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Process for cleaning ceramic articles 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-003/00
출원번호 US-0470510 (1999-12-22)
발명자 / 주소
  • Haerle Andrew G.
  • Meder Gerald S.
출원인 / 주소
  • Saint-Gobain Ceramics and Plastics, Inc.
대리인 / 주소
    Crosby
인용정보 피인용 횟수 : 41  인용 특허 : 10

초록

A method for cleaning ceramic workpieces such as SiC boats used in semiconductor fabrication is disclosed. The method comprises washing a virgin or used ceramic workpiece with a strong acid and then using a pelleted CO.sub.2 cleaning process on the acid-washed component. The inventive method has bee

대표청구항

[ We claim:] [1.]1. A process for cleaning a semiconductor processing component having an inorganic surface, the process comprising the steps of:a) exposing the inorganic surface to a solvent having at least 1 v/o of an acid selected from the group consisting of HF, acids having a pKa of less than a

이 특허에 인용된 특허 (10)

  1. Brock James R. (Austin TX) Trachtenberg Isaac (Austin TX), Aerosol jet etching.
  2. Rose Peter H. ; Sferlazzo Piero ; van der Heide Robert G., Aerosol surface processing.
  3. Bishop Phillip W. ; Harrover Alexander J., Carbon dioxide cleaning process.
  4. Natzle Wesley Charles ; Wu Jin Jwang ; Yu Chienfan, Film removal by chemical transformation and aerosol clean.
  5. Gibot Claude (Malakoff FRX) Charles Jean-Michel (Marolles-en-Hurepoix FRX), Installation for the projection of particles of dry ice.
  6. Kinisky Thomas G., Process for analyzing analytes using HF-resistant ultrasonic nebulizer components.
  7. Gifford George G. (Poughkeepsie NY) Lii Yeong-Jyh T. (Peekskill NY) Wu Jin J. (Ossining NY), Process for fabricating a semiconductor structure having sidewalls.
  8. Rose Peter H. ; Sferlazzo Piero, Processing a surface.
  9. Alliegro Richard A. (Holden MA) Coes Samuel H. (Northborough MA), Silicon carbide diffusion furnace components.
  10. McDermott Wayne T. (Allentown PA) Ockovic Richard C. (Northampton PA) Wu Jin J. (Ossining NY) Cooper Douglas W. (Milwood NY) Schwarz Alexander (Bethlehem PA) Wolfe Henry L. (Pleasant Valley NY), Surface cleaning using an argon or nitrogen aerosol.

이 특허를 인용한 특허 (41)

