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Apparatus for processing both sides of a microelectronic device precursor 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23F-001/02
  • C23C-016/00
출원번호 US-0464780 (1999-12-17)
발명자 / 주소
  • Fayfield Robert T.
  • Schwab Brent
출원인 / 주소
  • FSI International, Inc.
대리인 / 주소
    Vidas, Arrett & Steinkraus
인용정보 피인용 횟수 : 1  인용 특허 : 38

초록

The present invention also provides a method for processing a substrate by heating the substrate to a temperature above ambient via UV radiation at a first power level and conditioning the substrate by exposing the substrate to a photochemically (UV) reactive chemical, or a reactive chemical that ca

대표청구항

[ What is claimed is as follows:] [1.]1. An apparatus for processing a microelectronic device precursor having first and second opposed major surfaces, said apparatus comprising:(a) a chamber housing defining a processing chamber in which the microelectronic device precursor is positioned during a t

이 특허에 인용된 특허 (38)

  1. Liu Yung S. (Schenectady NY) Grubb Willard T. (Schenectady NY), Apparatus and method for photoetching of polyimides, polycarbonates and polyetherimides.
  2. Sommer Helmut,DEX ; Zwissler Manuela,DEX ; Kegel Herbert,DEX, Apparatus and method for rapid thermal processing (RTP) of a plurality of semiconductor wafers.
  3. Panico C. Richard (Medford MA), Apparatus for rapid curing of resinous materials and method.
  4. Hayashi Noriyuki (Shiga JPX) Murayama Hiromi (Kyoto JPX) Ishino Yukihiko (Kyoto JPX), Apparatus for removing organic substance from substrate.
  5. Hiatt C. Fred (Burnsville MN) Gray David C. (Sunnyvale CA) Butterbaugh Jeffery W. (Chanhassen MN), Apparatus for surface conditioning.
  6. Grant Robert W. (Excelsior MN) Novak Richard E. (Plymouth MN), Cluster tool dry cleaning system.
  7. Grant Robert W. (Allenstown PA) Ruzyllo Jerzy (State College PA) Torek Kevin (State College PA), Controlled etching of oxides via gas phase reactions.
  8. Beinglass Israel (Sunnyvale CA) Venkatesan Mahalingam (San Jose CA) Gronet Christian M. (San Carlos CA), Depositing polysilicon films having improved uniformity and apparatus therefor.
  9. Anderson Roger N., Domed wafer reactor vessel window with reduced stress at atmospheric and above atmospheric pressures.
  10. Fayfield Robert T. ; Schwab Brent, Equipment for UV wafer heating and photochemistry.
  11. Haigh John (Ipswich GB2) Aylett Martin R. (Felixstowe GB2), Etching method.
  12. Yamazaki Shunpei (Tokyo JPX), Etching method for the manufacture of a semiconductor integrated circuit.
  13. Aschner Helmut,DEX ; Merkle Helmut,DEX ; Walk Ulrich,DEX ; Zernickel Dieter,DEX, Inflatable elastomeric element for rapid thermal processing (RTP) system.
  14. Brors Daniel L. (Byron CA) Cook Robert C. (San Jose CA), Method and apparatus for cold wall chemical vapor deposition.
  15. Bersin Richard L. (Orange CT), Method and apparatus for dry processing of substrates.
  16. Kaltenbrunner Guenter,DEX ITX 85551 ; Knarr Thomas,DEX ITX 89179 ; Nenyei Zsolt,DEX ITX 89134, Method and apparatus for rapid thermal processing.
  17. Bender Jim, Method and apparatus for removal of material utilizing near-blackbody radiator means.
  18. Fukuda Hisashi (Tokyo JPX), Method and device for cleaning substrates.
  19. Itoh Hiromi (Hyogo JPX) Iwasaki Masanobu (Hyogo JPX) Tokui Akira (Hyogo JPX) Tsukamoto Katsuhiro (Hyogo JPX), Method for pretreating semiconductor substrate by photochemically removing native oxide.
  20. Vig John R. (Colts Neck NJ) LeBus John W. (Farmingdale NJ), Method of cleaning surfaces by irradiation with ultraviolet light.
  21. Tsujii Kanji (Nishitama JPX) Yajima Yusuke (Musashino JPX) Murayama Seiichi (Kokubunji JPX), Method of dry etching.
  22. Nishizawa, Jun-ichi, Method of fabricating semiconductor device by dry process utilizing photochemical reaction, and apparatus therefor.
  23. Murayama Seiichi (Kokubunji JPX) Tsujii Kanji (Tokyo JPX) Yajima Yusuke (Musashino JPX), Method of photochemical surface treatment.
  24. McMillan Larry D. (Colorado Springs CO) Paz de Araujo Carlos A. (Colorado Springs CO), Methods and apparatus for material deposition.
  25. Morishige Yukio (Tokyo JPX), Optical CVD method with a strong optical intensity used during an initial period and device therefor.
  26. Blum Samuel E. (White Plains NY) Holloway Karen L. (Bronx NY) Srinivasan Rangaswamy (Ossining NY), Patterning of polyimide films with far ultraviolet light.
  27. Yamazaki Shunpei (Tokyo JPX) Imatoh Shinji (Kanagawa JPX) Hayashi Shigenori (Kanagawa JPX), Photochemical vapor phase reaction apparatus and method of causing a photochemical vapor phase reaction.
  28. Elliott David J. ; Hollman Richard F., Photoreactive surface cleaning.
  29. Panico C. Richard (21 Leighton St. Medford MA 02155), Photoresist curing method.
  30. Tay Sing Pin ; Hu Yao Zhi ; Wasserman Yuval, Process for preventing gas leaks in an atmospheric thermal processing chamber.
  31. Ohmori Toshiaki (Itami JPX) Fukumoto Takaaki (Itami JPX), Semiconductor manufacturing apparatus.
  32. Anderson Roger N. (San Jose CA) Hey H. Peter W. (San Jose CA) Beinglass Israel (Sunnyvale CA) Venkatesan Mahalingam (San Jose CA), Semiconductor wafer process chamber with susceptor back coating.
  33. Khan Ashraf R. ; Ramanathan Sasangan ; Foggiato Giovanni Antonio, Surface modification of semiconductors using electromagnetic radiation.
  34. Kubodera Masao (Yamanashi JPX) Narushima Masaki (Yamanashi JPX) Ozawa Masahito (Yamanashi JPX) Kumagai Hiromi (Tokyo JPX) Yonenaga Tomihiro (Yamanashi JPX) Tanaka Sumi (Yamanashi JPX), Surface processing apparatus.
  35. Ninomiya Ken (Nakano JPX) Suzuki Keizo (Hachioji JPX) Nishimatsu Shigeru (Kokubunji JPX), Surface treatment apparatus.
  36. Beinglass Israel (Sunnyvale CA) Venkatesan Mahalingam (San Jose CA) Anderson Roger N. (San Jose CA), Susceptor for deposition apparatus.
  37. Green Martin Laurence ; Sorsch Thomas Werner, Wafer holder for thermal processing apparatus.
  38. Adams David V. (San Jose CA) Anderson Roger N. (San Jose CA), Wafer reactor vessel window with pressure-thermal compensation.

이 특허를 인용한 특허 (1)

  1. Butterbaugh,Jeffery W.; Gray,David C.; Fayfield,Robert T.; Siefering,Kevin; Heitzinger,John; Hiatt,Fred C., Apparatus for surface conditioning.
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