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Method for electrolytically depositing copper on a semiconductor workpiece 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C25D-005/10
출원번호 US-0387033 (1999-08-31)
발명자 / 주소
  • Chen Linlin
출원인 / 주소
  • Semitool, Inc.
대리인 / 주소
    Christensen O'Connor Johnson Kindness PLLC
인용정보 피인용 횟수 : 71  인용 특허 : 17

초록

This invention employs a novel approach to the copper metallization of a workpiece, such as a semiconductor workpiece. In accordance with the invention, an alkaline electrolytic copper bath is used to electroplate copper onto a seed layer, electroplate copper directly onto a barrier layer material,

대표청구항

[ What is claimed is:] [1.]1. A process for applying a metal structure to a workpiece comprising:providing a first electroplating bath including copper sulfate as a source of metal ions as a principal metal species to be deposited during subsequent electroplating, ammonium sulfate, a complexing agen

이 특허에 인용된 특허 (17)

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