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Automated mobility-classified-aerosol detector 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-015/02
출원번호 US-0353493 (1999-07-13)
발명자 / 주소
  • Russell Lynn M.
  • Flagan Richard C.
  • Zhang Shouhua
출원인 / 주소
  • California Institute of Technology
대리인 / 주소
    Fish & Richardson P.C.
인용정보 피인용 횟수 : 16  인용 특허 : 18

초록

An aerosol detection system for measuring particle number distribution with respect to particle dimension in an aerosol sample. The system includes an alternating dual-bag sampler, a radially classified differential mobility analyzer, and a condensation nucleus counter. Pressure variations in sampli

대표청구항

[ What is claimed is:] [1.]1. A particle detection system, comprising:an input port to receive a gaseous flow having particles;a particle classifier having a particle chamber to receive an input sample flow derived from said gaseous flow, operable to classify said particles according to dimension of

이 특허에 인용된 특허 (18)

  1. Mazumder Malay K. (Little Rock AR) Ware Ron E. (Sheridan AR), Aerosol particle charge and size analyzer.
  2. Ho Jim Y. W. (Medicine Hat CAX), Computer controlled constant concentration and size particulate general system.
  3. Hollnder Werner (Celle DEX) Dunkhorst Wilhelm (Petershagen DEX) Ldding Hubert (Lehrte DEX), Condensation nucleus counter.
  4. Kaufman Stanley L. (New Brighton MN) Zarrin Fahimeh (St. Paul MN) Dorman Frank (Minneapolis MN), Electrospray apparatus for producing uniform submicrometer droplets.
  5. Pourprix Michel (Montlhery FRX), Electrostatic detector of aerosol particles.
  6. Flagan Richard C. ; Collins Donald R., Enhanced automated classified aerosol detector.
  7. Skala George F. (Voorheesville NY), Incipient fire detector II.
  8. Kurimura Masaaki (Ibaraki JPX) Hanawa Masaaki (Katsuta JPX), Intra-liquid particle classification apparatus using light scattering.
  9. Ensor David S. (Chapel Hill NC) Sem Gilmore J. (Lauderdale MN), Measurement of ultrafine particle size distributions.
  10. Kohsaka Yasuo (Sakai JPX) Niida Tohru (Minoo JPX) Sato Hisao (Sagamihara JPX) Kano Hajime (Suita JPX), Method for measuring impurity concentrations in a liquid and an apparatus therefor.
  11. Maul Sonja (Straubenhardt DEX) Bttner Erwin (Stutensee DEX) Meichelbck Heiner (Eggenstein-Leopoldshafen DEX) Merz Albert (Karlsruhe DEX) Vogg Hubert (Karlsruhe DEX), Method for the continuous surveillance of the poison content of exhaust gases containing particulate matter.
  12. Park Sang-o,KRX ; Kim Jin-sung,KRX ; Kang Hee-se,KRX ; Moon Sang-young,KRX, Method of measuring and analyzing contamination particles generated during the manufacture of semiconductor devices.
  13. Chandrachood Madhavi ; Ghanayem Steve G. ; Cantwell Nancy ; Rader Daniel J. ; Geller Anthony S., Particle dispersing system and method for testing semiconductor manufacturing equipment.
  14. Pourprix Michel (Nontlhery FRX), Particle, particularly submicron particle spectrometer.
  15. Pourprix Michel (Montlhery FRX), Process and apparatus for calibrating a particle counter.
  16. Flagan Richard C. (Pasadena CA) Zhang Shou-Hua (Pasadena CA), Radial differential mobility analyzer.
  17. Yost Michael G. (Suisun CA), Test chamber for particle emitters.
  18. George Nelson A. (North East MD) Sutsko Michael G. (Glen Mills PA) McKenna Douglas B. (Dover DE), ULPA filter.

이 특허를 인용한 특허 (16)

  1. Liu,Benjamin Y. H., Aerosol measurement by dilution and particle counting.
  2. Ahn,Kang Ho, Apparatus for measuring numbers of particles and method thereof.
  3. Benner, William Henry; Holve, Donald John, Apparatuses, processes, and systems for measuring particle size distribution and concentration.
  4. Wei, Qiang; Rahman, Montajir M D.; Akard, Michael, Calibration unit for volatile particle remover.
  5. Ahn, Kang-Ho; Kim, Sang-Soo; Jeong, Hae-Young, Condensation particle counter.
  6. Richardson, Jr.,Robert E.; Lopez,Arturo M., Device to detect and measure the concentration and characterization of airborne conductive or dielectric particles.
  7. Walls, Howard Jerome; Clayton, Anthony Clint; Newsome, Randall J.; Hoertz, Paul G., Devices, systems and methods for detecting particles.
  8. Walls, Howard Jerome; Clayton, Anthony Clint; Newsome, Randall J.; Hoertz, Paul G., Devices, systems and methods for detecting particles.
  9. Yoshida, Takehito; Makino, Toshiharu; Suzuki, Nobuyasu; Yamada, Yuka, Fine particle classification apparatus and method for classifying aerosol particles in a sheath gas.
  10. Takeuchi, Kazuo; Okuyama, Kikuo; Lenggoro, Wuled, Method of analyzing particles suspended in liquid and liquid-suspended particle analyzer for carrying out the method.
  11. Bae,Gwi Nam; Moon,Kil Choo; Lee,Seung Bok, Particle counter.
  12. Ahn, Kang Ho, Particle measuring system and method.
  13. Ikeda, Hideyuki; Yoshioka, Seiichiro, Particle size distribution measuring apparatus with validation and instruction modes.
  14. Ho, Hsin-Chia; Chen, Guo-Dung; Fu, Wei-En; Lin, Yen-Liang, System and method for monitoring particles in solution.
  15. Evans,Robert W., Vacuumized receptacle for sample collection.
  16. Wang, Jian, Wide size range fast integrated mobility spectrometer.
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