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Analyzer for modeling and optimizing maintenance operations

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-019/00
출원번호 US-0321145 (1999-05-27)
발명자 / 주소
  • Klimasauskas Casimir C.
출원인 / 주소
  • Aspen Technology, Inc.
대리인 / 주소
    Bracewell & Patterson, L.L.P.
인용정보 피인용 횟수 : 145  인용 특허 : 19

초록

A first model or first analyzer having a series of filters is provided to represent time-varying effects of maintenance events. The first model or analyzer further enhances the selection of derived variables which are used as inputs to the first analyzer. Additionally, a combination of fuzzy logic a

대표청구항

[ What is claimed is:] [1.]1. A method for modeling a task having input parameters and one or more activities, said method comprising the steps of:collecting said input parameters;generating derived variables, including the steps of:performing a search on said input parameters using one of more func

이 특허에 인용된 특허 (19)

  1. Klimasauskas Casimir C., Analyzer for modeling and optimizing maintenance operations.
  2. Skeirik Richard D. (Newark DE), Computer neural network supervisory process control system and method.
  3. Bhat Naveen V. (2100 S. Gessner ; Apt. 1506 Houston TX 77063) Braden William B. (2229 W. Alabama Houston TX 77098) Heckendoorn Kent E. (2718 Cason Houston TX 77005) Graettinger Timothy J. (221 Bluest, Control system using an adaptive neural network for target and path optimization for a multivariable, nonlinear process.
  4. Klimasauskas Casimir C. ; Guiver John P., Hybrid linear-neural network process control.
  5. White Leonard R. (178 Foxhunt La. East Amherst NY 14051) White Caroline K. (178 Foxhunt La. East Amherst NY 14051), Measurement analysis software system and method.
  6. White Leonard R. ; White Caroline K., Measurement analysis software system and method.
  7. Kurtzberg Jerome M. (Yorktown Heights NY) Levanoni Menachem (Yorktown Heights NY), Mechanism and architecture for manufacturing control and optimization.
  8. Qin S. Joe (Austin TX) Dunia Ricardo H. (Austin TX) Hayes Randall L. (Georgetown TX), Method and apparatus for detecting and identifying faulty sensors in a process.
  9. Sheppard John W. (Glen Burnie MD) Simpson William R. (Edgewater MD) Graham Jerry L. (Baldwin MD), Method and apparatus for diagnostic testing including a neural network for determining testing sufficiency.
  10. Butler Stephanie W. (Plano TX) Brankner Keith J. (Richardson TX), Method and system for identifying process conditions.
  11. Roberts Jed (Cambridge MA) Baker James K. (West Newton MA) Porter Edward W. (Boston MA), Method for interactive speech recognition and training.
  12. Kurtzberg Jerome M. ; Levanoni Menachem, Optimizing functional operation in manufacturing control.
  13. Palusamy Sam S. (Murrysville PA) Bauman Douglas A. (Apollo PA) Kozlosky Thomas A. (Oakmont PA) Bond Charles B. (Export PA) Cranford ; III Elwyn L. (Greensburg PA) Batt Theodore J. (Penn Hills PA), Plant maintenance with predictive diagnostics.
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  19. Keeler James D. (Austin TX) Havener John P. (Austin TX) Godbole Devendra (Austin TX) Ferguson Ralph B. (Austin TX), Virtual continuous emission monitoring system with sensor validation.

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