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Horn antenna 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01Q-013/00
출원번호 US-0445770 (1999-12-13)
우선권정보 SE0002235 (1997-06-11)
국제출원번호 PCT/SE98/00834 (1998-05-07)
§371/§102 date 19991213 (19991213)
국제공개번호 WO-9857392 (1998-12-17)
발명자 / 주소
  • Ohlsson Magnus,SEX
  • Marcus Carina,SEX
  • Fredriksson H.ang.kan,SEX
출원인 / 주소
  • Saab Marine Electronics AB, SEX
대리인 / 주소
    Swidler Berlin Shereff Friedman, LLP
인용정보 피인용 횟수 : 76  인용 특허 : 5

초록 ▼

A horn antenna for transmitting microwaves. A conical horn includes a small opening and a large opening. A transition piece includes a tapering portion and a non-tapering portion. The transition piece is arranged in the conical horn between a waveguide and an environment that the horn antenna is arr

대표청구항 ▼

[ What is claimed is:] [1.]1. A horn antenna for transmitting microwaves, comprising:a conical horn comprising a small opening and a large opening; anda transition piece comprising a tapering portion and a non-tapering portion, the transition piece being arranged in the conical horn between a wavegu

이 특허에 인용된 특허 (5)

  1. Martek Gary A. (Kent WA) Ashbaugh Fred E. (Seattle WA), High-gain, waveguide-fed antenna having controllable higher order mode phasing.
    상세보기
  2. Palan Donald F. ; Gailloux Mark J., Level gage waveguide transitions and tuning method andapparatus.
    상세보기
  3. Erb Tom L. (Austin TX) Fesler Michael H. (Round Rock TX) Perry ; III Hugh L. (Austin TX), Microwave waveguide seal assembly.
    상세보기
  4. Otto Johanngeorg (Aalen-Hofherrnweiler DEX), Tank-contents level measuring assembly.
    상세보기
  5. Newham Paul (Stanmore GB2) Andrews Bernard J. (Garston GB2), Wideband horn antenna.
    상세보기

이 특허를 인용한 특허 (76)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
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  2. Ball, Thomas A.; Snow, Jeffrey M., Antenna with shaped dielectric loading.
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  3. Snow, Jeffrey M.; Ball, Thomas, Aperture antenna with shaped dielectric loading.
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  4. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
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  5. Dunklee, John, Chuck for holding a device under test.
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  6. Dunklee, John, Chuck for holding a device under test.
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  7. Dunklee, John, Chuck for holding a device under test.
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  8. Dunklee,John, Chuck for holding a device under test.
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  9. Dunklee,John, Chuck for holding a device under test.
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  10. Dunklee,John, Chuck for holding a device under test.
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  11. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
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  12. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
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  13. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
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  14. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
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  15. Reimelt, Ralf; Schroth, Herbert, Device for determining and/or monitoring the level of a filled substance in a container.
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  16. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
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  17. Strid, Eric; Campbell, Richard, Differential signal probing system.
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  18. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
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  19. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
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  20. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
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  21. Wilhelm Lubbers DE, Fill level gauge.
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  22. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
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  23. Ohlsson, Magnus, Horn antenna.
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  24. McFadden,Bruce, Localizing a temperature of a device for testing.
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  25. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
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  26. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
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  27. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
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  28. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
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  29. Smith,Kenneth; Gleason,Reed, Membrane probing system.
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  30. Smith,Kenneth; Gleason,Reed, Membrane probing system.
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  31. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
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  32. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
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  33. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
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  34. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
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  35. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
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  36. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
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  37. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
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  38. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
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  39. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
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  40. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
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  41. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
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  42. Schwindt,Randy, Probe holder for testing of a test device.
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  43. Nordgren, Greg; Dunklee, John, Probe station.
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  44. Nordgren, Greg; Dunklee, John, Probe station.
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  45. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
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  46. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
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  47. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
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  48. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
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  49. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
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  50. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
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  51. Lesher, Timothy E., Probe testing structure.
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  52. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
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  53. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
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  54. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
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  55. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
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  56. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
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  57. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
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  58. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
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  59. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  60. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
    상세보기
  61. Dunklee,John, Switched suspended conductor and connection.
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  62. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
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  63. Andrews, Peter; Hess, David, System for testing semiconductors.
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  64. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
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  65. Campbell, Richard, Test structure and probe for differential signals.
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  66. Campbell,Richard, Test structure and probe for differential signals.
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  67. Rumbaugh,Scott, Thermal optical chuck.
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  68. Lee, Anthony C.; Brannan, Joseph D.; Prakash, Mani N.; Rossetto, Francesca, Tissue ablation system with internal and external radiation sources.
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  69. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
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  70. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
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  71. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
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  72. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
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  73. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
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  74. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
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  75. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
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  76. Campbell, Richard, Wideband active-passive differential signal probe.
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