$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Apparatus and method for dispensing processing fluid toward a substrate surface 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/00
출원번호 US-0312409 (1999-05-14)
발명자 / 주소
  • Christenson Kurt K.
  • Nelson Steven L.
출원인 / 주소
  • FSI International, Inc.
대리인 / 주소
    Kagan Binder, PLLC
인용정보 피인용 횟수 : 21  인용 특허 : 27

초록

A centrifugal spray processor for dispensing a stream of ozonated water toward one or more semiconductor wafers at a non-parallel angle that is inclined from the plane of the surface of the semiconductor wafer. The spray processor includes one or more supports for receiving a plurality of semiconduc

대표청구항

[ What is claimed is:] [16.]16. A method for dispensing ozonated water toward a substrate surface for processing the substrate surface, the method comprising the steps of:providing a substrate having a surface to be processed that exists in a plane; andcausing a stream of ozonated water to be direct

이 특허에 인용된 특허 (27)

  1. Aigo Seiichiro (3-15-13 ; Negishi ; Daito-ku Tokyo JPX), Bubbler device for washing semiconductor materials.
  2. Rees Darci L. (4431 Jay St. Duluth MN 55802) George Michael (4431 Jay St. Duluth MN 55802), Continuous process and apparatus for generation of ozone for industrial application with cryogenic refrigeration.
  3. Schick Robert P. (Amherst NY), Cooling water ozonation system.
  4. Wiesmann Rudolf (Gossau CHX), Equipment for gassing a liquid and process for operating the equipment.
  5. Reid Philip L. (Rte. 2 ; Box 422 Duncan SC 29334), Gas humidification apparatus.
  6. Murphy Oliver J. (Bryan TX) Hitchens G. Duncan (Bryan TX), Method and apparatus for electrochemical production of ozone.
  7. Wada Kenya,JPX ; Gonmori Kazuhiko,JPX ; Ichikawa Hisayoshi,JPX ; Morita Nobuo,JPX ; Fukuda Hiroshi,JPX, Method and apparatus for processing substrates.
  8. Inoue Makoto (Yokohama JPX), Method for manufacturing an oxide of semiconductor.
  9. Kashiwase Masaharu (Okayama JPX) Matsuoka Terumi (Okayama JPX), Method for removing organic film.
  10. Nagahiro Jinzo (54-24 ; Wakamiya 2-chome Nakano-ku ; Tokyo JPX) Higuchi Ken (Saitama JPX) Ohama Yasunori (Saitama JPX), Method of and apparatus for producing a high concentration ozone water solution.
  11. Pittner Gregory A. (Yorba Linda CA) Crabtree Larry L. (Lincolnshire IL), Method of preferentially removing oxygen from ozonated water.
  12. Bullock Donald (31 Logging Hill Rd. Concord NH 03301), Oxidation saturation device.
  13. Frosch Robert A. Administrator of the National Aeronautics and Space Administration ; with respect to an invention of ( Duarte CA) Humphrey Marshall F. (Duarte CA) French Kenneth R. (La Canada CA) Ho, Ozonation of cooling tower waters.
  14. Wong Sik-Lam ; Shea James Howard, Ozone generator with enhanced output.
  15. Schwarzl Karl (Mitterndorf-Traukirchen AUX), Process and an arrangement for preparing ozonic gases and solutions.
  16. Sawamoto Isao (Kanagawa JPX) Nishiki Yoshinori (Kanagawa JPX), Process and apparatus for producing high concentrating ozone water.
  17. Matthews Robert R. (Richmond CA), Process and apparatus for the treatment of semiconductor wafers in a fluid.
  18. Damann Franz-Josef (21 ; Dammstrasse D-4791 Lichtenau-Henglarn DEX), Process and device for the dissolution of gas in liquid.
  19. Ross ; Edward A., Saturated liquid/vapor generating and dispensing.
  20. Ross Edward Alan (Willowdale CA), Saturated liquid/vapor generating and dispensing.
  21. Mann Reginald (19 Heath Road Glossop ; Derbyshire SK13 9AY GB2), Separation of gaseous mixtures.
  22. Molinaro James S. (Coplay PA), Sparger plate for ozone gas diffusion.
  23. Tanaka Masato (Shiga JPX), System for treating a surface of a rotating wafer.
  24. Partus Fred P. (Cobbs County GA), Vapor delivery control system and method.
  25. Partus Fred P. (Atlanta GA), Vapor delivery system and method.
  26. Moy, Timothy Y., Vapor generator and its use in generating vapors in a pressurized gas.
  27. McMenamin Joseph C. (Fresno CA), Vapor mass flow control system.

이 특허를 인용한 특허 (21)

  1. Christenson, Kurt Karl; Hanestad, Ronald J.; Ruether, Patricia Ann; Wagener, Thomas J., Apparatus for removing material from one or more substrates.
  2. Torek, Kevin J.; Morgan, Jonathan C.; Morgan, Paul A., Delivery of dissolved ozone.
  3. Donoso, Bernardo; Stevens, Joseph J.; Olgado, Donald J.; Ko, Alexander Sou-Kang, Dual post centrifugal wafer clip for spin rinse dry unit.
  4. Egashira,Koji; Kamikawa,Yuji, Liquid processing apparatus and method.
  5. Egashira,Koji; Kamikawa,Yuji, Liquid processing apparatus with nozzle having planar ejecting orifices.
  6. Fucsko, Janos; Smythe, III, John A.; Li, Li; Waldo, Grady S., Low temperature process for polysilazane oxidation/densification.
  7. Shimizu, Yuji, Method and apparatus for removing photoresist on semiconductor wafer.
  8. Yi Ma ; Yih-Feng Chyan ; Chung Wai Leung ; Jane Qian Liu ; Timothy Scott Campbell, Method of forming bipolar transistors comprising a native oxide layer formed on a substrate by rinsing the substrate in ozonated water.
  9. Gogg, Georg; Knotter, Dirk Maarten; Reaux, Charlene; Nelson, Steve, Method of manufacturing a semiconductor device and apparatus to be used therefore.
  10. Keigler, Arthur; Goodman, Daniel L.; Guarnaccia, David G., Parallel single substrate marangoni module.
  11. Keigler, Arthur; Fisher, Freeman; Goodman, Daniel L., Parallel single substrate processing system.
  12. Keigler, Arthur; Fisher, Freeman; Goodman, Daniel L.; Haynes, Jonathan, Parallel single substrate processing system.
  13. Keigler, Arthur, Parallel single substrate processing system with alignment features on a process section frame.
  14. Lauerhaas, Jeffrey M., Process for removing carbon material from substrates.
  15. Christenson, Kurt Karl; Hanestad, Ronald J.; Ruether, Patricia Ann; Wagener, Thomas J., Process for removing material from substrates.
  16. Christenson, Kurt Karl; Hanestad, Ronald J.; Ruether, Patricia Ann; Wagener, Thomas J., Process for removing material from substrates.
  17. DeKraker, David; Butterbaugh, Jeffery W.; Williamson, Richard E., Process for treatment of substrates with water vapor or steam.
  18. DeKraker, David; Butterbaugh, Jeffery W.; Williamson, Richard E., Process for treatment of substrates with water vapor or steam.
  19. Christenson, Kurt Karl, Reagent activator for electroless plating.
  20. Christenson,Kurt Karl, Reagent activator for electroless plating.
  21. Davis, Jeffry A.; Dolechek, Kert L.; Curtis, Gary L., Semiconductor wafer processing apparatus.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로