  1. Saigusa, Hidehito; Takase, Taira; Mitsuhashi, Kouji; Nakayama, Hiroyuki, Apparatus for an improved deposition shield in a plasma processing system.
  2. Stephan, Marc; Schöne, André, Ceramic body and process for the preparation thereof.
  3. Weir, Richard Dean; Nelson, Carl Walter, Electrical-energy-storage unit (EESU) utilizing ceramic and integrated-circuit technologies for replacement of electrochemical batteries.
  4. Narendar,Yeshwanth; Buckley,Richard F., High purity silicon carbide wafer boats.
  5. Mitsuhashi, Kouji; Nakayama, Hiroyuki; Nagayama, Nobuyuki; Moriya, Tsuyoshi; Nagaike, Hiroshi, Internal member of a plasma processing vessel.
  6. Mitsuhashi, Kouji; Nakayama, Hiroyuki; Nagayama, Nobuyuki; Moriya, Tsuyoshi; Nagaike, Hiroshi, Internal member of a plasma processing vessel.
  7. Mitsuhashi, Kouji; Nakayama, Hiroyuki; Nagayama, Nobuyuki; Moriya, Tsuyoshi; Nagaike, Hiroshi, Internal member of a plasma processing vessel.
  8. Nishimoto, Shinya; Mitsuhashi, Kouji; Nakayama, Hiroyuki, Method and apparatus for an improved baffle plate in a plasma processing system.
  9. Saigusa, Hidehito; Takase, Taira; Mitsuhashi, Kouji; Nakayama, Hiroyuki, Method and apparatus for an improved baffle plate in a plasma processing system.
  10. Saigusa, Hidehito; Takase, Taira; Mitsuhashi, Kouji; Nakayama, Hiroyuki, Method and apparatus for an improved bellows shield in a plasma processing system.
  11. Nishimoto, Shinya; Mitsuhashi, Kouji; Saigusa, Hidehito; Takase, Taira; Nakayama, Hiroyuki, Method and apparatus for an improved optical window deposition shield in a plasma processing system.
  12. Saigusa, Hidehito; Takase, Taira; Mitsuhashi, Kouji; Nakayama, Hiroyuki, Method and apparatus for an improved upper electrode plate in a plasma processing system.
  13. Nishimoto, Shinya; Mitsuhashi, Kouji; Nakayama, Hiroyuki, Method and apparatus for an improved upper electrode plate with deposition shield in a plasma processing system.
  14. Fink, Steven T., Method and apparatus for improved baffle plate.
  15. Escher, Gary; Allen, Mark A.; Kudo, Yasuhisa, Method for adjoining adjacent coatings on a processing element.
  16. Yamaguchi,Shinji; Kiku,Taiji; Kondou,Nobuyuki, Method for cleaning a ceramic member for use in a system for producing semiconductors, a cleaning agent and a combination of cleaning agents.
  17. Burgess,Ronald Reginald; Davis,Ian Martin, Method for removing a composite coating containing tantalum deposition and arc sprayed aluminum from ceramic substrates.
  18. Haerle,Andrew G.; Buckley,Richard F.; Hengst,Richard R., Method for treating semiconductor processing components and components formed thereby.
  19. Narendar, Yeshwanth; Buckley, Richard F., Method for treating semiconductor processing components and components formed thereby.
  20. Weir, Richard D.; Nelson, Carl W., Method of preparing ceramic powders.
  21. Weir, Richard D.; Nelson, Carl W., Method of preparing ceramic powders.
  22. Weir, Richard D.; Nelson, Carl W., Method of preparing ceramic powders using ammonium oxalate.
  23. Weir, Richard D.; Nelson, Carl W., Method of purifying barium nitrate aqueous solution.
  24. Ahmadi, Goodarz; Lewis, Paul E.; Tannous, Adel George; Makhamreh, Khalid; Compton, Keith H., Methods for cleaning surfaces substantially free of contaminants utilizing filtered carbon dioxide.
  25. Ahmadi, Goodarz; Lewis, Paul E.; Tannous, Adel George; Makhamreh, Khalid, Methods for cleaning utilizing multi-stage filtered carbon dioxide.
  26. Boumerzoug,Mohamed; Tannous,Adel George, Methods for residue removal and corrosion prevention in a post-metal etch process.
  27. Boumerzoug,Mohamed; Tannous,Adel George; Makhamreh,Khalid, Methods for resist stripping and cleaning surfaces substantially free of contaminants.
  28. Tannous,Adel George; Makhamreh,Khalid, Methods for resist stripping and other processes for cleaning surfaces substantially free of contaminants.
  29. Tannous,Adel George; Makhamreh,Khalid, Methods for resist stripping and other processes for cleaning surfaces substantially free of contaminants.
  30. Tannous,Adel George; Makhamreh,Khalid, Methods for resist stripping and other processes for cleaning surfaces substantially free of contaminants.
  31. Fink, Steven T., Plasma processing system and baffle assembly for use in plasma processing system.
  32. Haerle, Andrew G.; Meder, Gerald S., Process for cleaning ceramic articles.
  33. Haerle, Andrew G.; Perry, Edward A., Process for cleaning components using cleaning media.
  34. Otsuki, Hayashi, Processing apparatus with a chamber having therein a high-corrosion-resistant sprayed film.
  35. Otsuki, Hayashi, Processing apparatus with a chamber having therein a high-corrosion-resistant sprayed film.
  36. Pettey, Lucas; Weir, Richard D., Purification of barium ion source.
  37. Haerle, Andrew G.; Meder, Gerald S., Semiconductor processing component having low surface contaminant concentration.
  38. Weir, Richard D.; Nelson, Carl W., Systems and methods for utility grid power averaging, long term uninterruptible power supply, power line isolation from noise and transients and intelligent power transfer on demand.
  39. Lowrey, Tyler, Thin film logic device and system.
  40. Weir, Richard D.; Nelson, Carl W., Utility grid power averaging and conditioning.
  41. Weir, Richard D.; Nelson, Carl W., Utility grid power averaging and conditioning.
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