초록 ▼

A flexible substrate strip comprises a plurality of substrate units adapted for mounting semiconductor chips. The surface of the flexible substrate strip is provided with a plurality of degating regions at locations such that the edges of mold runners and gates of a mold used to encapsulate the semi

A flexible substrate strip comprises a plurality of substrate units adapted for mounting semiconductor chips. The surface of the flexible substrate strip is provided with a plurality of degating regions at locations such that the edges of mold runners and gates of a mold used to encapsulate the semiconductor chips in encapsulant material fit entirely within the degating regions when the substrate strip is placed in the mold during encapsulation of the semiconductor chips. The present invention is characterized in that each degating region has a buffer region at a location corresponding to the gate of the mold during encapsulation. The degating regions have a degating region material formed thereon with the buffer regions not coated with the degating region material. The adhesive force between the encapsulant material and the degating region material is less than the adhesive force between the encapsulant material and the substrate. The present invention also provides a method of making the flexible substrate strip.

대표청구항 ▼

[ What is claimed is:] [1.]1. A substrate strip comprising:a plurality of substrate units on a surface of the substrate strip, each substrate unit being adapted for mounting a semiconductor chip;a plurality of degating regions on the surface of the substrate strip at locations such that the edges of

[ What is claimed is:] [1.]1. A substrate strip comprising:a plurality of substrate units on a surface of the substrate strip, each substrate unit being adapted for mounting a semiconductor chip;a plurality of degating regions on the surface of the substrate strip at locations such that the edges of mold runners and gates of a mold used to encapsulate the semiconductor chips in encapsulant material fit entirely within the degating regions when the substrate strip is placed in the mold during encapsulation of the semiconductor chips, wherein each degating region has a buffer region at a location corresponding to the gate of the mold during encapsulation; anda degating region material formed on the degating regions with the buffer regions not coated with the degating region material, wherein the adhesive force between the encapsulant material and the degating region material is less than the adhesive force between the encapsulant material and the substrate strip.