data center.
  36. VanGilder, James W.; Shrivastava, Saurabh K., System and method for predicting maximum cooler and rack capacities in a data center.
  37. VanGilder, James W.; Sheffer, Zachary R.; Zhang, Xuanhang, System and method for predicting perforated tile airflow in a data center.
  38. VanGilder, James W.; Zhang, Xuanhang; Healey, Christopher M., System and method for predicting temperature values in a data center.
  39. Zhang, Xuanhang; VanGilder, James W., System and method for predicting transient cooling performance for a data center.
  40. Zhang, Xuanhang; VanGilder, James William, System and method for predicting transient cooling performance for data center.
  41. VanGilder, James William, System and method for prediction of temperature values in an electronics system.
  42. Healey, Christopher M.; Zhang, Xuanhang, System and method for sequential placement of cooling resources within data center layouts.
  43. Frankel, Scott; Hardt, Eric, System and method of controlling cooling fan speeds.
  44. Frankel,Scott; Hardt,Eric, System and method of controlling cooling fan speeds.
  45. Frankel, Scott; Martin, Peter; Hardt, Eric, System and method of designing cooling fans.
  46. Frankel,Scott; Gilbert,Martin Peter; Hardt,Eric, System and method of designing cooling fans.
  47. Frankel, Scott; Martin, Peter; Hardt, Eric, System and method of operating a cooling fan.
  48. Dalgas, Mikkel; VanGilder, James W.; Healey, Christopher; Johansen, Martin, Systems and methods for predicting fluid dynamics in a data center.
  49. Brookes, Stephan Peter; Ward, Barry, Test system and test method.
  50. Chun-Hsin Lu TW; Pao-Lung Lin TW; Nien-Tien Cheng TW, Thermal module inspecting device.
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