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Laser marking station with enclosure and method of operation 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B23K-026/00
출원번호 US-0217039 (1998-12-21)
발명자 / 주소
  • Canella Robert L.
  • Ibarra Tony T.
출원인 / 주소
  • Micron Electronics, Inc.
대리인 / 주소
    TraskBritt
인용정보 피인용 횟수 : 16  인용 특허 : 100

초록 ▼

A laser marking station housing a laser marking head within a walled, substantially bottomless enclosure defining an opening into which a tray carrier bearing a tray of IC packages to be marked may be raised to place the tray at correct laser focal length and effect complete (laser) light containmen

대표청구항 ▼

[ What is claimed is:] [1.]1. A laser marking station, comprising:a substantially bottomless enclosure;a transport actuator located at least in part below the substantially bottomless enclosure and configured to position a tray transport underneath a downward facing opening into the substantially bo

이 특허에 인용된 특허 (100)

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  1. Canella, Robert L.; Ibarra, Tony T., Apparatus and method using rotational indexing for laser marking IC packages carried in trays.
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  2. Daily, Thomas V., Apparatus for etching multiple surfaces of luminaire reflector.
    상세보기
  3. Daily, Thomas V., Apparatus for etching multiple surfaces of luminaire reflector.
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  4. Schramm,Rainer, High speed, laser-based marking method and system for producing machine readable marks on workpieces and semiconductor devices with reduced subsurface damage produced thereby.
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  5. Baudron,Patrick; Beulet,Frederic; Berthe,Benoit; Perdoux,Dominique, High-rate laser marking machine.
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  6. Canella,Robert L.; Ibarra,Tony T., Laser marking system for dice carried in trays and method of operation.
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  7. Garnier,Steven F.; Mitchiner,Chad A.; Moore,Jay A., Low profile laser assembly.
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  8. Cahill,Steven P.; Ehrmann,Jonathan S.; Li,You C.; Schramm,Rainer; Pelsue,Kurt, Method and system for calibrating a laser processing system and laser marking system utilizing same.
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  9. Gu, Bo; Ehrmann, Jonathan S., Method and system for laser soft marking.
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  10. Nemets, Christian; Woelki, Michael; Engineer, Amit V., Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system.
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  11. Woelki,Michael, Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system.
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  12. Kimura, Junichi; Tamura, Toshiaki; Yajima, Takahiro; Tsuyama, Kazuhiko, Method of producing high-frequency modules.
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  13. Peterson,Darin L.; Slaughter,Michael R.; McCall,Keith P., Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectric devices.
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  14. Peterson, Darin L.; Slaughter, Michael R.; McCall, Keith P., Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectronic devices.
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  15. Peterson,Darin L.; Slaughter,Michael R.; McCall,Keith P., Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectronic devices.
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  16. Lee, Sang moon; Kim, Young bu; Kim, Jung hye, Semiconductor substrate having reference semiconductor chip and method of assembling semiconductor chip using the same.
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